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Product
MBE Technologies
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When you’re creating thin films of exotic compound semiconductor materials one crystal at a time, you need a molecular beam epitaxy system that is configurable for different applications.
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Product
Micro-spot DUV Spectroscopic Reflectometry
FilmTek 2000 PAR
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Scientific Computing International
A low-cost solution for high-throughput, fully-automated mapping of patterned wafers for development and production environments. Utilizes patented parabolic mirror technology to measure wavelengths from DUV to NIR with a spot size as small as 13µm. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter.
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Product
Pulsed-DC Systems
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Extend process innovation with Advanced Energy’s comprehensive pulsed-DC suite. Minimize arcing, enhance deposition rate, improve film flatness and packing density.
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Product
Enameled Wire Portable Pinhole Tester
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Shanghai Dean Electrical Co., Ltd
DZK high and low voltage (portable) pinhole detector is designed and produced in accordance with GB/T4074.5-2008 standard, and can be used by users to monitor the continuous performance of the paint film of the product in real time during production and use. . It takes into account the detection function of the traditional high-voltage paint film continuity tester, and the advantages of being easy to move and replace the use position (the whole machine weight is less than 5KG and can be equipped with lithium batteries), which is convenient for users to detect multiple environments and multiple cables. use.



