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CD Measurement and Advanced Film Analysis
FilmTek CD
Scientific Computing International
SCI’s leading-edge solution for fully-automated, high-throughput CD measurement and advanced film analysis for the 1x nm design node and beyond. Delivers real-time multi-layer stack characterization and CD measurement simultaneously, for both known and completely unknown structures. Patented multimodal measurement technology meets the challenging demands associated with the most complex semiconductor design features in development and production.
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Plastic Wet Film Combs
154
Metric and Imperial values are on the same comb, 50 to 800μm on one side, 2 to 32mils on the other.
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Leaf Wetness Sensors
Campbell Scientific offers two types of leaf wetness sensors to measure the wetness of leaves: surface contact and electrical resistance. Surface contact sensors measure the electrical resistance of a water film on their surface. Electrical resistance sensors imitate the characteristics of leaves and measure the dielectric constant of their upper surfaces.
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C-Band / L-Band MWDM
WD1615/C, WD1516/L
Hangzhou Huatai Optic Tech. Co., Ltd.
WD1615/C, WD1516/L WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to EDFA and DWDM network to achieve the combination and separation of C-Band and L-Band.
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Reference Ellipsometer for Thin Film Measurements
UVISEL Plus
The UVISEL Plus ellipsometer range offers the best combination of modularity and performance for advanced thin film, surface and interface characterization. FastAcq technology enables a sample measurement from 190 to 2100nm to be completed within 3 minutes, at high resolution. The possibility to continuously adjust the spectral resolution along the measurement range enables to scan a sample smarter and faster.
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Fan Type Ionizer
ER-F
Panasonic Industrial Devices Sales Company of America
With a compact size of 150 x 166 x 62mm and a fan of 120mm in diameter, the ER-F Fan Type Ionizer belongs to the leading class of compact Fan Type Ionizers. The system employs a high-frequency AC method and boasts a +/-2kV discharge output voltage that discharges electrostatic contaminated objects quickly and safely. Louvers for long distance and wide area applications are shipped with the Ionizers. Standard fan types for faster charge removal times and low-volume types for discharging small parts or film are available.
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Ozonated Water Delivery System
LIQUOZON® DI-O3
MKS' LIQUOZON® DI-O3 is a dissolved ozone gas delivery system providing high purity ozone in ultrapure water for Semiconductor and Electronic Thin Film applications like contaminant removal and surface conditioning via wet clean or rinsing methods. The high redox potential of ozone causes rapid conversion back to oxygen making it an environmentally friendly alternative to other chemical processes.
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Thin Film Composition and Thickness Monitor
P-1000
The Precision P-1000 readily analyzes compound thin films utilized in semiconductor, superconductor, magnetic and applications.
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Material Thickness Meters
Choose from a variety of material thickness meter, mil gage or paint meter products used for the non-destructive measurement of nonmagnetic coating, insulating layer and dry film thickness (DFT) on ferrous and / or non-ferrous metal substrates such as steel and aluminum. Explore PCE Instruments' selection of accurate, affordable material thickness meter, coating thickness gauge, surface testing and film gauge devices used for automotive paint inspection, material testing and manufacturing quality control applications.A material thickness meter is an essential quality assurance tool when anodizing, galvanizing and applying zinc coating to metallic surfaces. A material thickness meter also is used to measure body paint thickness and uniformity on pre-owned cars, revealing repainted spots, identifying hidden damages and exposing undisclosed accidents. This information is important when determining the actual value of a used car. In addition, certain types of thickness meters can measure wall thickness and determine the hardness of metals, plastics and glass.
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SINE M-6 Sinusoidal Array
The Sinusoidal Array SINE M-6 contains the same gray scales and sinusoidal areas as the M-5 but is arranged in a shorter and wider format, making it particularly useful when the complete array is to be imaged at one time.The overall size of the array is 70mm x 46mm; centered on an 8.5 inch (215mm) strip of 70mm film, which can also be mounted in glass (TM-G variations) at each modulation (-35, -60, -80).
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Thin Films, Plasma and Surface Engineering
A residual gas analyser for vacuum process analysis. Measures the vacuum process gas composition, contamination and leak detection.
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Thin Film Current Sensing Chip Resistors
CSTN
*Thin film process*High power rating up to 3 watts in 2512 size*Resistance values from 50m to 1ohm*High purity alumina substrate for high power dissipation*Power management applications*Switching power supply*Over current protection in audio applications*Voltage regulation module (VRM)*DC-DC converter, battery pack, charger, adaptor,*Automatic engine control*Disk drive
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Mechanical Tester
NANOVEA Mechanical Tester is the most versatile nanoindenter and scratch tester capable of precisely measuring the micro- to nanomechanical properties of wide ranges of materials from thin films, coatings, ceramics and composites to polymers and bio materials via Indentation, Scratch and Friction testing. All NANOVEA Mechanical Tester models come with true feedback load control from independent load and depth sensors that provide unmatched accuracy and the highest repeatability available on the market. This technology allows a user to perform Nanoindentation and Microindentation for Hardness and Elastic Modulus Testing, Stress vs Strain Analysis, Creep and Relaxation, Loss and Storage Modulus, Yield Strength and Fatigue, Fracture Toughness and Nano-scratch & Micro-scratch for Scratch Hardness Testing, Multi-pass Wear Test, Cohesive and Adhesive Failure Testing as well as Coefficient of Friction testing, all available on one system.
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Thick Film Passive Element
GBR-181
GBR-181series resistors are made in a thick film technology, or ceramic substrates (Al2O3) - 96&). Thick film resistors are characterized by a higher stability, and lower noises than a typical carbon resistors. The whole of resistor is encapsulated with epoxy resin by fluidization process. GBR-181 series elements are used both for general, and professional applications. Other values of resistance, and tolerance (up to 0.1%) are available on request.
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Thickness Gauges for Plastic films & Paper
CHY-CA
CHY-CA is a highly precise thickness gauge with mechanical contact method, which can be used to measure the thickness of films, sheeting, paper, corrugated paperboard, textiles, non-woven fabrics, and solid insulation materials, etc.
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C-Band Red/Blue-Band Pass MWDM
WD1515/R, WD1515/B
Hangzhou Huatai Optic Tech. Co., Ltd.
WD1515/R, WD1515/B is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to the combination and separation of C-Band, Red-Band (1547~1563nm) and Blue-Band (1528~1543nm).
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Photometer II
Spectra Film Gate
The Spectra Film Gate Photometer II offered by Spectra Cine is a significant advance in the field of photometry. It is extremely sensitive and solid state throughout. Reads directly in printer steps of 0.025 log exposure units. The large, uncrowded scale has an 80 printer point range and affords ease and accuracy in reading. A variety of probes are available for use in Acme optical printers, Bell & Howell Model "C", "J", and "A" contact printers, ARRI printers and Oxberry printers.
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Thin-Film Thickness Measurement Systems
The Filmetrics® range of affordable reflectometers deliver high-precision thin-film thickness measurements in seconds. These easy-to-use tools, combined with intelligent software and a broad range of accessories and configurations, provide maximum versatility in film thickness measurements ranging from 1nm to 3mm.
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Fully Automatic Non-contact Sheet Resistance Measurement System For Flatpanel Display
NC-60F/RS-1300N
*Global standard for non-contact measurement of ITO film, Metal thin films on flat panel*Automatic X-Y and Z (eddy current probe head) axis moving mechanism*Compatible with Loading robot for fully automatic measurementOption :*Integlate to combined system (film thickness meter, etc)*Add 4 point probe measurement unit : RT-3000
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High Power/Anti-Surge/High-Voltage Resistors
ERJ-P Series
Panasonic Industrial Devices Sales Company of America
Panasonic’s ERJ-P Series High Power Resistors offer the ability to use smaller case sizes while still maintaining the same level of power or better in respect to conventional size Thick Film Resistors. The ERJ-P Series has a unique trimming pattern and high heat dissipation characteristics. These parts can be easily designed as replacements for existing Thick Film Resistors due to comparable technology and materials with use of better manufacturing processes. The ERJ-P Series has an operating temperature of -55°C to 155°C, with a smaller part, you have a higher solder-joint reliability. Less material means less solder which lowers risk for solder fracture due to thermal expansion or contraction. Panasonic High Power Resistors are AEC-Q200 Qualified.
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Parylene Deposition Equipment
SCS offers Parylene deposition systems that range from a portable laboratory unit to production models for high-volume manufacturing applications. SCS Parylene deposition systems are designed for accurate and repeatable operation, featuring closed-loop monomer pressure control, which ensures deposition of the polymer film at a precise rate. Whether researching new coating applications or developing structures out of Parylene in the laboratory, or coating components in a production environment, SCS leads the industry with its state-of-the-art Parylene deposition systems.
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Anti-Dripping Progerty Tester
Shijiazhuang Zhongshi Testing Machine Co., Ltd.
The instrument is used for testing the main material of Polyethylene blown covering film and ethylene-vinyl acetate copolymer(EVA),the average content of Vinyl Acetate(VA)is not less than 4% of the anti-dripping progerty blown covering film within add-type. This instrument is mainly testing the first dripping beginning time and the anti-dripping failure time of the film. It is the ideal testing equipment for science research department, universities, commodity inspection, laboratory, graduate school and quality supervision departments
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Semiconductor Technology, Micro Scriber + Flatness, Bow, Warp, Curvature, Glass Thickness
FLATSCAN
Optik Elektronik Gerätetechnik GmbH
Non contact automated 2D- or 3D measurement of warp, bow, slope and surface curvature with software module for calculation of thin film stress (wafer stress) of wafers and glass substrates.
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Global Hematology Solution
HELO Solution
An innovative design solution covering all the needs of a high throughput automated hematology platform.Flexible and efficient, HELO* is the optimum answer to the constant evolution of your laboratory.The HORIBA advanced technologies embedded in the Yumizen H2500/H1500 associated with over 30 years experience in Hematology diagnosis offer the highest analytical performances.Thanks to its data, tube managment, waste, blood film and digitalization management capability, HELO not only addresses your needs, but helps you to optimize your TAT, your floor space and your reagent storage.HELO comes along with our accreditation assistance program which has been developed in accordance with ISO-15189 certification.
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SINE M-7 Sinusoidal Array
The Sinusoidal Array SINE M-7 has an image size of 22mm x 30mm which makes it small enough to fit into a standard 35mm projection frame. The gray scale is contained in the outer rows. It is made on 35mm perforated film.The TM-G variations are produced on a wider film (without perforations) and cemented between glass. They are available at each modulation (-35, -60, -80).
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Process XRR, XRF, and XRD metrology FAB tool
MFM310
Thickness, density, roughness & composition of films on blanket and patterned wafers. The Rigaku MFM310 performs high-precision measurements not possible by optical or ultrasonic techniques. This sophisticated X-ray metrology tool makes it practical to perform high-throughput measurements on product and blanket wafers ranging from ultrathin single-layer films to multilayer stacks.
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Diversity Transmitter
D4T
The D4 digital 4-channel wireless system was designed as a special purpose system for location production in film and television.
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Thick Film Passive Element
GBR-183
GBR-183 series resistors are made in a thick film technology, on ceramic substrates(Al2O3 -96%). Thick film resistors are characterized by a higher stability, and lower noises than a typical carbon resistors. The whole of resistor is encapsulated with epoxy resin by fluidization process. GBR-183 series elements are used both for general, and professional applications.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
UVISEL
The UVISEL Spectroscopic Phase Modulated Ellipsometer is a turn-key thin film metrology instrument for in-line measurement of thin film thickness and optical properties. It features rapid measurement capability with data acquired every 50 ms for powerful control of thin film uniformity across the entire web.The design of the UVISEL ellipsometric heads allows simple integration into roll-to-roll systems, while the software provides advanced communication capabilities suited to roll-to-roll production.
