Acceleration
rate of change in velocity.
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Xenon Test Chamber
Wewon Environmental Chambers Co, Ltd.
Xenon test chamber is affordable, full-featured, and has a large specimen capacity. It provides precise control of critical test parameters including spectrum, irradiance, relative humidity, chamber temperature and black standard temperature. Xenon test chamber is used for the selection of new materials, the improvement of existing materials or evaluating the changes in product formulation that affect product durability. This is an ideal instrument for total accelerated light stability and weathering testing.
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Environmental Stress Screening
ESS
Environmental stress screening (ESS) is also known as Burn-in, AST (Accelerated Stress Testing), HALT (Highly Accelerated Stress Test), or HASS (Highly Accelerated Stress Screening). Whatever the name, the idea is the same: create a test program that allows you to eliminate the infant mortality of your product.
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EMC Actuator for Gas + Brake Pedal
PSE-GB
Pneumatically operated actuator for operation of accelerator and brake pedal in vehicles. External set-point of the pedal actuator position and brake pedal force via analog voltage to closed-loop pressure regulator in external valve box.
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Piezo-resistive Accelerometer
A Piezo-resistive Accelerometer has a stable structure composed on a silicon chip created by the micromachining and semiconductor production technology. A mass and a beam on which a set of the Piezo-resisters are created on the silicon chip. A set of electrical bridged is formed by such Piezo-resistive resisters to generate signals proportional to the applied acceleration.
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HALT Test Service
HALT, Highly Accelerated Life Test is a system design validation tool for maximum robustness verification. In a step stress approach a system under functional test and operational conditions is check for functional and destruct limits.
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8 Channel 100 MS/s 16-bit ADC
SIS3302
The SIS3302 is the 16-bit extension to our 100 MS/s digitizer family. It is the 2nd DDR2 memory based digitizer unit in the SIS33xx family. The board is used for the readout of high resolution detectors, accelerator controls and other applications.
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RMS Averaging Vibration Sensor
SQ-SVS
The vibration sensor module performs calibrated averaging (root mean squared) vibration measurement with analog voltage and digital serial outputs. Because acceleration signals are extremely fast by nature, they require high speed sampling and computationally intensive processing to measure.
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Energy Saving System
ECO-Vibe neo
ECO-Vibe neo has been designed for an eco-friendly vibration test system. The test conditions with a vibration test system depends on a unit under test. Generally, the exciting force required for performing a vibration test can be calculated by the product of mass (e.g. test article, jig, table, etc.) and test acceleration. But, when the required exciting force is smaller than the maximum rated exciting force of the vibration test system, the field power supply that the constant current has to be continuously provided to produce the DC magnetic field constitutes a large part of power consumption compared with the drive power for the moving element. ECO-Vibe neo can reduce the power consumption by choosing the exciting force in this case. In addition, you can enjoy a reduction merit of the running cost from the first year when the system is introduced because initial cost is zero.
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Motadata ServiceOps – An ITSM Platform
Enterprise are looking to accelerate Digital transformation with a modern ITSM for improved IT Business processes & IT service delivery Motadata ServiceOps is an ITIL-compliant IT Service Management software designed to help your IT teams organize information, automate workflows, eliminate manual complexities, encourage self-service for maximum productivity, and superior user experience.
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Mechanical Shock Test System
BW-MST-E5000
The Mechanical Shock Tower develops the kinetic energy electromagnetically. An iron core "bullet" is attracted to the magnetic core of the solenoid by the dense magnetic field that is created as current flows through the field coil of the shock tower. As the bullet is drawn into the center of the magnetic field the acceleration increases exponentially as the gap reduces to zero on impact causing the high impact shock
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Oscilloscope
MXO 4
The R&S®MXO 4 series is the first of a new generation of oscilloscopes that excels in both performance and value. The instruments deliver a once-in-a-decade engineering breakthrough for accelerated insight.
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Type 39 CompacFrame Development Platform, 2 And 4 Slot 3U OpenVPX Aligned To SOSA
39S0xBWX9ZY2VCC0
Elma’s CompacFrame is the next generation portable test platform designed to accelerate development and test of plug-in cards (PICs) aligned to the Open Group® SOSA™ Technical Standard. Accommodates up to 4-slot OpenVPX backplane.
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Vibration Testers
Guangzhou Amittari Instruments Co.Ltd
The Vibration Tester can display the parameters of “Displacement”, “Velocity” and “Acceleration” simultaneously; Applied to the periodic motion measurements to detect moving mechanical imbalances and misaligned. Designed for on-site measuring various mechanical vibration, for quality control, running time and prior equipment maintenance data. Selection of high-performance accelerometers to achieve accurate, replicable measurement It has a bearing condition measurement function.
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UV Chamber
In PV modules, many different components are exposed to the sunlight. Therefore, the IEC 61215 defines a UV preconditioning test (MQT 10) to test whether these components can withstand the UV radiation of the sun. In our test chamber, the UV radiation is up to five times the sun intensity to accelerate the test, as requested in the UV preconditioning test.
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Turnkey Optical Modules
Optimom
Accelerate your development and focus on your true added value with Optimom™, a new range of turnkey image sensor modules, that can be instantly integrated into vision-based systems. Optimom modules are complete board-level vision extensions which comprise of our proprietary image sensors, a compact board, standard connectors, and optional embedded lenses in various options.
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4.5 Digit Handheld Multimeters
U1250 Series
The process of isolating faults is unpredictable. Equip yourself with a versatile 4.5-digit multimeter (DMM) that simplifies analysis, accelerates glitch detection, and makes it easier to probe hard-to-reach points. The Keysight U1250 handheld digital multimeters (U1251B, U1252B, and U1253B) deliver powerful performance and features that meet your toughest requirements and applications.
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Dual-Port 100G PCIe Ethernet NIC
P2100G
The P2100G 2x100G PCIe NIC builds upon the success of the widely deployed NetXtreme E-Series architecture by combining a high-bandwidth Ethernet controller with a unique set of highly optimized hardware acceleration engines to enhance network performance and improve server efficiency.
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PNA-X Microwave Network Analyzer, 8.5 GHz
N5249B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Network Function Virtualization and Software Defined Network
NFV and SDN
Network Function Virtualization (NFV) is a concept closely-related to software defined networking (SDN) whereby certain aspects of network operations (routing for example) are de-coupled from hardware and delivered as a software-only product or service. The software solutions sometimes called Virtual Machine (VM) Software Editions. Network operators, service providers, and enterprise network administrators can employ Virtualized Network Functions (VNF) to accelerate deployment of network services, cut capital expenses and reduce operating costs.
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Semiconductor
With ultra-multi pin count and fine pitch, our general-purpose IC socket lineup corresponds to every need. For semiconductor burn-in sockets for thermal acceleration tests, and test sockets for semiconductor electrical testing, we continue to hold a high market share all over the world.
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Custom Development Services
Accelerate innovation with tailored personalization of Radisys products and solutions for customer-specific use cases on wireless projects such as 4G LTE and 5GNR product development.
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Radar Scan Conversion Package
SoftScan
Curtiss-Wright Defense Solutions
This embedded computing radar product portfolio provides ultra-high radar scan-conversion performance using unique graphics processor unit (GPU)-accelerated algorithms. Utilizing the power and performance of today's modern COTS graphics offerings, SoftScan provides unrivalled scan conversion performance with minimal CPU utilization.
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FPGA Cards & Modules
BittWare’s accelerates NVMe FLASH SSDs by Sitting Alongside as another U.2 Module
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Gear Tester
MOTOMEA gear testing capabilities offer you an accurate and reliable “Gear Testing method” where you as a user can test the gear in a dynamic way, during gear acceleration period, and in a static way, by using two loading units with very accurate speed and torque sensors at the two gear sides
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LifeTest Software
In combination with the extended range of PEC test equipment, LifeTest supports the many specific functionalities required in battery testing labs. Drive cycle simulations (FUDS, DST…), thermal performance tests, high speed pulse tests (HPPT), life cycle tests, accelerated ageing tests and internal resistance measurement tests can be easily configured, scheduled, executed and reported from a single platform.
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PV Accelerating Tester
King Design Industrial Co., Ltd.
*Spectrum mis-match: IEC 60904-9 class A*Non-uniformity <5%*Instability <5% ( within 30 mins)*Irradiance range: 800 W/m2 ~ 1200W/m2*Effective range: 30cm x 30cm; 1.1m x 1.4m*(customize accepatble)*Temperature：40℃ ~ 90℃*Humidity: 20% ~ 85%
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Accelerated Product Life Cycle
Delserro Engineering Solutions
Under normal conditions it may take years to gather failure data on the life cycle of new products. Through accelerated life testing the overall time to failure can be reduced to weeks by increasing the frequency of the field loads and by removing insignificant stress components. In addition, life cycle testing on a product can be reduced or accelerated dramatically by increasing the stress levels to higher than normal. Putting a product through Accelerated Life Testing can reduce test time from weeks to days while still achieving satisfactory results saving both time and money.
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High Accelerated Life Test Chamber
Guangdong Test EQ Equipment co., Ltd.
- Rapid Temperature Cycling: Achieves rates up to 100°C/min for accelerated stress screening hass.- Multi-Axis Vibration: Combines pneumatic (6-DOF) and electrodynamic vibration for multi-stress accelerated life testing halt simulations.- Precision Control: halt process ±0.5°C temperature uniformity and real-time monitoring.- Customizable Profiles: Supports stress levels user-defined stress protocols (step-stress, dwell times).- Durability: Robust construction with corrosion-resistant materials
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PXI Fault Insertion (Fault Injection) Modules
PXI Fault Insertion Units (FIU), also known as Fault Injection switch products, are designed specifically for safety-critical applications where the response of a control system is required to be evaluated when sensor connections behave in unexpected ways. These modules are scalable solutions that can be used to switch signals between simulations and real-life devices in a multitude of hardware-in-the-loop (HIL) simulation and test systems. The fault insertion unit can significantly simplify and accelerate the testing, diagnosis and integration work in HIL applications.
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400GbE Load Modules
Keysight Network Applications and Security
The Ixia 400GbE Jumpstart Test System is a developer tool kit to help network equipment manufacturers shorten development and test time – accelerating pre-standard 400GbE networking hardware. Now customers can create, test and verify the interoperability of their next Higher Speed Ethernet technologies while maximizing their 400GbE test investment.
