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Image Analysis Software
Metallurgy Plus
International Biological Laboratories
his software can be used in Steel plants, Metal forging industry, Oil & gas industry ,Material Science, Mineralogy - metal and metal strength analysis Cement (Klincker) quality control and where ever Metallurgical microscope are used in .This Package is very useful Educational Institutions and ALL MATERIAL SCIENCE TECHNOCRATS AND METALLURGISTS.
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Acoustic Image System
Libra
Lose the basic burlap and foam. Libra panels blend effective sound absorption with striking visual aesthetics to balance reverberations—and keep the focus on the conversation. Select from four sizes up to 14 feet wide, or customize dimensions; hang wall panels or suspend panels from ceilings and trusses.
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One-Shot Image Checker
Focus-6500IA (TASCAL)
This is the image checker which inspects boards by comparing pre-registered reference image with captured image of inspected board.(Pattern Matching processing)
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1600x1200 Pixel Sapphire CMOS Image Sensor
Sapphire 2M
This 1,600 x 1,200 pixel Sapphire CMOS image sensor, designed on Teledyne e2v’s proprietary Eye-On-Si CMOS imaging technology, is ideal for diverse applications where superior performance is required. The innovative pixel design offers excellent performance in low-light conditions with both electronic rolling shutter and electronic global shutter, with a high-readout speed of 50/60 fps in full resolution. Novel industrial machine vision application features such as multi ROI, histogram outputs and 3D range gating are embedded on-chip.
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2D CMOS Image Sensors
Emerald 67M
Extreme Precision for Enhanced Manufacturing Yield and Long Distance Identification - 67 Megapixels delivers 8k of resolution on each side - Comprehensive ROI features, enable more objects to be captured in a single high resolution shot - High sensitivity with ultra low-noise performance for powerful identification.
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Image Management System
PAX-it™ 2
PAX-it 2 allows you to easily capture, organize, analyze, network, transmit, and print high-resolution images. Through the use of a simple "electronic filing system," millions of images can be effectively organized and shared throughout your work environment, whether within the same building or around the world.
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Image Quality Analysis
Quality Engineering Associates Inc.
Historically, print and image quality evaluation has been hampered by reliance on subjective judgment and guesswork. But not any more. QEA has developed a full line of quantitative, reliable image analysis tools, encompassing sophisticated, fully-automated camera-based systems, automated scanner-based systems, portable hand-helds for distinctness of image (DOI) measurements, and a portable color measurement toolkit.
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Particle Image Analyzer
DRK-7020
Shandong Drick Instruments Co., Ltd.
Determine the melting point to detect the purity of crystal material. Mainly used for determination of medicine, dyestuff, spice, and other crystal organic compounds’ melting point. Using photoelectric automatic detection, dot matrix image liquid crystal-display technology, and digital keyboard input. The instrument can measure three samples at the same time and has the initial melting, final weld automatic display, automatic recording of melting curve, automatically determine the melting point of the mean value function. The temperaturesystem uses highly linear platinum resistance as detection elements and PID regulation technology, improved the melting point’s precision and reliability. The instrument establishes communication with PC through the USB or RS232, printing or saving the curve and it uses capillary Pharmacopoeia as sample tube.
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CMOS Standard Image Sensors
The vision market is constantly looking for highly specialised, cost effective solutions where performance is not compromised. Teledyne e2v has over 40 years of heritage in imaging, with a background in the design and manufacture of CCD and CMOS image sensors.Capabilities include ultra-high speed and ultra-low noise. Teledyne e2v’s unique approach involves listening to the market/application challenges of customers and partnering with them to provide an innovative solution which brings real value to their systems.
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Microscopy Image Analysis Software
analySIS FIVE
The image analysis software "analySIS FIVE" is designed for users of industrial microscopes compatible with digital cameras for microscopes. Users can select from 5 types depending on their required functions, such as "measurement," "database," "report creation," and "particle analysis."
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2D CMOS Image Sensors
Topaz
The Topaz series of industrial CMOS sensors include 2MP (1920 x 1080) and 1.5MP (1920 x 800) resolution devices. The sensors use state-of-the-art low noise, global-shutter pixel technology to offer powerful solutions and enable compact mobile designs for many applications.
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Consumer Global Shutter Image Sensors
Smart GS Series
SmartSens creatively combines the backside-illuminated (BSI) pixel design process with the Global Shutter image sensor design to provide imaging performance with better signal-to-noise ratio, higher sensitivity and wider dynamic range . The new vitality of intelligent sensing equipment.
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SWIR Image Sensors
Though NIR and SWIR act similarly to visible light, they are not visible to the human eye. As a result, these spectrums present valuable information which can show artifacts or damage that would otherwise not be seen. Click here to see some examples of how SWIR is being used in existing applications today.
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Image acquisition software
eGrabber
Set of tools for image acquisition and recordingCompatible with GigE Vision cameras (with the optional Gigelink library)Compatible with CoaXPress cameras (with the Coaxlink cards)Compatible with Windows, Linux and macOSRecording to hard drives (with the optional Recorder library)Includes support for Intel 32-bit (x86) and 64-bit (x86_64) platforms as well as ARM 64-bit (aarch64) platforms
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Reject Station for X-Ray Image Analyser
IV-110I
IV-11OI is a reject station for X-Ray Image Analyser known for having an X-Ray Image Wire Defect Detection and a compact and space-saving dimension.
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Static Image Analysis System Particle Size
PSA300
The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high-resolution camera creates an intuitive, easy-to-use imaging workstation. Addressing a need in the field of particle characterization, the PSA300 is a versatile particle size and particle shape analysis tool that can be used in a wide range of applications in the pharmaceutical industries and material science. It is a turn-key solution for labs that want to maintain an analytical microscopy environment with minimum intervention by the operator yet still yield maximum detail in the results.
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Scientific CCD Image Sensors
Our front and backside illuminated (BSI) and backthinned Charge Coupled Devices (CCDs) are seen as the gold standard for scientific and quantum imaging in applications in spectroscopy, microscopy, In vivo, x-ray and astronomy. We understand that every imaging application is unique and requires our engineers and scientists to work closely with our customers providing highly tailored imaging solutions.
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InGaAs Camera with High Image Resolution
Cheetah Series
The Cheetah 640 series is based on a cooled, in-house developed InGaAs detector with a 640 x 512 pixel resolution. The Cheetah 640 camera with single-stage TE-cooled detector offers high frame rates of either 400 Hz, 800 Hz or 1700 Hz while the version with three-stage TE-cooled detector offers a frame rate of up to 110 Hz. The camera comes with a CameraLink interface.
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Image Sensor Testing
IP750Ex-HD Family
The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
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EMCCD Image Sensors for Space and Ground-based Astronomy
EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates such as adaptive optics and lucky imaging™.The combination of Teledyne e2v’s back-thinning technology and anti-reflection coatings enables industry leading quantum efficiency that can be optimised for applications in the visible, UV or NIR wavelength ranges.
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Image Processing and Analysis Software Deep Learning Module
ENVI® Deep Learning
L3Harris Geospatial Solutions, Inc
L3Harris Geospatial has developed commercial off-the-shelf deep learning technology that is specifically designed to work with remotely sensed imagery to solve geospatial problems. The ENVI Deep Learning module removes the barriers to performing deep learning with geospatial data and is currently being used to solve problems in agriculture, utilities, transportation, defense and other industries.
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Dynamic Image Analysis (DIA)
CAMSIZER
Dynamic Image Analysis (DIA) is a modern high-performance method for the characterization of particle size and particle shape of powders, granules and suspensions. Retsch Technology's optical analyzers CAMSIZER P4 and CAMSIZER X2 are based on this technology, covering a measuring range from 0.8 m to 30 mm.
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Image Analysis Software
Offering you a complete choice of products which include brinell pro software, caliper pro software, cast iron analysis software, hardness pro image analysis software, live measurement software and material plus software.
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CMOS Image Sensor
CIS
CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
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Thermal Image Plates
No longer are the firebricks and smoldering paper "tools of the trade" for researchers working with CO2 lasers. Now it''s possible to see IR laser beams in real time and with high resolution using a Thermal Image Plate from Macken Instruments. The characteristics of this instrument enable it to solve a wide range of problems. For example:
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High Soeed CMOS System on Chip (SoC) Line Scan Image Sensor
LS4k
The LS4k is a high speed CMOS System on Chip (SoC) line scan image sensor optimized for applications requiring short exposure times and high accuracy line rates. It incorporates on chip two pixel arrays consisting of 2 rows with 4,096 7µm pitch pixels and 4 rows with 2,048 14µm pitch pixels respectively, a high accuracy (12-bit) high speed (84MHz) analog-to-digital conversion (ADC), and sophisticated on chip optical calibration for PRNU, DSNU, and lens shading correction.
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Advanced Imaging CMOS Image Sensors
AI Series
Focusing on high-end imaging series CMOS image sensors for new security applications based on customer needs
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Image Sensor Characterization Systems
Image Sensor QE and Spectral Responsivity Characterization
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DIgital 3D Image Correlation System
Q-400
The Digital 3D Image Correlation System Q-400 is an optical measuring device for true full-field, non-contact, three-dimensional measurement of shape, displacements and strains on components and structures made from almost any material.The Q-400 system is used for determination of three-dimensional material properties in tensile, torsion, bending or combined tests. In addition, deformation and strain analysis can be applied to fatigue tests, fracture mechanics, FEA validation, and much more.
