Beam
a shaft of directed energy.
See Also: Shaft, Beam Analyzers, Beam Load Cells, Beam Profilers, Beam Sensors, Beam Splitters, Electron Beam, E-Beam, Laser Beam, Focused Ion Beam, Laser Beam Analyzers, Laser Beam Profilers
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Non-Contact Beam Profiler
BeamWatch
The patented BeamWatch non-contact profiling system accurately captures and analyzes industrial multi-kilowatt lasers wavelengths from 980nm - 1080nm by measuring Rayleigh Scattering. It features a complete passthrough beam measurement technique, no moving parts, and a lightweight compact design which makes it ideal for comprehensive analysis of industrial multi-kilowatt lasers
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33% Beam Splitter - BK7, fixed horizontal-bend mount
E1834E
The E1834E is a 33% beam splitter in a high performance horizontal mount that offer the high pointing stability for Keysight laser interferometer measurement system. The 8 flexure feet are designed for stable beam pointing.
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5G Active Antenna Innovator’s Kit
AWMF-0129
The AWMF-0129 is an active array for 5G wireless applications developed using planar antenna technology resulting in a very low profile, lightweight unit. The surface mount assembled antenna board is based on Anokiwave’s AWMF-0108 Silicon Quad Core IC and demonstrates the performance achievable using low power silicon integration and efficient antenna layout and design. Using the AWMF-0108, the antenna provides +50dBmi output power while consuming just 12W DC power in the RF circuits and has achieved Gb/s data rates in OTA trials. The electronic 2D beam steering is achieved using analog RF beam forming, with independent phase and gain control in both Tx and Rx operating modes. The AWMF-0129 antenna leads the way in showing how 5G coverage can be rolled out by network operators using the mmW bands, with low power footprint and high energy efficiency, while meeting key operating specifications for data rate, latency, coverage, and reliability.
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Laser
BDS-SMY Series
*Pulse Width Down to 50 ps*Repetition Rate 50 MHz (20 MHz Available on Request)*Free Beam or Fiber Output*CW-Equivalent Power 0.3 mW to 0.5 mW*All Electronics Integrated*No External Driver Unit*Simple +12 V Supply*40 mm x 70 mm x 120 mm
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Automated Headlight Tester
VLT 0936/MK2
Fully computerized controlled CCD Head-light Beam Tester, with fully automated vertical and horizontal movements, with automated searching of the hot spot of the beam. This robot type Headlight Beam Tester is connected to the Vehicle Test Lane Computer system and displays instructions and results to one of the large overhead SVGA monitors of the Test Lane.
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XRT Source Brighthawk
The BRIGHTHAWK NT100 is a performance-leading microfocus X-ray tube comprising proprietary technology to achieve a high brightness output. The tube consists of a LaB6 crystal source for generation of the electron beam, a magnetic beam steering system, and a tungsten target for X-ray photon emission. The components are mounted in a precision-engineering housing and held at ultra-low vacuum levels for long-life performance. Following on from the successful 3rd generation tube, this 4th generation of tube across a wide energy range from 30 kV to 160 kV is highly configurable through a software interface to the internal control board, which is connected via an optical interface (through an Ethernet converter).
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PED Systems
Pulsed Electron Deposition
Is a process in which a pulsed (80-100 ns) high power electron beam (~1000 A, 15 kV) penetrates approximately 1 μm into the target resulting in a rapid evaporation of target material. The non-equilibrium heating of the target facilitates stoichiometric ablation of the target material. Under optimum conditions, the target stoichiometry is preserved in the deposited films. All solid state materials – metals, semiconductors and insulators, including those transparent to laser wavelengths in PLD – can be deposited as thin films with PED. By combining PLD and PED, the range of complex materials that can be prepared as thin films can be greatly enhanced.
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LED Solar Simulator
LumiSun-50
The LumiSun-50™ is a high power, multi-wavelength LED solar simulator that meets IEC 60904-9 Class AAA for spectral match, uniformity of irradiance, and temporal stability. The LumiSun-50 achieves a spatially uniform illumination field from a chip-on-board (COB), multiple-wavelength LED die array. The field of illumination is 50 x 50 mm at a working distance of 200 mm. The LumiSun-50 includes a driver/controller which individually provides constant current to each die in the COB array. Total irradiance of 1.1 sun units is provided and can be decreased to 0.1 suns. The LED light source of the LumiSun-50 is contained within an air-cooled housing that can rotate the angular beam alignment. Adjustment and setting of the optimum light path working distance is visually facilitated by a converging pair of red dot laser pointers.
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Solar Simulation Systems
PET Solar Simulators consist of a Light Source with a built-in Lamp Power Supply. The Solar Simulator has an ellipsoidal reflector that surrounds the lamp and collects most of the lamp output. The radiation from the lamp is focused onto an optical integrator that helps produce a uniform diverging beam. The beam is diverted 90° by a mirror onto a collimating lens. Special filters are placed between the mirror and the collimating lens to shape the radiation spectra to match various air masses. The output is a uniform beam that closely matches the sun's radiation spectra for a given air mass. Various models offer different areas of illumination. Each model can be manufactured to simulate the sun's radiation for different air masses.
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Intex Beam Gauge & Standard Contacts
Developed to measure both internal and external diameters and lengths, the Intex gauge's aluminium extrusion beam gives it a rigid yet lightweight quality, making it ideal for shop-floor environments. The simple release of a locking thumbscrew enables the gauge's measuring direction to be changed quickly and easily.
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Etch System
When it comes to clean etches, Veeco’s Ion Beam Etch (IBE) systems deliver with sharp control and minimal disruption. Using a focused argon ion beam, this subtractive technique etches nanoscale features with precision, making it a go-to for pattern transfer, layer removal, and surface refinement where edge definition matters most.
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Ultrasonic Transducers
Ultrasonic transducers send and receive waves for many types of sensing. Examples include distance, proximity, level, nondestructive evaluation, web break detection, counting, and security applications. They typically operate at their resonant frequency with various construction options, beam patterns, and power levels.
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Optical Camera Trigger
The Optical Camera Trigger is an optical sensor that detects pulsed light sources and generates outputs to trigger a camera. The front aperture of the Optical Trigger must be directed at a light source that provides the necessary properties for trigger activation. (e.g. a laser flash lamp, a pick-off source from the main laser beam, or similar). The light source may be a direct or indirect pulsed waveform.
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Spectroscopic Reflectometer
– Antireflective coating (ARC) on textured (poly-) crystalline silicon solar cellMeasurement– Thickness, Reflectivity, n&kWavelength– 420 – 950 nm (1.3-3.0 eV) : expandableAccuracy (thickness measurement on specular sample)– 104.5 nm for 104.8 nm SiO₂on c-Si* Accuracy can be dependent on the quality of filmThickness range– 10 nm ~ 20 mm (depend on sample)Data acquisition time– < 1 sBeam spot size– ~ 50 mmFocusing of beam– Manual (optional auto-focus)Sample stage– Manual X-Y stage (specify sample size and travel distance)(optional automatic X-Y stage for mapping)
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Retroreflector
10704A
The Keysight 10704A retroreflector (cube corner) is a measurement reflector for single-beam measurements. It is paired with the Keysight 10705A single beam interferometer and is designed for making limited space, single-axis measurements. If mass is critical, the Keysight 10704A is available without housing as the Keysight 10713C, and for extremely critical mass requirements, the Keysight 10713D 1/4-inch base retroreflector can be used.
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Deposition Systems
When a thin film requires the most stringent structural or compositional properties consistently across every layer, Veeco’s Ion Beam Deposition (IBD) technology is often the answer. Using a focused beam of ions to sputter material from a target, this physical vapor deposition technique builds dense, uniform films with standout adhesion and stability.
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*High Power Laser Beam Dumps & Low Power Beam Traps
Laser beam dumps for high power laser processing, laser measurement and other applications, and low power beam traps
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Ultrasonic Angle Beam Probes For Weld Seam Testing
SONOSCAN W
The ergonomic angle beam probes for Non-destructive Testing (NDT) from the SONOSCAN series inspect metals for cracks and inclusions. In the metal industry they are mainly used for weld seam testing. Our SONOSCAN probes are powerful, robust ultrasonic transducers which can be connected to all standard ultrasonic testing gauges.
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Saybolt Color Analyzer
optek’s Saybolt color analyzer is a dual wavelength light absorption sensor. Operationally, the sensor passes a white light beam through the stream to be monitored, where light absorbance is measured at two distinct wavelengths. The measuring wavelength is set to focus on or near the peak absorbance point of the “yellowness” curve, while the secondary wavelength is chosen to compensate for any influence due to light scattering (window fouling, particulate, immiscible fluids, gas bubbles, etc.). Together, the sensor yields a repeatable and reliable true color number without any sample conditioning.
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Integrated Dual Head (IDH) Multibeam Echosounder - Shallow Water
SeaBat IDH T20/50-R
The SeaBat Integrated Dual Head (IDH) is the latest addition to the leading SeaBat T-series product range. Connected to just one very compact Rackmounted Sonar Processor (RSP), the SeaBat IDH is a complete and powerful sonar system.The SeaBat IDH, which produces 1024 beams per ping, is fully frequency agile from 200 to 400kHz, allowing for improved swath performance, less interference from other sensors and reduced survey time under challenging acoustic conditions.
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Scanning Slit Beam Profiling
NanoScan
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Beam Directional Power Supply Mains 60 To 180 kV
SiteX D1802
Our SITEX and SITEXS are capable of the direct and accurate measurement of high voltage. This essential information enables the control system to guarantee the stability and reproducibility of the radiological parameters based on true high voltage, ensuring extremely precise measurements-based utilization.
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Single Light Beam Safety Devices
Leuze electronic GmbH + Co. KG
Single light beam safety devices can be integrated flexibly into machine concepts – particularly in constrained spaces or where no flat mounting surfaces exist. They are used for point of operation and access guarding as well as for collision avoidance. The safety sensors are available as type 2 and type 4 devices with external monitoring as well as self-monitoring type 4 devices.
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Three Axis Interferometer
10735A
The Keysight 10735A Three Axis Interferometer is used in multiple axis applications where linear and angular control of the stage is required. It combines in a single package the functionality of an optical bench with multiple beam benders, beam splitters, and three interferometers. The interferometers split an incoming laser beam into three beams to measure linear distance, pitch and yaw, or linear distance, roll and yaw. Three linear measurements provide the basis for calculating two angular measurements. The inherent beam parallelism ensures that there is essentially no cosine error between the three measurements and also ensures angle accuracy for pitch and yaw measurements. Other characteristics include:
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Bi-Sector Array Antennas
*Dual 33 degree beam antennas with a 65 degree pattern foot print*Multi-band capable*IIndependent tilt control for each beam**RemoteElectricalTilt (AISG 2.0)*Increase site capacity & data throughput
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Acoustic Backscatter Sensor
LISST-ABS
The LISST-ABS is a fixed-point monitoring sensor. It uses a new and novel technique to internally compensate for geometric beam spreading and attenuation, yielding de-attenuated backscatter signal strength. It is held pointing into flow for low drag.
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Laser Module
LDM200
Artifex Engineering GmbH & Co. KG
The LDM200 series of laser diode modules are specialized units for high-end applications. The fibre coupled design allows flexible installation and separation of the electrical and optical sections. High quality optics and precision adjustment provide for excellent beam quality and very long collimation distances up to 100m. Customized fixed focus distances may also be provided. The option of choice of pola
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Beam Diagnostics Systems
Characterize the spatial intensity distribution and size of laser beams, and visualize beam shape, with speed and accuracy.
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Array Sensors
Array sensors use closely spaced beams of light to detect even the slightest differences in gray scale between the target and the background within their field-of-view. They are ideal for edge and diameter detection as well as detecting widths and gaps. SICK’s array sensors offer industry-leading reproducibility, in addition to compact, rugged metal housings for use in highly restricted or harsh environments.
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ICP-MS spectrometers (ICP MASS)
SPECTRO Analytical Instruments GmbH
SPECTRO MS is a double-focusing sector field ICP MS (ICP mass spectrometer) based on a Mattauch-Herzog geometry with a newly developed ion optic and pioneering detector technology. It is the only ICP MS instrument available on the market today that is capable of simultaneously measuring the complete mass range used for inorganic mass spectrometry from 6Li to 238U with a permanent ion beam going to the detector.
