Electron
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Product
Electron Microscope Analyzer
QUANTAX EBSD
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QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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Electron Microscope Analyzer
QUANTAX WDS
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The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
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Electron Probe Microanalyzer
EPMA-1720
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Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
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Electron Spin Resonance Spectrometer
ESR
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Electron Spin Resonance (ESR) is a powerful analytical method to detect, analyze and determine thecharacteristics of unpaired electrons in a substance. It is clear that the state of electrons in a substance have a strong influence on its characteristics and functionality, so evaluation by ESR is becoming more and more important. Many types of substances, from electronic materials to catalysts, biological samples, can be studied regardless of whether they are solid, liquid, or gas. A wide range of ESR techniques are possible using suitable attachments together with the basic instrument.
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Electron Probe Microanalyzer
EPMA
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JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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Product
Electron Microscope Analyzer
QUANTAX FlatQUAD
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QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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Product
Scanning Electron Microscope
SEM
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Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Electron Microscope Sample Preparation
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Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
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Scanning Electron Microscopes
SEM
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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
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Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Ion & Electron Detection
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Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
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Transmission Electron Microscope
TEM
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Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Product
Hot Electron Bolometer (HEB) Mixers/ Receivers In Terahertz Range
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Insight Product Company offers Hot Electron Bolometer (HEB) mixers, receivers, and chips made from NbN or NbTiN thin film. The HEB mixers can operate at frequencies of up to several terahertz.
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Product
TERAHERTZ HOT ELECTRON BOLOMETER DETECTORS FROM 0.1 to 70 THz
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Insight Product Company offers ultrafast superconducting hot-electron bolometers (HEBs) operating at terahertz frequency range. from 0.1 to 70 THz. Superconducting hot electron bolometers HEBs are designed to detect and register the electromagnetic radiation pulses in the frequency range from 0.1 THz to 70 THz.
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Scanning Electron Microscope w/ EDX Laboratory
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Product
Scanning Electron Microscope
Verios G4 XHR SEM
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The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Product
Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
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HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Scanning Electron Microscope
JSM-IT510
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Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Electron Backscatter Diffraction (EBSD) Camera
Velocity™
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high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
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Electronics
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The analog electronics enable the linearization of the SQUID characteristics through negative feedback to the SQUID.
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electronic Consolidated Automated Support System
eCASS
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electronic Consolidated Automated Support System (eCASS) will validate that the aircraft is combat ready. eCASS is the workhorse for avionics repair across the Naval Aviation Enterprise. Through automated testing at sea and ashore, maintainers are able to return equipment to readiness status quickly and efficiently. Compatibility with legacy CASS stations preserves the Navy’s investment in more than 550 Test Program Sets supporting 750 avionic components.
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Product
Electronic Calibration Module (ECal), 40 GHz, 2.92 Mm, 2-port
N4692D
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The Keysight N4692D microwave electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4692D is a precision 2-port ECal module that supports 2.92 mm connectors up to 40 GHz. Select either female-female, male-male, or female-male connectors. The plastic storage case for the N4692D is included for securing your ECal module and accessories.
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Open Source Oscilloscope
Smartscope
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Everything you need to boost the development of your own electronics devices is included in this package:the SmartScope with 1M sample buffer2 analog probesthe digital probe cablea miniB USB cable to connect to your pc or laptop
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Electronic Loads
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Flexible electronic DC loads for general purpose applications. Voltage up to 80V, current up to 80A and power up to 600 watts. CI, CR, CG, CV and CP modes, built-in transient generators. Models with USB, RS232, GPIB and LXI compliant LAN interfaces.
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POWER PROBE 4
PP401
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*Electronic circuit and component tester that supplies battery ground and power along with 8 diagnostic testing modes to provide automotive technicians with detailed information on the circuits and signals being tested*Diagnostic Modes include: AC/DC Voltmeter, Ohmmeter, Frequency, Pulse width (Positive and Negative) Fuel Injector Tester, PCM/ECM Driver Tester and PPECT3000 Signal tracer*Tests for AC/DC voltage in 100ms and 50s resolutions, AC volts RMS and volts peak-to-peak, measure resistance, frequency and pulse width (negative and positive)
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High-Power Filters
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Beehive Electronics designs custom high power RF filters used in vacuum coating systems. Our experience spans from kilohertz to gigahertz and power levels up to 50 kilowatts. We provide a turnkey solution: we design, build, and test the filters to the customer's specification.
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CW Repeater Tester
MS 1108
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The CW Repeater Tester is a computer-controlled system used to test CW Unit Electronics and its modules.
