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Product
Bus Analyzer, Exerciser, Emulator, and Programmer
CAS-1000-I2C/E
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While the I²C interface seems simple on the surface, this straightforward architecture is not immune to intermittent glitches, device misbehaviors, and protocol violations. Likewise, tracking down these errors can be tedious business if the right tool is not utilized.The CAS-1000-I2C/E bus analyzer is an exceptional tool for pinpointing I2c irregularities. The ability to spot complex problems and identify invisible obstacles make it the preferred I²C development solution. Advanced logging, debugging, emulation, and verification capabilities offer power and versatility, yet the Windows-based user interface makes the most complex features simple to use.The CAS-1000-I2C/E succeeds where simple monitoring and interactive I/O tools fall short—a complete solution to monitoring, emulating, stressing, and characterizing I²C and SMBus interfaces.
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Product
Nanoparticle Analyzer
nanoPartica SZ-100V2 Series
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A highly advanced analyzer solves the mysteries of the nano-world. A single device analyzes the three parameters that characterize nanoparticles: particle size, zeta potential, and molecular weight.
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Product
Monochromatic High Power LED Light Sources
LS-HP1 Series
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The LS-HP1 is a series of high-power, high brightness light sources for liquid light guides (LLG). It is characterized by its outstanding luminance and thus delivers very high light output from liquid light guides. The LS-HP1 works with the latest generation of high-power LEDs with up to 100W power from an area of less than 15mm². With the LS-HP1 series, we achieve the highest luminance levels through optimized optical coupling into the liquid light guide without heating it up too much. The LS-HP1 is available for liquid light guides with core diameters of 3 or 5mm.
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Product
PXIe-4136, 200 V, 1 A System PXIe Source Measure Unit
783760-01
Source Measure Unit
±200 V, 1 A System PXI Source Measure Unit—The PXIe‑4136 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4136 features 4-quadrant operation. The PXIe‑4136 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Product
5U 6 slot ATCA backplane
109ATCA506-3013R
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The 5U 6 slot ATCA backplane is a 6 slot replicated Mesh with radial IPMB, designed to meet 40Gbps (4 x 10G ports) data rates. Elma Bustronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Product
Power Transformer Automatic Test Device
XD71
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Hangzhou Xihu Electronic Institute
The device is used for power transformer power outage routine test items to do automated testing.Which is characterized by dielectric loss, insulation resistance, DC resistance, tap-changer switching characteristics, short circuit impedance and variable ratio of six test items are concentrated in an instrument,so that the instrument function, test power and test lead height fusion.Field test, just start wiring once, at the end of unplugging wiring once,the middle process by the test personnel in the computer terminal to send command control,the test system automatically completes all or part of the above test items.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Probe Card
VC20E Lab
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*20 millimeter ceramic probe card*Optimized for DC parametric test, modeling and characterization, and single site WLR*Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor*Effective operating temperature range from -65° to 200° C*Leakage as low as 5fA/V. If you require faster settling time, click here*Can be configured with up to 48 probes
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Product
Scratch Tester
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Scratch testers from Anton Paar are used to characterize film-substrate systems and to quantify parameters such as adhesive strength and friction force by using a variety of complementary methods. This makes scratch testers invaluable tools for the determination of coating adhesion, scratch resistance, and mar resistance in research, development, and quality control.
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Product
PNA-L Microwave Network Analyzer
N5234B
Network Analyzer
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to43.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Signal Integrity Measurement Systems
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GigaTest Labs is a Keysight Technologies Solutions Partner, offering fully configured signal integrity measurement systems for high bandwidth signal integrity characterization. Our wealth of experience with Keysight's Vector Network Analyzer and Time Domain Resonance Oscilloscope tools will help you navigate and understand different instrument capabilities & configuration options that will benefit your engineering team.
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Product
XPS/ESCA Service
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X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Product
DisplayPort DP Cable Compliance Test Software
S94DPPCB
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S94DPPCB DisplayPort DP cable compliance test software provides a fast and automated way to test, characterize and debug your DP UHBR design to meet compliance
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Product
Power Management Analyzer Test Suites for 802.3at, 802.3bt, & Hybrid PSEs
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While most PSE ports are part of multi-port PSE, behaviors of such systems of PSE ports are beyond the scope of IEEE 802.3 specifications. Sifos offers two fully automated analyzer suites that uniquely characterize PSE port administration and power management behaviors including PD admittance policies, PSE capacity management, LLDP policies, and powering stability. Each of these suites are built upon Live PD Emulation, a feature that enables each test port to independently and continuously emulate user-described PD’s.
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Product
Glow Discharge Optical Emission Spectrometer
GD-Profiler 2™
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The GD-Profiler 2™ provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin and thick films characterization and process studies.
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Product
AC source/sink
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The static AC source contains tried and tested components from our UPS technology., Available with adjustable output frequency and/or output voltage., Clear design, tried and tested components and easy maintenance characterize this AC source.
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Product
Spectroscopic Ellipsometry
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Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
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Product
High Power White Light LED Light Sources
LS-HP1
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The LS-HP1 is a series of high-power, high brightness light sources for liquid light guides (LLG). It is characterized by its outstanding luminance and thus delivers very high light output from liquid light guides.The LS-HP1 works with the latest generation of high-power LEDs with up to 100W power from an area of less than 15mm² and is significantly brighter than a conventional halogen light bulb with 150W. The LS-HP1 is available for liquid light guides with core diameters of 3 or 5mm.
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Product
ATCA 5U 14 Slot Mesh w uTCA connector for SHMM
1900001778-0000R
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The 14-slot mesh backplanes have standard 1X full mesh topologies. Elma Electronic’s ATCA backplanes have been simulated and characterized by our signal integrity lab to optimize performance.
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Product
Mux-scrambling Modulator
SFT3394T
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Hangzhou Softel Optic Co., Ltd.
SFT3394T is a high performance and cost-effective DVB-T modulator designed by SOFTEL. It has 16 DVB-S/S2 FTA tuner input, 8 groups multiplexing and 8 groups modulating, and supports maximum 512 IP input through GE1 and GE2 port and 8 IP (MPTS) output through GE1 port and 8 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. To meet customers’ various requirements, this device is also equipped with 2 ASI input ports. NDS3394C is also characterized with high integrated level, high performance and low cost. It supports dual power supply (optional). This is very adaptable to newly generation broadcasting system.
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Product
Frequency Multipliers
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The Kuhne electronic Frequency Multipliers can be characterized by a high band width, a very good suppression of fundamental and harmonic waves, a small current consumption and a very compact housing.
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Product
PXIe-4142, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit
782430-01
Source Measure Unit
PXIe, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit - The PXIe-4142 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4142 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Product
CMOS Image Sensor
CIS
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CMOS Image Sensors (CIS) allow multiple camera functions in mobile devices, automobiles and security systems. Nidec SV Probe provides both standard and advanced versions of our CIS cards employing a wide variety of materials ensuring a durable cost-saving solution that can meet the fine pitch and multi-dut challenges of these devices. Other features and benefits include: • Proprietary AC™ Alloy Probes • Reduced Damage Under the Pad • High Frequency Capability • Better Alignment StabilityOur advanced CIS card, the Multiplexer™, is offered specifically for high density and high parallel applications. The Multiplexer™ is built with cantilever needles held into place on one side and shorter AC™ probes on the other which leads to a more stable electrical characterization over other CIS probe card options.Contact your Nidec SV Probe Representative so we can help you find the right CIS product for your testing needs.
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Product
Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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Product
Antenna Characterization
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Radiometrics Midwest Corporation
Radiometrics Open Area Test Site and 10 Meter Anechoic chamber provide ideal test sites for antenna characterization.
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Product
Booster and In-line Amplifier
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Amonics' EDFA range adopts unique design to produce maximum signal gain and saturated output power while maintaining low noise figure, enabling test capabilities in system or component level manufacturing and characterizing processes, as well as facilitating highly demanding R&D applications. The compact turnkey benchtop or 19" rackmount unit incorporates a user-friendly front panel housing with a LCD monitor display, key switch, power control knob and optical connectors. An integrated RS232 computer interface enables easy control, diagnostic functions and data acquisition.
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Product
Software
Srive-Level Capacitance Profiling (DLCP) Measurement
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Materials Development Corporation
Drive-levelcapacitance profiling is an extremely useful technique to characterize amorphoussilicon or other semiconductor material with large concentrations of deep band gap states.
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Product
PXIe-4140, 4-Channel Source Measure Unit
781742-01
Source Measure Unit
The PXIe-4140 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4140 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Product
Foundation IP
TSMC
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Our Foundation IPs embed power management features (multi-Vt/multi-channel libraries, multi-VDD characterization, integrated power-switches, source-biasing…) which allow designers to explore the SoC architecture. Optimal configurations can be generated to meet the application’s Performance, Power and Area constraints. We also complement our offering to reach best-in-class Energy Efficient SoC by serving Always-On power-domains with a dedicated offer, optimized to achieve the ultra-low-power requirements of battery-operated devices in sleep mode.
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Product
IP QAM
SFT3332 (-D)
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Hangzhou Softel Optic Co., Ltd.
SFT3332 (-D) IP QAM modulator is Mux-scrambling-modulating all-in-one device developed by SOFTEL. It has 32 multiplexing channels, 32 scrambling channels and 32 QAM (DVB-C) modulating channels, and supports maximum 1024 IP input through the GE port and 32 non-adjacent carriers (50MHz~960MHz) output through the RF output interface. The device is characterized with dual RF output ports which broaden the bandwidth for QAM carriers.
