Correlators
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Real-time and Direct Correlative Nanoscopy
LabRAM Soleil Nano
Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.
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Concrete Strength Testers
This category of products comprises the range of instruments utilized to evaluate construction material strength. The range of instruments is typically considered to be two parts. The first are non-destructive field tests of compressive strength. The second are tensile field tester systems to either determine the tensile strength of an overlay or bond material, or tensile strength of anchors embedded in the concrete. The first group is pure Non-Destructive Testing where the strength of the material is determined by correlation to another parameter more easily available and readily apparent. This is typically the hardness of the concrete or the resistance to penetration by either a pin or probe. The Windsor Probe, Windsor Pin and our line of Rebound Hammers all fall within this category. These are widely used standard tests and as such have seen use throughout the world.
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Analyzer
Nexus8630
Highly evolved and automated correlation, pattern recognition, & analytics allow communication service providers visualize and exploit real-time insights about their service and application behaviour across individual interfaces or end-to-end connections
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Ultra-Low Range Gas Filter Correlation Carbon Monoxide Analyzer
Model T300U
The Model T300U Trace-level CO analyzer has been developed specifically to address the challenges of low level monitoring as required, for example, in the US NCore network. Using IR absorption with a Gas Filter Correlation Wheel, the T300U is designed to allow ultra-sensitive CO measurements while still meeting the requirements for use as a US EPA compliance analyzer.The optical bench is enclosed in a temperature controlled oven, dramatically decreasing instrument noise and drift. The objective and field mirrors in the sample cell are gold plated to maximize signal to noise performance, while a temperature-controlled Nafion dryer on the inlet minimizes water interference caused by ambient humidity changes. Periodically, the T300U seamlessly corrects its baseline by routing the sample through a heated catalytic CO scrubber. This Auto Reference function corrects zero drift and reduces the effect of interferences.All T Series instruments offer an advanced color display, capacitive touch screen, intuitive user interface, flexible I/O, and built-in data acquisition capability. All instrument set up, control and access to stored data and diagnostic information is available through the front panel, or via RS232, Ethernet, or USB com ports, either locally or by remote connection.The Model T300U comes with NumaView™ Software. NumaView™ Remote PC Software allows for a remote connection with virtual interface and data downloading capability to analyzers operating NumaView™ Software.
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Correlation Analysis
EDM Modal Correlation Analysis allows the user to correlate two modal models; EMA and/or FEA models. Comparing the experimental data with that acquired through finite element analysis helps in validating the test results. Users can import the geometry model and mode shape data from FEA or EMA software.
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Modulation Distortion Up To 50 GHz
S930705B
S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Signal Analysis
Cross-Correlation Analysis
The software is used for correlation analysis of signals coming from the input channels of FFT spectrum analyzers in real time or recorded time realization view mode, as well as for viewing various correlation characteristics of signals. Correlation analysis is a set of methods based on the mathematical correlation theory and is used for detecting the correlation dependence between two random attributes or factors. For solving a number of diagnostic tasks, cross-correlation analysis of signals in two or more control points distributed across space is often used.
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PXI-6281, 16 AI (18-Bit, 625 kS/s), 2 AO, 24 DIO, PXI Hybrid, Multifunction I/O Module
779121-01
16 AI (18-Bit, 625 kS/s), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXI‑6281 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Dielectric Loss Tangent and Transmission Attenuation Measurement System
RTS03
RTS03 measures relative permittivity (dielectric constant), dielectric loss tangent in the frequency range between 5GHz and 26.5GHz based on a correlation between measurement frequency and transmission attenuation as the microwave passes through the flat plane sample.
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Modulation Distortion Up To 26.5 GHz
S930702B
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Phase Noise Analyzer
NXA-6
This new NXA-6 is a sea-change in Phase Noise Test Systems. Making both residual and absolute noise measurements out to 6 GHz, this self-contained instrument uses either internal or external references with cross correlation for maximum dynamic range.
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PCI-6280 , 16 AI (18-Bit, 625 kS/s), 24 DIO PCI Multifunction I/O Device
779108-01
16 AI (18-Bit, 625 kS/s), 24 DIO PCI Multifunction I/O Device - The PCI‑6280 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Mid-Range Gas Filter Correlation Carbon Monoxide Analyzer
Model T300M
The Model T300M CO analyzer measures low to mid ranges of carbon monoxide by comparing infrared energy absorbed by a sample to that absorbed by a reference gas according to the Beer-Lambert law. Using a Gas Filter Correlation Wheel, a high-energy IR light source is alternately passed through a CO filled chamber and a chamber with no CO present. The light path then travels through the sample cell, which has a folded path of 2.56 meters.The energy loss through the sample cell is compared with the span reference signal provided by the filter wheel to produce a signal proportional to concentration, with little effect from interfering gases within the sample. This design produces excellent zero and span stability and high signal to noise ratio, allowing excellent performance from low to high range.All T Series instruments offer an advanced color display, capacitive touch screen, intuitive user interface, flexible I/O, and built-in data acquisition capability. All instrument set up, control and access to stored data and diagnostic information is available through the front panel, or via RS232, Ethernet, or USB com ports, either locally or by remote connection.The Model T300M comes with NumaView™ Software. NumaView™ Remote PC Software allows for a remote connection with virtual interface and data downloading capability to analyzers operating NumaView™ Software.
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Modulation Distortion Up To 13.5 GHz
S930701B
S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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PCIe Gen3 4K at 500 Fps High Speed Compact Camera for Testing
CB160CG-LX-X8G3
4K at 500 Fps High speed, compact, fast camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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High Accuracy Spectrophotocolorimeter
LMS-3000
• Measure and display the relative spectral power distribution (UV-VIS-NIR) P(λ), chromaticity coordinate, correlated color temperature, rending index, color difference, peak wavelength, luminous flux, luminous flux efficiency and photometry parameters of light source and light material under the control of general PC. • Automatically adjust high-voltage, it not only shortens the measurement time, but also reduces the wear and tear of the instrument • Simultaneously measure the temperature in both environment and integrating sphere to make the data more visually and reliably • Figure of chroma and color difference in test report can be exchanged freely • Color display and print. The relative spectral power distribution (UV-VIS-NIR) P(λ), reports both in English. RS-232-C interface, compatible with all kinds of computer • LSP-500 AC Power source PC RS-232-C interface. compatible with all kinds of computer • Range of wavelength: 380nm～780nm(Special:200nm～780nm) • Accuracy of wavelength: ±0.2nm • Repeatability of wavelength: ±0.1nm • Accuracy of chromaticity coordinate: ±0.0003(under standard illuminate A) • Spectrum sample interval: 5nm(Special order:1nm) • Luminosity linearity: 0.3% • Accuracy of luminosity: 1 class • Correlated color temperature measure range: 1500K～25000K • Accuracy of CCT: ±0.3%(under standard illuminate A) • Accuracy of rending index: ±(0.3%rd±0.3) • Environment temperature measure range: -10℃～80℃ • Temperature measure range(In sphere): -10℃～100℃
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Portable CCD Spectroradiometer
LMS-6000
The Portable CCD Colorimeter Spectroradiometer has the following versions which can measure different parameters: • LMS-6000: illuminance (lux), E(Fc), Ee(W/m2), Tc (K), Duv Correlated Color Temperature (CCT), Chromaticity Coordinates, CRI, Purity, Peak Wavelength, Dominant Wavelength, Half Bandwidth, Center Wavelength, Centroid Wavelength, Total Color Difference, Brightness Difference, Red-Green Degree, Yellow-Blue Degree, CCT Difference, SDCM Diagram, Spectrum Diagram • LMS-6000L: cd/m2, fL, Tc (K), Duv Correlated Color Temperature (CCT), Chromaticity Coordinates, CRI, Purity, Peak Wavelength, Dominant Wavelength, Half Bandwidth, Center Wavelength, Centroid Wavelength, Total Color Difference, Brightness Difference, Red-Green Degree, Yellow-Blue Degree, CCT Difference, SDCM Diagram, Spectrum Diagram • LMS-6000P: LMS-6000 Parameters+PAR, PPFD, YPFD, Blue-purple irradiance Eb, Yellow-green irradiance Ey, Red-orange irradiance Er, Ratio of red and blue radiation Erb_Ratio • LMS-6000S: LMS-6000 Parameters+PAR, PPFD, YPFD, Blue-purple irradiance Eb, Yellow-green irradiance Ey, Red-orange irradiance Er, Ratio of red and blue radiation Erb_Ratio, Rf and Rg according to TM-30 • LMS-6000F: LMS-6000 Parameters+Flicker test • LMS-6000B: LMS-6000 Parameters+Blue Light Hazard Weighted Irradiance according to GB/T20145, CIE S009/E:2002 • LMS-6000BF: LMS-6000 Parameters+Flicker test, Blue Light Hazard Weighted Irradiance according to GB/T20145, CIE S009/E:2002
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PCI-6284 , 32 AI (18-Bit, 625 kS/s), 48 DIO PCI Multifunction I/O Device
779110-01
32 AI (18-Bit, 625 kS/s), 48 DIO PCI Multifunction I/O Device - The PCI‑6284 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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NI-9423, 24 V, 8 Channel (Sinking Input), 1 µs C Series Digital Module
783735-01
24 V, 8 Channel (Sinking Input), 1 µs C Series Digital Module - The NI‑9423 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each channel is compatible with 24 V logic levels, can accept up to … 30 V discrete logic levels, and has an LED that indicates the status. The NI‑9423 offers isolation between the input and output banks from channel to earth ground. The NI‑9423 is a correlated digital module, so it can perform correlated measurements, triggering, and sychronization when installed in a CompactDAQ chassis.
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LED Lighting Test Instrument Integrating Sphere
CX-I.5S
Shenzhen Chuangxin Instruments Co., Ltd.
Measure Luminous Flux, Luminous efficacy, radiant power, Spectral Power Distribution, Chromaticity Coordinate, Correlated Color Temperature, Peak Wavelength, Dominant Wavelength, Spectral Half Width, Color Rendering Index, Colorimetric Purity, red ratio, Standard deviation of color matching(SDCM), voltage, current, power, power factor, harmonics, and etc. It meets the requirements of CIE standards.
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ARINC 429 Test And Simulation PCIe Module
PCIe-C429
*4, 8, 16 or 32 software programmable TX / RX channels*X4 lane PCI Express host interface*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*Sorting according to SDI field*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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PXI-6284, 32 AI (18-Bit, 625 kS/s), 48 DIO, PXI Hybrid, Multifunction I/O Module
779122-01
32 AI (18-Bit, 625 kS/s), 48 DIO, PXI Multifunction I/O Module—The PXI‑6284 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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ENA-X Vector Network Analyzer
E5081A
Our spectral correlation technique directly analyzes the modulated input and output signals in the frequency domain on the network analyzer. Current solutions on the market require a network and spectrum analyzer to characterize components fully. With the new ENA-X, you can ensure test accuracy and repeatability with a single test setup using full vector correction at the DUT plane. Avoid manually reconfiguring setups or automating complex switch-based systems — verify device performance faster and with less error potential with the ENA-X network analyzer.
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Single Shot Third-order Cross- Correlator
Rincon SS
Specifically developed for measuring a wide array of output parameters from ultrafast laser systems including: contrast ratio of laser pulses, determining pulse pedestal, pre- and post-pulses, and amplified spontaneous emission in femtosecond systems.
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Partial Discharge Detection and Localization System for Power Transformers
AE-150™
The AE-150™ is designed to detect and localize Partial Discharge activity by correlating acoustic and electric sensors’ data. The AE-150™ has many acquisition modes, each used for detecting and locating Partial Discharge activity in a transformer. The AE-150™ unit is mounted on the transformer tank using its powerful magnets that also hold four acoustic sensors. Acquired data is sent to Mirador-Tx software where all advanced positioning functions are implemented. This cutting-edge software allows easy data interpretation, reporting and monitoring.
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PCIe Gen3 4K Compact, High Speed Camera for Testing
CB120MG-CM-X8G3
4K, compact, high speed camera for: Vehicle Impact, Airbag Deployment and Safety Restraints Testing, Digital Image Correlation (DIC), Projectile, Explosives, Ballistics, Combustion and Missile Launch Tracking, Fluid and Flow Visualization, Sports Broadcasting, Commercial Film, Television and Studio Production, Fluidics and Particle Image Velocimetry (PIV), Flat panel inspection (FPD), printed circuit board (PCB) examination and more.
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ARINC 429 Test And Simulation PXI Module
PXI-C429
*4, 8, 16 or 32 software programmable TX / RX channels*Programmable high / low speed operation*Simultaneous operation of all TX / RX channels*PXI interrupts, star trigger, and PXI clock*Error entry and detection*128 MB RAM*Label selective triggering for recording / filtering*IRIG-B timecode encoder / decoder for data correlation*Real-time recording and later analysis of multiple channels*Supports: C, C ++, C # and .net*Driver support: Windows, Linux, VxWorks and other systems
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Oil In Water/Soil Analyzer
InfraCal 2 ATR-SP
The InfraCal Model ATR-SP is recommended for measuring oil in water, TPH in soil or FOG in wastewater concentration levels when using hexane, pentane or Vertrel MCA as the extracting solvent. Measurement data obtained with this analyzer will correlate to EPA Method 1664 as both procedures are based on evaporation techniques and measuring the residual oil and grease. The analyzer is equipped with a built-in cubic zirconia horizontal attenuated total reflection (HATR) stainless steel sample stage. The InfraCal 2 ATR-SP is a direct replacement for the original InfraCal HATR-T2 used worldwide for the determination of TOG/TPH in water and soil.
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LED Fast-Scan Micro-Spectrophoto Colori meter
8000
Shenzhen Chuangxin Instruments Co., Ltd.
The system can determine spectral power distribution, chromaticity coordinates, correlated color temperature, color rending index (Ra), color difference, peak wavelength, spectral half width, dominant wavelength, color purity, luminous flux, test for photometry colorimetry electricity of LED characteristics.
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PCI-6255, 80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO PCI Multifunction I/O Device
779546-01
80 AI (16-Bit, 1.25 MS/s), 2 AO (2.86 MS/s), 24 DIO PCI Multifunction I/O Device - The PCI‑6255 offers analog I/O, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
