Stimulus
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True-Mode Stimulus
S95460B
S95460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on M980xA PXI vector network analyzers.
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DC Bias and RF Stimulus Control Module
Quantum SMART Fixture
Accel-RF Corporation, the world leader in turnkey RF automated reliability test instruments, has "unplugged" the industry-leading RF SMART Fixture from their automated test platform and made it available for benchtop test. The NEW Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture. The signals are controlled from a user interface compatible with Accel-RF's LIFETEST software. The Quantum SMART fixture is capable of "active" temperature control and monitoring of a remote DUT through embedded firmware in the microprocessor
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Stimulus Induced Fault Testing
SIFT
SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Stimulus Test Cell
HA7300
The Stimulus Test Cell HA7300 is a test cell which provides an environment for high-speed, highly accurate temperature and pressure test of differential pressure sensors, utilizing Advantest’s unique temperature control unit with simultaneous temperature control for 8 devices, as well as a newly developed 2Port pressure controller and pressure application nozzle.
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True-Mode Stimulus
S97460B
S97460B provides mismatch-corrected true-mode stimulus and enables accurate balanced measurements on 4-port P50xxA vector network analyzer configurations.
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Chroma LCR Meters
Chroma Systems Solutions, Inc.
Some of the key features to look for in an LCR meter (also known as an impedance meter) are: accuracy, test frequency, measured parameters, test voltage and test current. Additionally, an easy to understand display of test results and the ability to access and use these results has become increasingly important. Component testing often requires much more than simply a resistance, capacitance or inductance value at a given test frequency and stimulus voltage. An LCR meter or impedance meter must have the flexibility to provide multi-parameters over wide frequency and voltage ranges.
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COTS VME Board Tester
*Developed for support of Virginia Class Submarine at the COATS Integration Facility.*Provides Stimulus and Measurement Subsystem (SMS) to control, monitor, and evaluate VME assets used in the Non-Propulsion Electronic System (NPES) of the submarine.*Provides Native Environment Subsystem (NES) that simulates the operational configuration of typical NPES installations, and permits the test and evaluation of several types of VME assets.
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Accessories: Mobile Vibration System
The Mobile Vibration System from Copernicus Technology is a new and affordable system for applying vibration stimulus during testing work, with a range of features that make it highly adaptable and fully configurable by the user.
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JTAG Boundary-Scan I/O Modules
SCANIO Family
The Corelis family of SCANIO™ modules turn any IEEE standard 1149.1 boundary-scan controller into a powerful digital boundary-scan tester. The SCANIO family of products use boundary-scan gate arrays to add control and visibility to connectors, traces, and logic that can not be tested using traditional boundary-scan techniques.The SCANIO products, when combined with a boundary-scan controller, operate as a traditional “bed-of-nails” tester except access to the stimulus and response I/O’s is achieved via boundary-scan.
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Platforms
The use of switching systems to route instrumentation and stimulus signals to appropriate test points on a unit under test has a very crucial role to play in most electronics test systems. The sharing of test resources, connection of calibration references, load management, and many other functions are all managed by the switching system, the switching system acts as the interface between the unit under test (UUT) and the test equipment.
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PCI and PCI-X Bus Analyzer / Exerciser
PCI850
The PCI850 analyzer provides a multitude of functions to help analyze your system.- Capturing bus activity using sequential triggers and filters- Exerciser to perform memory, I\O and configuration cycles- Stimulus generation for hardware simulation- Target memory with addressable windows- Anomaly detection of protocol and timing violations- Performance analysis of utilization, transfer rates, latency, statistics- Compliance testing
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PCI D/S, S/D, I/O & Comm Board
76CS3
NAI’s 76CS3 is a PCI/PCIe multifunction I/O and communication board designed for applications requiring Digital-to-Synchro/Resolver (D/S) and Digital-to-LVDT/RVDT (DLV) stimulus output, as well as I/O and communication functions. This full-slot board contains five independent, function module slots. The board can be configured for 6 separate D/S channels, or for D/S in combination with I/O and communication modules. Using multiple DSPs, the enhanced motherboard enables higher processing power and dedicated pre-processing control for each module.
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Astronics PXIe-6943, 1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument
785855-01
1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.
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Modulation Distortion For E5081A Up To 44 GHz
S960707B
The S960707B modulation distortion software application provides nonlinear DUT behavior tests (EVM, NPR, and ACPR) under modulated stimulus conditions.
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6U CPCI D/S, S/D, I/O & Comm Board
78CS2
NAI’s 78CS2 is a 6U cPCI Multifunction I/O and Communication Board designed for applications requiring Digital-to-Synchro/Resolver (D/S) stimulus output, as well as I/O and communication functions. This board contains five independent function module slots. The board can be configured for 10 D/S channels, or for D/S in combination with I/O and communication modules. Additional enhancements include FIFO data buffering for select modules. Using multiple DSPs, the enhanced motherboard enables higher processing power and dedicated pre-processing control for each module.
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RF Sources
Textron Systems’ commercial RF Sources (RFS 340, SSI) provide an unmatched combination of frequency coverage, power range, signal fidelity and switching speed in either a two-slot VXI, 1U LXI®, or VME Synthetic Stimulus Instruments (SSI) format.
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NI-5741, 16-Bit, 1 MS/s, 16-Channel Signal Generator Adapter Module for FlexRIO
782864-01
The NI‑5741 provides simultaneously sampled analog output channels for signal generation. It also features single-ended, DC-coupled inputs and general-purpose digital input and output lines for system stimulus and control. The NI‑5741 is ideal for applications requiring high-channel density and the power of a user-programmable FPGA. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the NI‑5741, you must pair it with a compatible PXI FPGA Module for FlexRIO.
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MEMS Inertial Test
Cohu´s inertial solutions enable high precise Gyroscope and Accelerometer test with best-in-class cost of test due to high parallelism and package flexibility. All Cohu stimulus modules guarantee high precision and velocity stability as well as high temperature accuracy. With use of our high efficient handler portfolio we can offer the ideal solution with optimized cost of test.
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Tri-Temp Strip Level Test Instrument
Apollon
APOLLON is a tri-temperature strip-level test system for motion sensors. It is especially designed for high-end Automotive and Industrial applications. APOLLON offers extremely good testing conditions: high stimulus and temperature accuracy and low noise level.
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RFP DC Low Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Battery Analyzers
BA6010 Series
The BA6010 Series battery analyzers measure voltage and resistance of modern battery technologies with high accuracy, resolution, and speed. Additionally, these instruments provide auxiliary measurement parameters inductance, capacitance, dissipation factor, impedance, quality factor, reactance, and phase angle in degrees and radians. The BA6010 Series is suitable for characterizing battery chemistries that are responsive to a 1 kHz AC stimulus signal including lead acid, lithium and alkaline type batteries used in consumer products, electric vehicles, power backup, security, and fire alarm systems.
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MEMS Handler
4664-IH
The ULTRA P is a high performance production handler that provides thermal conditioning, full 6 DOF mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Power-Switching Test System
High Voltage Switching Test System
The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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Modular Power
RFP DC Load
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Serial Analyzers
This product enables passive monitoring, debugging, and target system analysis of all speeds of Serial RapidIO Gen2 and Gen1 from the physical coding-sublayer (PCS), through serial protocol, to full-duplex link protocol exchanges. Stimulus transmitters allow for injection of SRIO packets, control symbols, and 8b/10b characters.
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Modulation Distortion Up To 90 GHz
S930709B
S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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PXI 8/16-Channel Isolated D/A Converter
M9185A
The M9185A is a fully independent, isolated D/A converter that is capable of supplying high voltage levels in parallel of up to eight or sixteen channels. Each channel is able to output up to 16V as stimulus signals to Device Under Tests (DUTs).
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Wafer Level Test Handler
Kronos
Wafer level test handler for 6/9DOF sensors with real stimulus. Very high UPH capacity and the lowest cost of test (COT). KRONOS is one of the only wafer level test solutions for motion sensors with real stimulus.
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Accessories: Test Hardware
Copernicus Technology supply test hardware accessories to support Intermittent Fault Detection testing using VIFD™ and IFDIS™ test equipment, such as Interface Test Adapters (ITA). We also supply and repair general purpose and customer-spec test hardware accessories: ITAs, Break-Out Boxes (shown below) and Mobile Vibration Systems. The Mobile Vibration System can be quickly set up in repair bays for applying environmental stimulus to components and wiring harnesses during testing.
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Characterization Platform
This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF's embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
