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Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
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2-Module ICT System, I317x Series 6
E9902G
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Medium-power DC Electronic Load (900W~6000W)
FT6400A Series
Shenzhen FaithTech Technology Co., Ltd.
The FT6400A series has modular design, with strong adaptability, high reliability and high maintainability. Mainly used in power electronics testing fields such as power batteries, medium and high power DC power supplies, DC generators, etc. The FT6400A electronic load not only provides OCP, OVP, OPP, OTP, RVP but also provides Von and Voff functions and programmable protection functions for the device under test. These features can greatly improve the reliability of the product, and it is a reliable product for engineering test and automatic test system integration.
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Test Connector Components
Any flat substrate, or bumped substrate, can be compressed against Z-Axis Elastomeric Connectors to make contact. The picture illustrates a Z-Thru Z-Alloy Connector Frame used to connect the DUT (Device Under Test) to a circuit board.
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4x8 2 Wire USB Modular Switch Matrix
U2751A
The U2751A USB Modular Switch Matrix offers a flexible connection path between the device under test and the test equipment, thus allowing different instruments to be connected to multiple points on the device under test at the same time. This instrument is able to support measurements at a high bandwidth of up to 45MHz. It uses the common non-proprietary standard high-speed USB 2.0 interface that provides ease of connectivity
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12-Ch 10A-250VAC RCV Power Distribution Unit
YAVAR438
- Hardware controlled Enable Input- 12 Power relays up to 10A 250VAC/DC and 300W or 2.700VA switching power- 12 10-mOhm shunt resistors.- 6 Switched 2-Pole sense channels- Single phase isolated or 3-Phases non-isolated switching capabilities, to or from the device under test (power or load)- VPC TriPaddle 96 pins connector.- NI LabView & TestStand driver.- .NET, C/C++, VB driver.- Soft Front panel for direct interface.- CAN Control or Ethernet (with Ethernet to CAN Gateway).- Self-test module available.- Form A
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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PCIe 6.0 Protocol Exerciser
P5573A
Keysight P5573A PCIe 6.0 Protocol Exerciser gives the flexibility in providing realistic traffic to devices under test and also able to emulate as a complex host system
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Regenerative Power System, 500 V, 40 A, 10 kW, 200/208 VAC
RP7952A
The RP7952A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test. The regenerative capability enables the energy normally consumed to be returned to the grid cleanly, saving costs associated with energy consumption and cooling.
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Bulk Current Monitoring Probe
MP-50
The Current Monitoring probes may be used whenever RF current measurements are required. Current measurements are made by placing a current carrying conductor within the “sensing” window of the probe and measuring the probe’s output voltage with an RF detector. Calibration of the probe permits the conversion of the voltages measured to current. Current measurements can be made over the frequency range shown in the transfer impedance curve furnished with each probe. There is virtually no loading of the circuit and the technique permits normal operation of the device under test during measurements. The MP-50 can be used for the procedure for clamp injection when the common- mode impedance requirements cannot be met given in chapter 7.4 of IEC/EN 61000-4-6 „Immunity to conducted disturbances, induced by radio frequency fields”. The MP-50 can also be used as current monitor for BCI testing as per ISO11452-4, RTCA/DO-160 section 20, MIL-STD-461 and various automotive standards.
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NI-9239 , ±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module
782402-01
±10 V, 50 kS/s/ch, 24-Bit, Simultaneous Input, 4-Channel C Series Voltage Input Module - The NI‑9239 performs differential analog input. With channel‑to‑channel isolation, your entire system, including the device under test, is protected from harmful voltage spikes up to the isolation rating. In addition to safety, isolation eliminates measurement errors caused by ground loops because the front end of the module is floating. Designed for both speed and accuracy, the NI‑9239 is an effective general-purpose analog module because of its resolution, sample rate, and input range.
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Regenerative Power System, 500 V, 20 A, 5 kW, 400/480 VAC
RP7961A
The Keysight RP7961A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test. The regenerative capability enables the energy normally consumed to be returned to the grid cleanly, saving costs associated with energy consumption and cooling.
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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Spring Probes
An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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Test Fixture Kits
More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Milliohm Meters & Microhm Meters
Shanghai Beha Electronics Co., Ltd.
Makes measurements by passing a constant current through the device under test (generally a conductor, contact or low resistance) and measuring the voltage across it. It has visual LED checks for excessive; potential lead resistance (RP) and current lead resistance (RC). Should the instrument become too warm, the temperature sensor will shut down the current (ISCOFF).
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Error Detector Remote Head 32 and 17 Gb/s
N4952A
The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
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External Frontend
FE50DTR
The R&S®FE50DTR external frontend can extend the frequency range up to 50 GHz for Rohde&Schwarz signal and spectrum analyzers as well as signal generators. The R&S®FE50DTR enables signal up and downconversion directly at the device under test (DUT), lowering cable losses, increasing sensitivity and delivering more power at the antenna in an OTA environment. With a dual connector system, testing of active components is an easy task.
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PXI 18 Channel Data Comms MUX, 96-pin SCSI
40-735-902
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. The 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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Tan Delta Measurement
TD Series
While partial discharge measurement is suitable for detecting electrical trees, tangent delta measurement – also referred to as dissipation factor measurement – detects water trees which have formed in the insulation of the device under test.
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Regenerative Power System, 160 V, ±125 A, 10 KW, 400/480 VAC
RP7946A
The Keysight RP7946A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Automated Optical Inspection (AOI)
Automated optical inspection (AOI) is an automated visual inspection of printed circuit board (PCB) (or LCD, transistor) manufacture where a camera autonomously scans the device under test for both catastrophic failure (e.g. missing component) and quality defects (e.g. fillet size or shape or component skew). It is commonly used in the manufacturing process because it is a non-contact test method.
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Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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PXI Single 36 Channel MUX, SMB Connectors
40-735-912-S4
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. This 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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PXI Power & Sense Multiplexer, 2-Pole, 18-Channel
40-658A-002
The 40-658-002 is a PXI multiplexer combining a 2-pole 18-way power distribution MUX with a second lower power 2-pole 18-way MUX in a convenient single slot PXI module. It is ideal for power distribution where power and sense signals are required to be connected to an array of devices under test.
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Single Board Source/Meter/Switch
SMSU
SMSU Series SourceMeterSwitch Unit (SMSU), introduced by SW Link Ltd, is single-channel voltage/current sourcing, 4X6 switch matrix and measurement instruments. Each Series 100 SMSU instrument tightly integrates highly accurate stable DC power source and a true instrument-grade programmable gain amplifier and 18bits ADC on a 100x100mm PCBs. It can output up to 20V, sub-uA to 1A current to device under test (DUT)
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256 Channel Power Supply
IDPS750
Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
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PXI Battery Simulator Module
41-751-001
The 41-751 is a low power battery simulator module that can be used to simulate the power supplies of cellular phones and other portable battery devices. It features fully floating output terminals than can deliver voltages up to 6 Volts. The fast responding remote sense connections allow the module to regulate the supply voltage at the device under test.
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Regenerative Power System, 80 V, ±250 A, 10 KW, 200/208 VAC
RP7935A
The Keysight RP7935A regenerative power system is a single output, bi-directional, regenerative DC power supply with highly integrated safety features that protect both your people and your device under test.
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Artificial Power Supply Network
KH3760
Beijing KeHuan Century EMC Technology Co,.LTD
The artificial power supply network (also called the power supply impedance stabilization network) should be able to provide a stable impedance to the device under test in the radio frequency range, isolate the device under test from high-frequency interference on the power grid, and then couple the interference voltage to the receiver.
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Test Port Adapter Set, 3.5 Mm (Test Port) To Type-N
85130C
The Keysight 85130C test port adapter is designed to protect the test set port when it would be directly connected to the device under test. These adapters have a special rugged female connector designed for connecting to the network analyzer test port. This special connector will not mate with a standard male connector, but converts the rugged test set port to a connection that can be mated with the device under test. The set contains a 3.5 mm to type-N male adapter and a 3.5 mm to type-N female adapter. The frequency range for these adapters is dc to 18 GHz with a return loss of 28 dB or better.
