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Product
Gold Probes
4900 Series
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The "GOLD PROBE" has been designed specifically for use with Tektronix, Hewlett Packard and other high performance oscilloscopes. This new slim design along with a host of versatile accessories, allows you to reach the most difficult test point in today's highly complex circuitry. The gold plated Probe Tips, Sprung Hook, Ground Lead, Alligator Tip and other critical interconnect points within the Gold Probe, provide excellent contacts for probing low level analog signals and high speed digital data. Unlike most "off shore" commodity probes, Probe Master guarantees quality and continuing domestic support for our "Made in America" Gold Probe.
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Product
Fluxgate Probes
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Hirst Magnetic Instruments Ltd
Fluxgate Probe is a high sensitivity probe designed to measure low magnetic fields.
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Product
Current Probes | Current Sensors
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Sensitivity of Conventional Probes Deliver Precise Measurement of Low Current Waveforms from 1 mA. High-precision Current Sensors, DC to 4 MHz, DC to 20 kHz, up to 50 kHz and load current sensors,
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Product
Frequency Shaped Isotropic Electric Probes
PI-SH-FCC, PI-SH-ICNIRP
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An isotropic electric field probe with shaped frequency response meeting the ICNIRP or FCC RF safety standards for occupational and general public exposure limits (see the specified frequency ranges below). Meter readings are shown in % of the STD – standard reference level, eliminating the need to know the source frequency. Probe output is proportional to RF power density in the whole specified power range, producing the correct RF power measurements in single and multi-signal environments, typically present at multiple antenna sites.
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Product
Smart Probes
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A wide selection of rugged smart probes for your sensing needs. From non-contact IR sensors to a full range of sensor types including Temperature, Humidity, Process, RTD, Thermocouple, pulse, and mor...
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Product
Test Fingers & Probes
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Test Fingers and Probes are used in most standards to check accessibility to moving parts or hazardous live parts. They comes in many forms, such as test fingers, test rods, test balls etc.
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Product
High Impedance Active Probes
12C
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A high speed, high input impedance active probe for measuring the internal node voltage of integrated circuits. The input is 1 megohm shunted by 0.1 pf and the rise/fall times are 0.8 ns. This instrument has full dc capability and can be used with any oscilloscope. The Model 12C was specially designed so that when used in conjunction with a high input impedance oscilloscope, signal attenuation is 10:1 and with a 50 Ohm input, signal attenuation is 20:1.
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Product
Multi-Purpose Probes
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*For All your Functional Test Needs *Machine Building *end of line test
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Product
Optical Probes- High Bandwidth
DPO7OE
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The DPO7OE series optical probes with a DPO70000 real-time scope deliver the performance and advanced debug capabilities designers need to fully troubleshoot 400G PAM4 signals, up to 56 GBaud, and reduce time to market.
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Product
IsoVu Isolated Probes
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The IsoVu Measurement Systems can make nearly impossible measurements – like high-side Vgs- a reality, providing today’s power engineer with measurement insights not available in other power systems and instruments. When performing near-impossible measurements, especially in those involving Gallium Nitride (GaN) and Silicon Carbide (SiC), it can be extremely time consuming and cumbersome. IsoVu eliminates those concerns: IsoVu probes offer better common mode rejection and higher bandwidth for high EMI environments and on power FETs like SiC and GaN.
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Product
HPA-0 General Purpose Probes
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
ICT / FCT Probes
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*Decades of experience*Proprietary base materials and coatings*Innovative designs*Optimized electrical path
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Product
High Impedance Active Probes
34A
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Engineered to meet the stringent demands of advanced high frequency circuit designers. This high impedance probe combines full DC capability, rise/fall times of 120 ps, and a nominal loading input impedance of 10 megohm shunted by 0.1 pf. Signal attenuation is 20:1 with a 50 ohm oscilloscope input.
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Product
Test Probes
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Test Probes provide the vital link to transfer measurement signals as true and as undistorted as possible. Therefore these elements can be regarded as the heart of Test Fixtures – and for this very reason it is important for Equip-Test to offer high performance Test Probes with best quality and value, and thus ensure maximized ROI (Return of Investment) for our customers. Test Probes supplied by Equip-Test always provide the best-possible available solution for your contacting demands.
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Product
Probes
71 Series
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American Probe & Technologies, Inc.
10 mil (0.010") shank sizesAvailable in straight and bent shapes
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Product
Spring Probes
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An essential component in the testing of electronic components. In Test & Measurement applications, they are used to make contact with test points, connecting the DUT (device under test) with the test equipment.
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Product
Threaded Battery Probes
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Easy to implement - safe solution - height adjustable - custom made
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Product
Contacting Tip Fiber-Optic Probes
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Our Fiber-optic Probes with Contacting Tips are designed to achieve a more refined intensity measurement. The intensity response of a Sensor is influenced by several factors, including brightness and size of the LED under test, the aperture of the Fiber-optic Probe that is being used to test the LED, and the distance between the LED and the Fiber-optic Probe tip.
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Product
High Impedance Probes
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Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.
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Product
ICT Probes
Merica Series-MPA75
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Minimum Center: 1.91 (75mil)Current Rating: 3amps, continuousCurrent Resistance: 40milliohmsMounting Holes Size: 1.35Full Stroke: 6.35mmRated Stroke: 4.30mmSpring Force: 198gf(7oz)
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Product
Spring Contact Probes
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FEINMETALL offers a wide range of contact probe:ICT / FCT probes, short travel probes, double plunger probes, fine pitch probes, interface probes, wire harness probes, threaded probes, high current probes, switch probes, twist proof probes, push back probes, koaxial probes, radio frequency probes.
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Product
Near Field Probes 30 MHz up to 3 GHz
RF2 set
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The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Product
Analog Laser Power Probes
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Laser power measurements should be quick and easy. They should not involve time consuming set-up and alignment problems. Ideally, the measurements should also be able to be made at any point in an optical system where losses are likely to occur. Unfortunately, most laser power meters have sacrificed ease of use to gain continuous power readings.
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Product
Probes with Pyranometers and SICRAM module
LP471PYRA… Series
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The LP471PYRA… probes consist of a pyranometer LPPYRA03, LPPYRA02 or LPPYRA10 equipped with the SICRAM module and a 5m or 10m cable for the connection of the pyranometer to the instruments HD31, DO9847, HD2102.2, HD2102.1 and HD2302.0, so to get the reading in W/m² directly on the instrument’s display.
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Product
SMD Test Probes
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The Parrot Clip, model PCM W1 or PCS-MB W1 invention can be connected to resistance’s, diodes, integrated circuits (SOIC, SO) etcThe advantage of the Parrot Clip is given by the double metal connection made between the new metal tip and the steel hooked rod, spring loaded. This connection, being made by metal parts is electrical and mechanical reliable, even if the contact point are small. Connections are resistant even at high temperatures.
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Product
Manual Systems Touch-Trigger Probes
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A range of fixed and manually adjustable heads that connect a touch-trigger probe to the machine quill, allowing flexible inspection of complex components.





























