Product

Probe Card

VC20E Lab

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Celadon

VC20E Lab - Celadon

*20 millimeter ceramic probe card*Optimized for DC parametric test, modeling and characterization, and single site WLR*Can be quickly installed using an interface tool into various interfaces and takes minimal storage space on the test floor*Effective operating temperature range from -65° to 200° C*Leakage as low as 5fA/V. If you require faster settling time, click here*Can be configured with up to 48 probes

Product

Quick Response Time Combustible Gas Leak Detector w/ Alarm

CD200

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UEi Test & Measurement Instruments

CD200 - UEi Test & Measurement Instruments

The CD200 has a long, slim gooseneck probe and a bright LED tip light to find combustible gas leaks in tight areas. Its adjustable alarm, easy one-hand operation and impact resistant storage case add up to value and convenience.

Product

Controlled Atmosphere

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KP Technology

KP Technology

KP Technology offer a range of Kelvin Probes that work in a controlled environment including automatic control of relative humidity within the Kelvin Probe housing and integrated nitrogen atmosphere control.

Product

Industrial Surface Temperature Probe

U1182A

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Keysight Technologies

U1182A - Keysight Technologies

Measure still surface temperatures within -50°C to 400°C; works with handheld clamp meters, DMMs, scopes, and calibrators.

Product

Replacement Probes And Styli For Faro Arms

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MetrologyWorks Inc.

MetrologyWorks Inc.

MetrologyWorks provides a complete product line of replacement probes, styli, and accessories for Faro Arm Portable CMMs at significant savings. OEM Replacement Faro Probe and Custom options for your Faro Arm probe. MetrologyWorks can provide substantial savings on your next Faro Arm probe.

Product

AC Current Probe 10 mV/A, 600A, 12 Hz LF Bandwidth, 30MHz HF Bandwidth, 1m cable

T3RC0600-HF

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Teledyne LeCroy

T3RC0600-HF - Teledyne LeCroy

AC Current Probe 10 mV/A, 600A, 12 Hz LF Bandwidth, 30MHz HF Bandwidth, 1m cable.

Product

Probe Card

Indexer™

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Celadon

Indexer™ - Celadon

The patented Indexer™ is the industry’s first automatic probe card changer designed for lights out parametric test.*Can support up to five VC20™’s with Advanced Cantilever™ technology, any variety*Card changes are complete in seconds*Fully programmable*Tested for hundreds of thousands of touchdowns.

Product

Strain Measurement In Holes

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Baumer Electric AG

Baumer Electric AG

Cost-effective force measurement using strain probes.

Product

Service Testers

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Bierer & Associates, Inc

Bierer & Associates, Inc

Service tester with receiver probe, laser pyrometer, alligator clip cable, 10 inch handle, manual and standard bag.

Product

DH Series PT Browser Tip, 16 GHz BW, 3.5 Vpp Range

DH-PT

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Teledyne LeCroy

DH-PT - Teledyne LeCroy

Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.

Product

Broadband Field Meter

NBM-520

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Narda Safety Test Solutions

NBM-520 - Narda Safety Test Solutions

*Intelligent probe interface detects the probe parameters*Fully automatic zero point adjustment*PC software for convenient data management

Product

Test House Services

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Microtest S.p.A.

Microtest S.p.A.

Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).

Product

Engine Performance/Endurance Test System

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Ono Sokki

Ono Sokki

Various types of test system as follows can be built up in combination with measurement control equipment and peripheral instruments (fuel flow meters, actuators, temperature control device, combustion analysis system, ECU monitor, OBD, sound and vibration measurement instruments, emission analyzer, smoke meter etc.)·Traveling fuel economy test·Gas emission test·Output performance test·Deterioration/endurance test·Combustion analysis·Sound source probing

Product

Full Wafer Test System

FOX-1P

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Aehr Test Systems

FOX-1P - Aehr Test Systems

Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.

Product

Concentric Pen Probe

807

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ACL Inc.

807 - ACL Inc.

This miniature concentric ring probe allows for small areas to be measured for surface resistance in accordance to ANSI/ESD STM11.11-2006 when connected to a resistivity meter or megohmmeter.

Product

The Nanoworkbench

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Klocke Nanotechnik

Klocke Nanotechnik

In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary.

Product

WLCSP Probe Heads

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Smiths Interconnect

Smiths Interconnect

Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.

Product

Scanner Probe

RFS set

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Langer EMV-Technik GmbH

RFS set - Langer EMV-Technik GmbH

The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.

Product

Voltage Probes

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Schwarzbeck Mess Elektronik

Schwarzbeck Mess Elektronik

In addition to EMI measurement with LISNs (Line Impedance Stabilisation Networks, Artificial Mains Networks), Probes are used for Terminal or Line voltage measurement.

Product

Vibration Analyzers

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Alta Solutions, Incorporated

Alta Solutions, Incorporated

A vibration analyzer measures and assesses the machinery condition using vibration sensors such as accelerometers, displacement probes, and velocity pickups.