Probing Stations
System to contact DUTs to drive and receive signals.
See Also: Probing, Probers, Nano Probes
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Recirculating Chillers
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Recirculating chillers from Lake Shore offer high performance for improved cooling capacity for your Hall measurement system, VSM, probe station, or electromagnet application.
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Product
Semi-Automated Probe Stations
SPS 2600, SPS 2800, and SPS 12000 Series
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The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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Product
Powerful, Fully Integrated Workstationfor Emission Microscopy
PEM-1000
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The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.
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Hot Chucks
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Materials Development Corporation
Probe stations to suit all measurement requirementswhether production, engineering or research. See individual data sheets for more details.
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Probe Card
T90™ Series
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The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
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Mini Probe Station
C-2
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The smallest probe station which still preserves the key functions and precision that are fundamental to all probing. This size is still capable of DC and RF measurements, making it the most versatile in its size.
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Probing Solutions
ES62X-CMPS
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The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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Enhanced Probe Station
EB Series
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Comprehensive prober for DC and RF. The EB series contains features to step-up your usability to acquire the accurate data you need from your devices. It has a built in probe card slot.
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Semi-Automatic Probe Station
P300A
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The P300A probe station is the most stable, intuitive, and space efficient 300mm semi-automatic analytical probe station available today. Designed for low current, sub-micron positioning applications, the P300A comes standard with features such as single-point ground, dry/dark environment, and integrated thermal chuck plumbing.
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Probe Systems
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We offer a complete line of premium performance analytical probe stations for precise device test and measurement directly on wafer.
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Custom solutions
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Novacam develops custom interferometric solutions to address particular inspection and imaging needs of specialized applications and OEM markets. Our modular interferometer components offer a superior and cost-effective platform for developing high-performance systems and assemblies. We will collaborate with your application experts to devise the optimal combination of inteferometric (OCT) hardware, non-contact fiber-based sensor probes, and system software.As needed, Novacam engineers: develop customized optical probes and inspection stations develop inline probe fixtures for production environments adapt Novacam standard interferometer component modules to suit your application help integrate Novacam systems or components with third-party tools write customized software
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Product
Vector Network Analyzer Extenders
VNAX
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VDI''s VNA Extenders deliver high performance network analyzer frequency extension into the THz range. Models cover 50 GHz to 1,100GHz with additional bands in development. VDI modules come in a variety of form factors and configurations including our original Standard-size Modules and new Mini Modules that reduce volume up to 75%. In addition to our full Transceiver (TxRx) modules, VDI also offers Transmit-Reference (TxRef) modules and Receive only (Rx) modules that deliver optimized performance for specific applications. These modules combine high test port power and exceptional dynamic range to deliver industry leading performance. They are compatible with most network analyzers and can be integrated into probe stations and antenna chambers.
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Product
CC-TLP Probe
CC-TLP-50-A1
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High Power Pulse Instruments GmbH
*Capacitively coupled TLP probearm (CC-TLP) compatible with standard probing stations*18 GHz SMA connector*Tilt angle adjustment*Calibration gauge for needle height
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Lab Assistant
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The SemiProbe Lab Assistant family of probe stations is specifically designed to address the requirements of universities and research personnel. Lab Assistant probe stations provide simplicity, ease of operation, portability, affordability and modularity. Lab Assistant probe stations can be configured for DC or HF/Microwave testing configurations, including an array of sophisticated accessories that are usually only found on much larger, more expensive probing stations.
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Line Automation Equipment
5000 Series In-line Handler
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The Circuit Check 5000 Series In-line Handler is an integrated inline solution that combines automation, fixturing and measurement hardware in addition to other in-line PCBA probe based test stations, while adding a standardized quick change fixture interface. The 5000 series in-line is a unified solution that is software and hardware agnostic, enabling adaptability to a variety of off-the-shelf lower cost ICT, flash and functional test software and hardware.
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Electrical Probe Systems
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INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
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Probe Station
EPS500
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Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided. - Maximum 6pcs of manipulators can be installed on the base unit of probe station EPS500.
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Cryogenic Probe Station
CRX-4K
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Designed for versatility and high performance, the CRX-4K is our premium cryogen-free closed-cycle refrigerant probe station. This system is the solution for those looking for the convenience of cryogen-free operation and the exceptional measurement performance of a Lake Shore product.
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Cryogenic Probe Station
TTPX
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The TTPX probe station is an affordable, entry-level probe station capable of making a wide variety of non-destructive, standard electrical device measurements. The compact tabletop design is perfect for academic and laboratory research settings. The TTPX provides efficient cryogenic temperature operation and control with a continuous refrigeration system using either liquid helium or liquid nitrogen.
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Wafer Test Solutions
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Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.
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Starter Probe Station
C Series
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Contains fundamental features to probing. C series lets you kick off your experiments and is an entry level machine designed for ease of use while allowing you to get accurate, reliable results.
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Product
Fully Manual Systems
SPS-1000, SPS-2000, and SPS-2200
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The SPS-1000, SPS-2000, and SPS-2200 systems are MicroXact’s premier manual probe stations designed to be flexible and easy to use. The high level of performance and affordability of these manual probe systems put them in a class of their own.
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Wide 9–32V Input, VESA 75×75 Mm Dock, -10~50°C Operation, And Reliable Docking For Office Use
AIM-VSD0-0470
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9 ~ 32 V wide input voltage rangeVESA (75 x 75 mm)-compliant docking stations-10 ~ 50 °C (14 ~122 °F) operating temperatureReliable docking connector for office applications
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Product
Cryogenic Probe Station
CPX-VF
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The Lake Shore CPX-VF probe station enhances the standard probe station capabilities with the addition of a ±2.5 T vertical field superconducting magnet. It can do all the standard C-V, I-V, microwave, and electro-optical probing of the CPX, plus out-of-plane vertical field superconducting magnetic measurements. Researchers can use it to perform Hall effect measurements and test magneto-transport parameters. The CPX-VF is one of Lake Shore’s premium probe stations for combining microwave measurements with magnetic field.
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High 1.73 (49.00) - 8.00 (127.00) High Performance Lead Free Probe
LFRE-1UN-8
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 0.95 (26.90) - 4.50 (128.00) Battery Probe
CP-2SB-12
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 128Full Travel (mm): 3.25Recommended Travel (mil): 118.1Recommended Travel (mm): 3.00Overall Length (mil): 472Overall Length (mm): 12.00Overall Length Remark: Overall length does not include tail.Recommended Drill Size: #53 or 1.51 mmRec. Mounting Hole Size (mil): 61Rec. Mounting Hole Size (mm): 1.55
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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Lead Free Probe
LFRE-1L-4
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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High Force Type Prbobe For PCB, K100 Series 100 Mil Pitch, Receptacle With Wire Wrap Pin
KR100-WP
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K100 Series, Pitch 100mil, Receptacle, with wire wrap pin. Brass with gold finish.
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Tip Saver for ZD Differential Probe Qty 2
PACC-ZD004
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Tip saver for ZD differential probeQty 2
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Standard 1.53 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-72J-4
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
