Transmission Electron Microscopes
image a beam electrons through a thin specimen.
See Also: Electron Microscopes
-
Product
Transmission Electron Microscope
TEM
-
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
-
Product
TEM Sampler
-
Naneos Particle Solutions gmbh
The naneos partector TEM sampler is the perfect marriage between simplicity and power: You can use it as a simple survey instrument to quickly identify nanoparticle sources in workplaces. You can also use it to sample particles directly to a standard transmission electron microscope (TEM) grid.
-
Product
Segmented STEM Detector
Opal
-
In a drive to meet our customers’ needs, El-Mul developed a detection solution for Scanning Transmission Electron Microscopes (STEM) which can support multiple applications such as DPC, cryo tomography, imaging of strain, charge, light elements or Z-contrast.
-
Product
High-end Transmission Electron Microscope
CryoARM
-
JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
-
Product
NVIDIA GPU And Intel® Xeon® AI Computing Platform For Autonomous Drive Applications
AVA-3510
Electronic Control Unit
The AVA-3510 Series is powered by an Intel® Xeon® E processor coupled with workstation-grade Intel®C246 chipset to support up to 64 GB ECC DDR4 memory. The system incorporates one 2.5" SSD 256G for easy installation as optional accessories for fast read/write performance.
-
Product
Electron Microscope Analyzer
QUANTAX EBSD
-
QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
-
Product
Electron Microscope Analyzer
QUANTAX WDS
-
The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
-
Product
Electron Microscope Analyzer
QUANTAX FlatQUAD
-
QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
-
Product
Scanning Electron Microscope
SEM
-
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
-
Product
Electron Microscope Analyzers
-
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
-
Product
Scanning Electron Microscopes
SEM
-
Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
-
Product
Electron Microscope Sample Preparation
-
Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
-
Product
Radio Transmission
ARF868 MR
-
Increase the range of radio transmission, for broadcast over long distances.
-
Product
Microscope
-
Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
-
Product
Scanning Electron Microscope
Verios G4 XHR SEM
-
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
-
Product
Electronics
-
The analog electronics enable the linearization of the SQUID characteristics through negative feedback to the SQUID.
-
Product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
-
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
-
Product
Microscope Software
-
Choosing the right software for your Vision Engineering microscope is just as important choosing the hardware. Whatever you need and however you like to work, you’ll find the right application software here.
-
Product
Scanning Electron Microscope
JSM-IT510
-
Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
-
Product
Electronics
-
Weidmüller Interface GmbH & Co. KG
Electronics lie at the heart of your automation technology. We give you solutions with intelligence.
-
Product
Transmission Line/Cable Testing
-
HAOMAI Electric Test Equipment Co., Ltd.
Transmission Line/Cable Testing products by Haomai
-
Product
Electronic
-
Our electronic switches offer single or dual setpoints, adjustable time delays, external setpoint adjustments and more.
-
Product
Transmission & Synchronization Tester
xGenius
-
xGenius is a nice handheld tester equipped with a large (8 inc) capacitive touch-screen to make easier the analysis and results interpretation. It is 100% suitable for labs or field use because is full equipped (IP/Ethernet/PTP/T1/E1), battery operated, light (1.9kg) and very rugged. The unit is able to test Ethernet/IP networks up to 10Gb/s while supporting master/slave Sync-E/PTP emulation and also has interfaces for T1/E1.
-
Product
Optical signal transmission
Digital
-
The fibre optic cable are used to transmit digital signals from the device under test under EFT/burst interference.
-
Product
Digital Microscopes
-
Digital microscopes are microscopes without eyepieces. A digital camera acts as a detector. Images are displayed on a screen or monitor, turning the microscopy workstation into an ergonomic digital workplace.
-
Product
Inspection Microscope
-
This compact, lightweight and ergonomic Inspection Microscope is specifically designed for inspecting ferrule and fibre end faces in the field or the laboratory. The microscope provides dual-illumination, both coaxial and oblique; to produce the highest-quality image detail and superior view of fibre end face cleanliness and core condition.
-
Product
Electron Microscope Analyzer
QUANTAX EDS for SEM
-
Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
-
Product
Transmission Hazemeter
Novo-Haze TX
-
The Novo-Haze TX Transmission Hazemeter offers fast and accurate measurement of the optical quality of plastic films and other transparent materials. This instrument measures total transmission and haze according to ASTM D1003 (CIE C), the most important standard used in most QA applications.
-
Product
Digital Microscope
VHX-6000 Series
-
Next-generation optical microscope with a large depth-of-field and advanced measurement capabilities for inspection and failure analysis.
-
Product
Transmission Protection
-
Schweitzer Engineering Laboratories, Inc.
SEL transmission protection solutions provide complete primary and backup protection from all types of faults. Using these devices helps you avoid expensive equipment damage and failure while maintaining system performance and increasing availability.
