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Transmission Electron Microscopes
image a beam electrons through a thin specimen.
See Also: Electron Microscopes
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Transmission Electron Microscope
TEM
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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TEM Sampler
Naneos Particle Solutions gmbh
The naneos partector TEM sampler is the perfect marriage between simplicity and power: You can use it as a simple survey instrument to quickly identify nanoparticle sources in workplaces. You can also use it to sample particles directly to a standard transmission electron microscope (TEM) grid.
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Segmented STEM Detector
Opal
In a drive to meet our customers’ needs, El-Mul developed a detection solution for Scanning Transmission Electron Microscopes (STEM) which can support multiple applications such as DPC, cryo tomography, imaging of strain, charge, light elements or Z-contrast.
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High-end Transmission Electron Microscope
CryoARM
JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in Columbus, OH and EMC 2016 in Lyon, France. The CryoARM is a dedicated cryo-TEM, based on the highly successful JEOL ARM (Atomic Resolution Microscope) series, an ultrahigh performance, highly stable platform considered to be the "best-in-class" TEMs. The development of the CryoARM was accomplished in collaboration with leading Life Science researchers.
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NVIDIA GPU And Intel® Xeon® AI Computing Platform For Autonomous Drive Applications
AVA-3510
The AVA-3510 Series is powered by an Intel® Xeon® E processor coupled with workstation-grade Intel®C246 chipset to support up to 64 GB ECC DDR4 memory. The system incorporates one 2.5" SSD 256G for easy installation as optional accessories for fast read/write performance.
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Electron Microscope Analyzer
QUANTAX WDS
The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
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Integrated AI-ADAS ECU And Cameras For Large Commercial Vehicle
ADM-TJ30
The integrated AI-ADAS ECU is connected to 8 cameras and powered by the vision-AI algorithm. It can detect and classify different kinds of vehicles/ pedestrians/ two-wheeler riders/ lane marking and other objects to perform multiple ADAS functions.
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Scanning Electron Microscope
JSM-IT510
Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Electron Microscope Analyzer
QUANTAX Micro-XRF
Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Microscope
Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Microscopes
Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Microscope Platforms
Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38 mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30 mm diameter coupling to the I.D. of the C60-TUBE, or with a 50 mm coupling on the O.D. of the lens tube.
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Electron Microscope Analyzers
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Electronics
Electromagnetic, Signal Integrity, Thermal and Electro-Mechanical Simulation Solutions. The use of Ansys Electronics solution suite minimizes the testing costs, ensures regulatory compliance, improves reliability and drastically reduces your product development time. All this while helping you build the best-in-class and cutting-edge products. Leverage the simulation capability from Ansys to solve the most critical aspects of your designs
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Transmission Control
Schweitzer Engineering Laboratories, Inc.
Transmission control systems provide flexible local control and SCADA integration for substation and line protection assets, improving your system’s reliability and efficiency.
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Electron Microscope Analyzer
QUANTAX EDS for TEM
Long standing expertise in EDS ensures the configuration of the best solution for your specific microscope (STEM, TEM or SEM) thanks to slim-line detector design and geometrical optimization for each microscope pole piece and EDS flange type
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Widefield Microscopes
Widefield microscopes are available in different versions. Choose an upright microscope if your task is to analyze zebrafish embryos, stained tissue selections or brain slices. For tissue culture and quick assessments in routine research, the inverted microscope might be the better choice.
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Raman Microscopes
Edinburgh Instruments has been providing high performance instrumentation in the Molecular Spectroscopy market for almost 50 years. Our Raman microscopes continue our commitment to offering the highest quality and sensitivity instruments. For further information on our Raman Microscopes, simply contact our sales team, sales@edinst.com, who will be delighted to help.
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Fiber-Optic Transmission
Fiber optic transmission systems all use data links that work similar to the diagram shown above. Each fiber link consists of a transmitter on one end of a fiber and a receiver on the other end. Most systems operate by transmitting in one direction on one fiber and in the reverse direction on another fiber for full duplex operation. It's possible to transmit both directions on one fiber but it requires couplers to do so and fiber is less expensive than couplers. A FTTH passive optical network (PON) is one of the only systems using bidirectional transmission over a single fiber because its network architecture is based around couplers already.
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Transmission Line/Cable Testing
HAOMAI Electric Test Equipment Co., Ltd.
Transmission Line/Cable Testing products by Haomai
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Stereo Microscopes
From affordable, high quality, stereo zoom microscopes for exceptional value and performance, though to powerful, high resolution stereo microscopes capable of 320x magnification – all supported with a range of productivity options – there’s a solution in our range of stereo microscopes for every application.
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Scanning Electron Microscope
E5620
The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Electron Microscope Analyzers
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Optical signal transmission
Bus systems
Allows for the transmission of high speed CAN signals via optical fibre cables during EMC tests or when there are great potential differences (high voltage).
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Microscopes
Probing Solutions offers Microscopes made by Azoom, Excelitas, Meiji, Leica, Mitutoyo, and Motic. To order Microscopes, please call PSI at (775) 246-0999, or email sales@probingsolutions.com for a quote.
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Atomic Force Microscope
Flex-Mount
Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
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Scanning Probe Microscopes
SpectraView 2500
* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
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Electronic Crockmeter
TF411
TESTEX Testing Equipment Systems Ltd.
Electronic Crockmeter, to determine the colour fastness of textiles to dry or wet rubbing. A pinned acrylic sample holder ensures rapid sample mounting and repeatability of results. Crockmeter Fitted with a pre-determined electronic counter for strokes up to 999,999 times.
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Scanning Probe Microscope
SPM-9700HT
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
