Test Pattern Generators
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Standard 0.39 (11.00) - 1.39 (39.00) Replaceable General Purpose Probe
MEP-30U
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 30Test Center (mm): 0.76Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 690Overall Length (mm): 17.53
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Standard 0.79 (23.40) - 1.75 (49.60) General Purpose Probe
HPA-40G
Current Rating (Amps): 2Average Probe Resistance (mOhm): 35Test Center (mil): 39Test Center (mm): 1.00Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 660Overall Length (mm): 16.76
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40GHz Dual Channel MW Signal Generator 19" 1U Rack
LSX4092R
The LSX4092R is a 40GHz Dual Channel Microwave Signal Generator, offers industry leading performance, in a 1U, 19” rack-mounted box. It features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The design offers excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Batterie Inspektor
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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92 GSa/s Arbitrary Waveform Generator
M8196A
New Arbitrary Waveform Generator with the highest combination of speed, bandwidth and channel density.92 GSa/s sample rate supporting signals up to 64 GBaud on 4 channels in a 1-slot AXIe module - simultaneously.
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Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74A
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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PCI-5412, 100 MS/s, 14-Bit Waveform Generator Device
779177-02
The PCI‑5412 can generate user-defined, arbitrary waveforms and standard functions, including sine, square, triangle, and ramp. This arbitrary waveform generator can generate signals from -6 V to +6 V and uses direct digital synthesis (DDS) to precisely generate waveforms.
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30MHZ, 150 MS/s,16 kpts, 2 Channel, 20 Vpp Function/Arbitrary Waveform Generator
T3AFG30
Teledyne Test Tools T3AFG5 and T3AFG10 series Function/Arbitrary Waveform Generators are a new family of low cost, high performance, single channel Function / Arbitrary waveform generators offering a high level of functionality and an excellent specification at a very competitive price point.
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Standard 2.20 (62.00) - 4.80 (136.00) General Purpose Probe
EPA-4G
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Ethernet/LXI generatorNETBOX 16 Bit Arbitrary Waveform Generator - up to 40 MS/s on 8 Channels
DN2.654-08
The generatorNETBOX DN2.65x arbitrary waveform generators (AWG) is a general purpose multi-channel AWG with outstanding dynamic performance. The series includes LXI units with either four, eight or 16 synchronous channels. The large onboard memory can be segmented to replay different waveform sequences.
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Alternate 2.82 (80.00) - 5.00 (141.00) General Purpose Probe
HPA-74C-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Standard 1.50 (42.00) - 3.30 (94.00) General Purpose Probe
P2663G-1C1S
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2G30-2
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Active Probe, 1 GHz
N2795A
The N2795A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±8 V), the probe can be used in a wide variety of applications.
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
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PCIe 16 Bit Arbitrary Waveform Generator - up to 40 MS/s on 4 Channels
M2P.6536-X4
The M2p.65xx series offers different versions of arbitrary waveform generators for PCI Express with a maximum output rate of 125 MS/s. These boards allow to generate freely definable waveforms on several channels synchronously. With one of the synchronization options the setup of synchronous multi channel systems is possible as well as the combination of arbitrary waveform generator with digitizers of the M2p product family. The 512 MSample on-board memory can be used as arbitrary waveform storage or as a FIFO buffer continuously stream data via the PCIe interface. Importantly, the high-resolution 16-bit DACs deliver four times the resolution than AWGs using older 14-bit technology.
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Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3A-1
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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HD Arbitrary Waveform Generator,8 Ch,350 MHz,16 bit,128Mpts/Ch,6 Vpp output,AFG/AWG, Wave Sequencing
T3AWG3358
HD Arbitrary Waveform Generator,8 Ch,350 MHz,16 bit,128Mpts/Ch,6 Vpp output,AFG/AWG, Wave Sequencing.
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Video Pattern Signal Generator
Model A223800/01/02/03/04
Support 8K Super Hi-Vision (7680x4320/8192x4320)Independent graphics core for 8K Super Hi-Vision pattern with less than 200 msec. switch timeUp to 4 signal modules per unitUp to 4 resolution and pattern outputs.7 inch 1024x 600 high-resolution touch panel, GUI interfaceBMP file format supportUSB 3.0 data accessGigabit Ethernet high-speed network interfaceHDMI 2.0a signal module (Optional) - 8K x 4K 60 Hz (4 HDMI port) - 4K x 2K 60 Hz (1 HDMI port) - Pixel rate up to 600MHz (6Gbps TMDS rate) - RGB 4:4:4 / YCbCr 4:4:4 or 4:2:2 or 4:2:0 - HDCP 2.2 / 1.4 - Wide color gamut (ITU-R BT.2020/DCI-P3) - HDR (High Dynamic Range) Testing (HDR infoframe & metadata / EOTF) - SCDC (status & control data channel) Reader
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P2664 General Purpose Probes
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 10Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 114Full Travel (mm): 2.90Recommended Travel (mil): 84Recommended Travel (mm): 2.13Overall Length (mil): 895Overall Length (mm): 22.73Overall Length Remark: Tip 1C: 845 mil (21.46 mm) Tip 2R: 935 mil (23.75 mm)
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HD Arbitrary Waveform Generator,8 Ch,250 MHz,16 bit,128Mpts/Ch,6 Vpp output,AFG/AWG, Wave Sequencing
T3AWG3258
HD Arbitrary Waveform Generator,8 Ch,250 MHz,16 bit,128Mpts/Ch,6 Vpp output,AFG/AWG, Wave Sequencing.
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19inch 43U Heavy Duty Test Platform
6TL28
The 6TL28 is a bare rack for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 43U (640mm depth).
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Ultra High 6.70 (190.00) - 11.80 (335.00) General Purpose Probe
EPA-4F-2
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Standard 6.13 (174.00) - 16.00 (456.00) General Purpose Probe
EPA-5E
Current Rating (Amps): 8Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,420Overall Length (mm): 36.07
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120 GSa/s Arbitrary Waveform Generator
M8194A
120 GSa/s sample rate supporting signals up to 64 GBaud on 4 channels in a 1-slot AXIe module - simultaneously.
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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High 4.00 (113.00) - 6.70 (190.00) General Purpose Probe
P2550-8-8
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
