Geometry
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Product
Linear Strain Gauges
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Linear Pattern Strain Gages are the most straightforward geometry of strain gauge, designed to indicate strain in only a single direction.
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Product
Integrating Sphere with Side Assistant Opening
IS-*MA**P/IS-*MA**C
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According to IES LM-79 Clause 9.1.2, it request the 4π geometry configuration and 2π geometry Integrating Sphere for the LED Testing. Lisun Group developed the integrating sphere with side assistant Opening in A Molding Technology to meet the requirements.• Painting material of integrating spheres is according to CIE Pub.No.84 (1989) • The painting material is BaSO4 coating: ρ (λ) ≥0.96 (450nm~800nm) and ρ (λ) ≥0.92 (380nm~450nm) • Fine diffuse reflection: Reflectance ρ≈0.8 and accuracy of ρ (λ) <1.5% • Build-in all functional lamp testing jigs: the vertical is for E40/E27, the horizontal is for T5/T8/T12 tubes and the Testing Holder Base for LED street luminiares. All of the testing jigs can allow the lamp be tested up and down in the sphere. • Power Cable, Power Terminal and Auxiliary lamp position has been built-in (Auxiliary lamp is option). • Two photo detector ports, one optical fiber port and temperature sensor hole are built-in • Ordering Code: IS-1.5MA55P or IS-1.5MA55C (Φ1.5m, IS-1.5MA55P means square side opening is 0.5×0.5m, IS-1.5MA55C means cycle side opening diameter is 0.5m). IS-1.75MA66P or IS-1.75M66C (Φ1.75m and side opening is 0.6m). IS-2.0MA77P or IS-2.0MA77C (Φ2.0m and side opening is 0.7m). • Other size such as diameter 2.5m, 3.0m can be special order according to customer’s request
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Product
Fracture Mechanics Clip-On Gages
Model 3541
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Jinan Testing Equipment IE Corporation
The Model 3541 is designed for determination of fracture mechanics parameters such as JIC, KIC, R-curve, fatigue crack growth rate (da/dN), and testing to standards such as E1820, E399, E647, etc. These COD gages conform to the requirements of E1820 (the replacement for E813 and E1737) for JIC and R-curve determination. Special configurations are available to meet the requirements of ASTM E399 for fracture toughness (please consult the factory for these configurations). In addition, the modified groove design complies with E1820 tests where greater stability and accuracy results from the sharper groove root. Clip-on gages are used for a variety of fracture mechanics tests, including compact tension, arc shaped, disk shaped, bend specimens or other specimen geometries in compliance with ASTM and other standards organization’s test methods. Clip-on gages can be used directly on test specimens where the knife edges are integral with the test specimen or, alternately, with optional bolt-on knife edges mounted on the test specimen.The Model 3541 extensometers are strain gaged devices, making them compatible with any electronics designed for strain gaged transducers. Most often they are connected to a test machine controller. The signal conditioning electronics for the extensometer is typically included with the test machine controller or may often be added. In this case the extensometer is shipped with the proper connector and wiring to plug directly into the electronics. For systems lacking the required electronics, Epsilon can provide a variety of solutions, allowing the extensometer output to be connected to data acquisition boards, chart recorders or other equipment.
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Product
High Current Probes
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*Low internal resistance to minimize arching*PogoPlus bias ball design*High current optimized base material and plating*Higher temperature spring design*Specialized high current tip geometry
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Product
Low Temperature Operating Life (LTOL) Test
LTOL
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LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
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Product
Refractive Index Profiler
S14
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The S14 Refractive Index Profiler complements optical fiber preform analysis measurements by providing highly accurate and precise characterization of the refractive index profile of drawn single-mode, multimode, and specialty fibers using the RNF (Refracted Near Field) technique. The S14 index profile data produces fiber geometry information directly. Manufacturers can also use S14 data for the prediction of fiber transmission parameters such as mode field diameter, cut-off wavelength, and chromatic dispersion.
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Product
Substrate Manufacturing
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KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Product
Polaris Tools And Accessories
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The Polaris® optical measurement solution is designed with accuracy, reliability, and versatility in mind. Versatility is delivered in part by NDI software packages and developer tools that are available to enhance OEM application development and system customization. The Polaris solution consists of an optical tracker and navigation markers, the latter of which must be attached to a rigid body; i.e. a tool that is rigid in form to prevent unwanted marker movement. The Polaris solution requires three or more markers to be attached to the rigid body tool, the geometry (configuration) of which is unique to each tool.
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Product
Optical CMM Systems
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Our OmniLux metrology system is highly versatile and provides unparalleled levels of 3D CMM capture for component measurement in seconds. This high precision non contact, metrology system is extremely versatile because it measures components of any geometry and of any material. Geometries possible include: spheres, asphere, cylinder, internal bore, cone/taper, step height or freeform in any material such as polished or rough metals or ceramics and polymers. The Omnilux is fast and accurate because, unlike direct contact sensors, the use of optical sensors means that the whole surface can be analysed while the object is suspended in space, ensuring that no damage comes to delicate surfaces. Our easy-to-use software interface, developed from years of experience enables the operator to effortlessly control the system. Rich data analysis, automation and export of results for the immediate generation of reports as well as a compact footprint means OmniLux is the leading solution for production or R&D environments where reducing cycle times is critical to sustainable success.
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Product
Photoelectric Sensors
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Angle sensors from Balluff are a logical development of Balluff's fork sensors for more demanding applications. Their custom housing design and beam geometry enable approach and recognition of objects from almost every direction. Installation is very simple, even with space constraints: the transmitter and receiver are firmly aligned with each other.
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Product
Companion Tool to VS for Test Time & Pin reduction
UltraScan
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UltraScan is SynTest's solution to combat increase in test time. In 130 nm or smaller ? nanometer geometries, many defects become delay defects and it becomes necessary to use delay tests to detect the transition faults and path delay faults. Often bridging tests are also required.
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Product
3D/2.5D Time-Domain Electromagnetic Field Solver Software
EM-CORE ®
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3D/2.5D Time-Domain Electromagnetic Field Solver Software for Planar-Circuit and Antenna Simulation. 3D & 2D Radiation Patterns Modeling, Spiral Inductors Modeling, 3D EM Modeling of Filters, Intuitive Geometry Build, and more!
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Product
Semiconductor Equipment Manufacturers
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Integrated Dynamics Engineering
With shrinking process geometries, new structural elements and a major increase in substrate size, the challenges to improving process yield and overall throughput have increased exponentially. These demands drive a stringent requirement for system stability and overall immunity from internal and external forces.
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Product
SANA 2 Interferometer
CA3004
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SANA 2 fiber endface interferometer is a type of cost-efficient non-contact test instrument with excellent performance. It is able to measure the fiber endface geometry parameters such as radius of curvature, apex offset, fbre height and polishing angle of APC connector.
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Product
Drawing Die And Wire Measurement
DGMS – Die Geometry Measuring System
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Optik Elektronik Gerätetechnik GmbH
Measuring system for diameter, roundness, reduction angle and bearing length of wire drawing dies.
