X-ray
Electromagnetic Spectrum whose radiation wavelength is 1 nm - 1pm and frequency (Hz) ranges between 10 to the 17th and 10 to the 20th power.
See Also: X-ray Systems
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Surface Contamination Monitors
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Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
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High-power Benchtop Sequential WDXRF Spectrometer
Supermini200
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Elemental analysis of solids, liquids, powders, alloys and thin films. The new Supermini200 has improved software capabilities as well as a better footprint. As the world''s only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of oxygen (O) through uranium (U) of almost any material, the Rigaku Supermini200 uniquely delivers low cost-of-ownership (COO) with high resolution and lower limits-of-detection (LLD)..
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Digital Radiography Software
SHERLOCK NDT
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Sherlock NDT is the perfect link between Teledyne ICM best in class portable X-ray generator, the CPSERIES, and our high-resolution digital radiography detectors, the Go-Scan SERIES. Developed by and with NDT DR specialists, this intuitive and user-friendly touchscreen software produces high-quality images, allows real-time (video) acquisition, and comes with many different enhancement features.
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Digital Cabinet X-ray System
XPERT 80
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Kubtec's XPERT 80 brings high quality imaging and ease of use to science and research. The XPERT 80's compact self-contained cabinet, with a high resolution x-ray source, provides the sharpest images for every application. Optional sources are also available for micro-focus and soft x-ray applications.
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Dosimeter-Radiometer
MKS-05 Terra
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Measurement of gamma and X-ray radiation ambient dose equivalent rate.Measurement of gamma and X-ray radiation ambient dose equivalent.Measurement of surface beta-particles flux density.Measurement of dose equivalent accumulation time.Real time measurement (clock).
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Fat Analysis
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Unlike standard x-ray systems which use a single x-ray energy spectrum to scan products, DEXA technology uses two energy spectrums to discriminate between high and low energy x-rays. A patented software algorithm uses the differential x-ray energy absorbance of these two energies by the meat to determine the fat content.
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Spectrometers-XRF
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For X-ray fluorescence spectrometers for elemental analysis or trace element analysis, SPECTRO is a world leader
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Si Detectors & Spectrometers
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Baltic Scientific Instruments, Ltd
X-ray spectrometers based on Si detectors with liquid nitrogen cooling, Peltier and electric machine cooling. The spectrometers are applied in the various systems for element analysis: X-ray fluorescent; electron probe; with alpha and beta excitation etc, as well as for the precision diffractometry in the devices of structural and phase analysis.
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General Purpose Benchtop XRD System for Phase I.D. and Phase Quantification
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In a move to bring lab-quality performance to the manufacturing floor, Rigaku introduces the MiniFlex XpC, a manufacturing-optimized powder diffractometer for fast and accurate quality control measurements. It is extremely easy to operate using Rigaku’s new EasyX quality control software, which requires minimal clicks to run. A minimal interface means there will be no accidental error variance from operator to operator. The MiniFlex XpC can be configured with a conveyor belt or robot for automated sample processing and collaboration with other instruments. With an 800 W X-ray source and a short-diameter goniometer, the system has the performance of a lab unit, and thus can greatly improve throughput for quality control measurements.
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Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
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SAXS
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Anton Paar’s precise and reliable solutions for SAXS/WAXS/GISAXS/RheoSAXS studies provide excellent resolution and the best possible data quality for your daily research of nanostructured materials. The robust systems employ brilliant X-rays as well as scatterless beam collimation and are equipped with a wide range of sample stages to cover many different applications.
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Automation Solutions
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We have customized (partially) automated measuring solutions that can be fully integrated seamlessly across all levels of your plant – from cleanroom-compatible measuring systems for automated production to robot-assisted probes in thickness measurement. Whether X-ray, terahertz or electromagnetic, random sampling or 100 % inspection: We offer measurement technology that allows you to inspect surfaces quickly and under constant conditions, save time and costs and ensure the quality of your production.
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Personal Alarm
ND-20
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Rugged Die Cast Aluminum Belt Worn Personal Alarm, Dual Range for Beta, Gamma and X-Ray
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Electron Multiplication (EM) Standard Image Sensors
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EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Aviation Security
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Aviation is highly regulated, from ICAO Annex 17 to National Security Programs. Due to its high profile and the subsequent multitude of threats, regulation safeguards travel security. Our expertise will support your business, by supplying market leading X-Ray and Metal detection products along with maintenance, that meet the regulator requirements and best fit your business.
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XRD Diffractometers
Empyrean Range
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With the Empyrean, Malvern Panalytical has set the new standard in developing the ultimate X-ray platform for the analysis of powders, thin films, nanomaterials and solid objects.
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XRF
L Series
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The L Series is the most versatile instrument that Bowman offers. It combines all of the features of the P Series with a larger sample chamber and greater X-Y stage travel. For samples larger than ~12 inches (300 mm) in any direction, the L Series is a must-have. The large sample stage and travel allows for both large parts, or large sample fixtures holding multiple parts, to be measured. The chamber is fully enclosed and boasts a capacity to hold samples up to 22″ (550mm) x 24″ (600mm) x 13″ (330mm) (LxWxH). The X-Y stage travel distance is 10″x10″ (254mm x 254mm). The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera allowing for measurement in recessed areas. As with other models, the collimator sizes and focal distances are customizable for different customer applications. The programmable X-Y stage is included, but can be removed to allow for the maximum sample height capacity (10″ (254mm) z-height with stage, 13″ (300mm) without). The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.
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Nuclear Magnetic Resonance Spectrometer
NMR
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NMR is an abbreviation for Nuclear Magnetic Resonance. An NMR instrument allows the molecular structure of a material to be analyzed by observing and measuring the interaction of nuclear spins when placed in a powerful magnetic field.For the analysis of molecular structure at the atomic level, electron microscopes and X-ray diffraction instruments can also be used, but the advantages of NMR are that sample measurements are non-destructive and there is less sample preparation required.Fields of application include bio, foods, and chemistry, as well as new fields such as battery films and organic EL, which are improving and developing at remarkable speed. NMR has become an indispensable analysis tool in cutting-edge science and technology fields.
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Aurora XS
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Almost everything is extra small in the Aurora XS, except innovativeness and reliability. With its smart features, it enables rapid time-to-market of cost-effective urban security X-rays. Make a big impact with the Aurora XS.
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Beam Directional Power Supply Mains
SiteX CP200D
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Being just 20 mm longer than the CP160D, the CP200D represents the best compromise between high penetration (up to 42 mm for steel) and the capacity of the generator to fit with various NDT applications, such as inspections of more technical materials in the aeronautical or space industries. The CP200D is one of the most versatile generators on the market and thanks to its built-in multiple X-Ray output carrousel it will adapt to a very wide variety of NDT applications, without compromising in any manner its light weight (12 kg) and ease of use.
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Microprocessors
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CAES specializes in digital hardware design for commercial and aerospace applications. Our processing solutions are ideal for spacecraft on-board computers, payload processing, nuclear power plant controllers, critical transportation systems, high-altitude avionics, medical electronics and X-ray cargo scanning.
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Diamond-like Carbon (DLC) Foils
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An intense laser beam is used to evaporate carbon from a graphitic sputter target. In the process, the graphite structure of the source material is converted into nano-particles, which deposit on prepared substrates as diamond-like carbon. The properties of these unique carbon foils make them useful in a variety of applications, in particular beam stripping, as backings for accelerator targets or x-ray attenuators.
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X-Ray Beam Monitors
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When standard products just aren’t good enough—or the measurement technology does not yet exist—Sydor Technologies develops technology to enable these complex imaging measurements. Just as we’ve developed next-generation streak cameras and x-ray detectors to meet novel, emerging requirements in national laboratories, we’re doing the same with x-ray beam monitors.
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X-ray Inspection System
RTX-113HV
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Precision X-ray Inspection for BGAs, QFNs, LEDs, sensors, medical devices, and other packaged devices.
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Counterfeit Analysis / Screening Services
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DPACI perform counterfeit part analysis on all types of electrical, electronic, and electromechanical (EEE) components. Our suspect counterfeit analysis task groups include source identification, manufacturer validation, external visual inspection, mechanical inspection, electrical test, X-Ray, in-depth internal visual and materials analysis. With one of the largest databases of test reports for EEE components, we can offer similar historical data for correlation with images, test data, certifications and reports.
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Inspection System for Die Casting
X-eye 7000BS
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Appropriate for medium•large size component inspection and detecting surface structure and defects(inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's reduced significantly and enables long-term use with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Nuclear Radiation Detector
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Henan Bosean Electronic CO.,Ltd.
A small and medium-high range radiation dose alarm instrument, with the main function of monitoring X-ray, γ-ray and β-ray. We provide nuclear radiation detector OEM/ODM service.
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Scanning XPS/HAXPES Microprobe
PHI Quantes
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The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
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Analytical Services
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Surface Analysis; X-Ray Photoelectron Spectroscopy (XPS, ESCA), Auger Electron Spectroscopy (AES), Time-of-Flight Secondary Ion Mass Spectrometry (Static) (TOF-SIMS), Dynamic Secondary Ion Mass Spectrometry (D-SIMS). Microscopy & Diffraction; Organic Material Analysis; Bulk Chemistry.
