Deep Ultraviolet
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Product
Deep Ultraviolet Spectrophotometer System
VUVAS-10X
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A new ultraviolet spectrophotometer system for optical metrology just arrived at NASA Goddard! The VUVAS-10X spectrophotometer works best in the 90 to 160 nanometer wavelength range, also known as deep or vacuum ultraviolet (VUV) region. It uses a windowless hydrogen plasma light source and differential pump section to reach many wavelengths beyond those of conventional deuterium lamps. The source also works with other gases, or gas mixtures, for atomic spectral line emission from about 30 nanometers (double ionized Helium gas) up to the Visible light range. The new spectrophotometer system, McPherson VUVAS-10X, uses a one-meter focal length high-resolution monochromator with the special light source, scintillated detector and Model 121 goniometric sample chamber. The system is ideal for optical transmission, absorbance and specular reflectance at incident angles up to 60 degrees. This McPherson spectrophotometer system will help develop, inspect and qualify optical materials and coatings used for very high altitude and extraterrestrial space flight missions.
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Product
Ultra-High Vacuum Ф4 Scanning Kelvin Probe
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The Ф4 Ultra-high Vacuum Scanning Kelvin Probe system gives the user full access to work function measurements under vacuum with the ability to alter the temperature from 77 K to 860 K. The Kelvin Probe measurement has resolution of 1 - 3 meV for a 2 mm tip on a conducting sample. The sample is mounted on a plate that is located on a motorized (x, y, z) translator attached to a stainless-steel vacuum chamber. Phi 4 also comes with a photoemission spectroscopy system with a tuneable source (3.4 - 7.0 eV). The deep ultra-violet (DUV) light spot measures approximately 3 x 4 mm. Absolute work function measurements can be obtained with this system in the range of 4.0 - 6.5 eV with an accuracy of 0.05 - 0.1 eV.
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Product
DUV Lithography Systems
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ASML's deep ultraviolet (DUV) lithography systems dive deep into the UV spectrum to print the tiny features that form the basis of the microchip.
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Product
EUV Lithography
NXE systems
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NXE lithography systems are used in high-volume manufacturing of advanced Logic and Memory chips. The first systems to use ASML’s novel 13.5 nm EUV light source, they print microchip features with a resolution of 13 nm, which is unreachable with deep ultraviolet (DUV) lithography. Chipmakers use our NXE systems to print the highly complex foundation layers of their 7 nm, 5 nm and 3 nm nodes. Read about how EUV lithography went from imagination to reality.
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Product
Deep Ultraviolet Observation System for Microscope
U-UVF248
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Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
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Product
Ambient Pressure Photoemission Spectroscopy With Nitrogen Environment
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The APS04-N2-RH incorporates a tuneable deep ultra-violet (UV) source outputting 3.4 - 7.0 eV, for absolute work function and highest occupied molecular orbital (HOMO) measurements, a surface photovoltage spectroscopy (SPS) module outputting 400 - 1000 nm for Voc and Eg measurements, together with a 50 x 50 mm scanning area for planar relative work function measurements (Fermi level).
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Product
Ultraviolet Checker
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For magnetic particle testing. Intensity of ultraviolet can be read directly in mw/c directly.
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Product
Deep Learning Accelerators
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ADLINK’s Deep Learning Accelerators provide GPU- and VPU-accelerated inferencing with embedded, small, and standard form factors. ADLINK’s Deep Learning Accelerators offer high performance, power efficiency and longevity support required of AI applications at the edge, delivering actionable insights at the right place at the right time for industrial automation, transportation, smart city, military and aerospace applications and more.
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Product
On-Camera Deep Learning
Firefly DL
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Deep learning is a powerful tool for system designers to quickly automate complex and subjective decision making and deliver higher quality products and improved productivity. Deploy your trained neural network to the FLIR Firefly DL with Neuro technology and reduce system cost and complexity by making decisions on-camera without host PC. With its very small size, low weight and power consumption, the Firefly DL camera is ideal for embedding into mobile, desktop, and handheld systems.
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Product
Deep Learning Bundle
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Set of Deep Learning inspection libraries optimized for machine vision applicationsPerforms image classification, supervised or unsupervised segmentation and object localizationIncludes EasyClassify, EasySegment and EasyLocateSimple APIIncludes the free Deep Learning Studio application for dataset creation, training and evaluationSupports data augmentation and masksCompatible with CPU and GPU processing
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Product
Ultraviolet Meter
UVR Series
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UVR series is suitable to manage lamp of ultraviolet curing equipment, Also suitable to measure intensity of ultraviolet ray for sun light and lamp.
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Product
Rack Extender Kit, 9025TR, 1.5" Deep
310113494
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The Rack Mount Extender Block Kit is used for mounting to racks with recessed mounting rails recessed more than 1.” It is made of aluminum with a black anodized finish. NOTE: Used only with slide mounted 9025TR Receivers.
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Product
Multibeam Echosounder - Deep Water
HydroSweep MD/30
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The HydroSweep MD/30 is a deep water multibeam echosounder ideally suited for seabed mapping in medium and deep waters down to 7,000 m water depth. The HydroSweep MD/30 utilizes operating frequencies between 24 and 30 kHz to map the acquire bathytric depth information as well as sidescan and backscatter data.
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Product
Deep Observability For Critical Edge Software
DevAlert
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Get cloud-based observability on anomalies in edge devices and embedded software. Detect and analyse issues remotely, during testing and in deployed devices. Use your familiar desktop tools for secure remote debugging.
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Product
Multibeam Echosounder - Deep Water
HydroSweep MD/50
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The HydroSweep MD/50 is a high resolution multibeam echosounder ideally suited for seabed mapping in mid and shallow water based on a sonar frequency range between 52 kHz to 62 kHz. Beside bathymetric depth information from 5 m to more than 2000 m, sidescan data and backscatter data for seabed classification can be acquired.
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Product
Image Processing and Analysis Software Deep Learning Module
ENVI® Deep Learning
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L3Harris Geospatial Solutions, Inc
L3Harris Geospatial has developed commercial off-the-shelf deep learning technology that is specifically designed to work with remotely sensed imagery to solve geospatial problems. The ENVI Deep Learning module removes the barriers to performing deep learning with geospatial data and is currently being used to solve problems in agriculture, utilities, transportation, defense and other industries.
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Product
GO-SPEX200 Ultraviolet Space Radiation Distribution Measurement System
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Hangzhou Everfine Photo-E-Info Co., LTD
GO-SPEX200 adopts the special darkroom-integrated design, integratesl electric, radiation, temperature controller, it specialized for UV LED package (including integrated packaging) of the total radiation flux, spatial distribution of radiation intensity (light distribution performance), radiation intensity data, angle, total radiation flux accurate testing, comply with relevant standards.
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Product
Open eVision Deep Learning Studio
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Ease the evaluation of Open eVision’s Deep Learning toolsDataset creation and image annotation for classification, segmentation, and object localizationCreate and configure dataset splits to decide how your images are usedManage the data augmentation transformationsTrain your tools in succession thanks to the training queueValidation and analysis of the results of the trained toolsAvailable on Windows and LinuxFree of charge
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Product
DC-AC Sine Wave Inverters for Ultraviolet (UV) Lamps
UV Lamp Inverters
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The sine wave inverters are designed and built to meet any customer input/output and mechanical configuration requirements.
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Product
PCE-2000UV Ultraviolet LED/Module Radiation Measurement System
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Hangzhou Everfine Photo-E-Info Co., LTD
PCE-2000UV Ultraviolet LED/Module Radiation Measurement System can realize the measurement of the relative spectral power distribution of ultraviolet LED, peak wavelength, half-peak wavelength, spectral radiation flux of UV-A/B/C, and total radiation flux in specific wavelength.
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Product
Rack Extender Kit, S6, 4" Deep
310113430
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The Rack Extender Kit provide additional clearance for the engagement handles when using a rack that has mounting rails recessed more than one inch [25.4mm] in a slide or rack mount configuration.
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Product
DFM (Deep and Fast Modulated) generators up to 280 GHz
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Insight Product Company offers DFM (Deep and Fast Modulated) mm-wave sources at frequencies from 30 to 280 GHz. DFM generators are designed to go swiftly from the generation to the non-generation mode and back. This process controlled by the external TTL signal. ON/OFF switch time is approximately 2 nanoseconds.
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Product
Solar Ultraviolet Pyranometers
UVR1-T, UVR1-A, &
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The Middleton Solar UVR1 series are precision filter radiometers for measuring solar global ultraviolet irradiance. The UVR1-T and UVR1-A are suitable for air pollution monitoring. The UVR1-B is suitable for biological and human erythema (sunburn) monitoring.
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Product
24" Slide Kit, Fits 24"-26" Deep Racks, Supports 180 lbs
310113410
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24" Slide Kit, Fits 24"-26" Deep Racks,Supports 180 lbs.Measure rack depth between mounting rails to determine the slide mounting kit that fits the rack. An extender block kit is available for mounting to racks with recessed rails.
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Product
ID, CASS, 19 Module, Single Tier, 2.75" Deep Drawn Frame
410113117
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ID, CASS, 19 Module, Single Tier, 2.75" Deep Drawn Frame.
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Product
20" Slide Kit, Fits 20"-22" Deep Racks, Supports 180 lbs
310113409
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20" Slide Kit, Fits 20"-22" Deep Racks, Supports 180 lbs.Measure rack depth between mounting rails to determine the slide mounting kit that fits the rack. An extender block kit is available for mounting to racks with recessed rails.
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Product
Ultraviolet Microscope
UVM-1
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The UVM-1™ is a UV microscope that also can image in the visible and NIR. This UV-visible-NIR microscope embodies both advanced optics for cutting edge UV, color and NIR imaging and visualization. The system is a flexible design, very easy to use and very durable. It is designed with cutting edge CRAIC optics for the highest image quality and to give years of service.
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Product
Deep Inspection Kit
GRL-KIT-DI20
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The GRL Deep Inspection Kit (KIT-DI20) addresses the gap between expensive, challenging-to-use VNAs and simple functional/continuity tests that are not adequate for high speed interfaces. Now, users without years of signal integrity testing expertise can perform professional measurements with high accuracy to 20GHz with easy-to-use equipment.





























