I-V-Curve
See Also: Photoluminescence
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Product
1000V/15A I-V Curve Tracer
I-V415w
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-V415w allows field detection of I-V Curve an of the main characteristic parameters both of a single module and of strings of modules for PV installations up to a maximum of 1000V and 15A. For measuring I-V Curve, I-V415w manages an internal database of the modules, which can be updated at any time by the user and comparison between the measured data with the rated values allows immediately evaluating whether the string or the module fulfills the efficiency parameters declared by the manufacturer.
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Product
1500V 15A I-V Curve Tracer
I-V500w
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I-V500w allows field detection of I-V Curve an of the main characteristic parameters both of a single module and of strings of modules for PV installations up to a maximum of 1500V and 10A or 1000V and 15A. For measuring I-V Curve, I-V500w manages an internal database of the modules, which can be updated at any time by the user and comparison between the measured data with the rated values allows immediately evaluating whether the string or the module fulfills the efficiency parameters declared by the manufacturer.
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Product
I-V Curve Measurement
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Our I-V curve analysers reliably deliver precise data – from laboratory equipment to fully automated test benches.
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Product
1500V Multifunction I-V Curve Tracer
SOLAR I-Ve
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SOLAR I-Ve allows both testing a single-phase (three-phase with optional MPP300) photovoltaic system and verifying I-V curve. Thanks to remote unit SOLAR02, it is possible to test the system complying with the requirement of simultaneity as provided for by the reference standard. SOLAR02 is a datalogger which, synchronized with SOLAR I-Ve, acquires the data relevant to irradiation and temperature while tests carried out by SOLAR I-Ve are carried out.
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Product
1500V 15A I-V Curve Tracer
I-V525w
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I-V525w allows field detection of I-V Curve an of the main characteristic parameters both of a single module and of strings of modules for PV installations up to a maximum of 1500V and 10A or 1000V and 15A. For measuring I-V Curve, I-V525w manages an internal database of the modules, which can be updated at any time by the user and comparison between the measured data with the rated values allows immediately evaluating whether the string or the module fulfills the efficiency parameters declared by the manufacturer.
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Product
PV Analyzer I-V Curve Tracers
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The Solmetric line of PV Analyzer I-V curve tracers are widely used in Commissioning, Auditing, O&M, and Troubleshooting of PV systems.
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Product
Curve Tracer
CS-5000 Series
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Maximum peak voltage: 5,000V (high-voltage mode for all models) in CS-5000 Series. Maximum peak current: 1,000A (CS-5300 high-current mode). The CS-5000 Series achieves 5,000V of max. peak voltage with the same physical size as the CS-3000 Series. Best suited for the measurement of a power devices that have 3.3kV and 4.5kV withstanding voltage.
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Product
43 Inch UHD C Type Curved LCD Curved Monitor
CRV-430WP
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Advantech CRV-430WP is designed with a 43 inch UHD C type curved LCD which features a1500R curvature. It supports 10 multi-touch controls.
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Product
IV Curve Tracer
IVCT
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In recent years, we have been developing a sophisticated IV curve tracer for PV modules including a maximum power point tracking (MPPT) function. The IV curve tracer is designed for operation with any market-available steady-state solar simulator. Through our web-based software design, the operator can supervise the test results from every computer in a company network. The software contains functions such as an irradiation sum counter that helps to check requirements stated in a stabilization test like they are defined in IEC 61215 (MQT 19). We have also included a correction function to correct the traced IV curves to standard test conditions (STC) when the user enters the required temperature coefficients. One of the most important features is the multi-IV curve tracing function, which enables the user to display more than 150 IV curves in one graph. This eases the analysis of the weakest cells in hot-spot tests, which are required in IEC 61730 (MST 22) and IEC 61215 (MQT 09).
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Product
Semiconductor Curve Tracer
CS-8000 Series
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The CS-8000 series are equipped with a high-voltage source of up to 5 kV and a high-current source of 2 kA. It features Pulse output, Gate pattern, and very small current measurement capabilities, and it supports the design evaluation of wideband-gap semiconductors such as SiC and GaN.
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Product
Precision Curve Tracer
CurveMasterTM
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The CurveMasterTM delivers new price/performance efficiency to curve tracing and Failure Analysis. Curve trace has been a standard feature in our full-power chip tester for years, so the CurveMasterTM is built with today’s components and technology. With all new high-accuracy DC Parametrics, you’ll enjoy the most powerful curve tracer you have ever used.
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Product
DC Parametric Test System with Curve Trace
DC3
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The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Product
Flat Field and Imaging Gratings - Type IV
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HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Type IV aberration-corrected flat field and imaging gratings are designed to focus a spectrum onto a plane surface, making them ideal for use with linear or 2-D array detectors.These gratings are produced with grooves that are neither equis-paced nor parallel, and are computer optimized to form near-perfect images of the entrance slit on the detector plane.
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Product
Curve Tracer
Series 5000C
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Our curve tracers are used worldwide for high volume production, quality control and final testing of descrete semiconductor devices. Provided with an Intel based single board computer(SBC) and Windows based software, the Scientific Test curve tracer is highly reliable, extemely fast, very easy to operate, and provides quick creation of digital curves for data storage and intuitive manipulation.
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Product
Pulsed IV
AURIGA 4850
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Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors.
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Product
Integrated I-V Test Systems
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The OAI Integrated I-V Test System is perfect for R&D as well as production, the OAI Integrated I-V Test System delivers extremely accurate solar cell performance measurement. OAI’s advanced fully Integrated I-V Test System is designed to overcome the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match any type of solar cell’s high capacitance and slow dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell I-V parameters and efficiency while leading to the most accurate test results.
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Product
I-V Tracers
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EKO I-V tracers (MP-160 / MP-11 / MP-180) can be used in three different Power ranges. The research type MP-160 is an all round instrument to be used with single cells and modules or multiple unitswhen connected to the multi channels selectors. The portable MP-11 with remote sensor unit can be used on site to accurately check the performance of Modules and Strings. The high end MP-180 is capable to make high precision I-V measurements of small and large size solar cells and is most suitable for Research and Development applications or production inspection purposes indoors.
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Product
In-Line Light I-V Testing for Solar Cells
FCT-750
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In-line, light I-V and Suns-Voc measurements in a single flash at 2400 units per hour. Capability to accurately measure high-efficiency conventional or backside-contact solar cells.
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Product
Stand-alone I-V Test Systems
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OAI offers a complete line of high performance I -V Testers. I -V Testers and I -V Rider software may be ordered as a stand -alone system or integrated into any OAI Solar Simulator. Three standard ranges of I -V Testers are available; ≤1A, 1 -5A, 5 -10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to insure that the I -V Tester and I -V Rider software you choose is optimized for your specific application.
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Product
Semiconductor Curve Tracer
CS-10000 Series
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This optional unit minimizes parameter variation on devices causedby heat. Pulse rise time can be configured for 1, 3, or 5ms; pulse duration from 1ms to 20ms; and pulse interval from 100ms to 2 seconds. This option is installed at the factory. Any changes desired after purchase will require return the unit back to IWATSUfactory.
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Product
Curve Tracer
CS-3000 Series
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CS-3300 / CS-3200 / CS-3100 three model line-up. Maximum peak voltage: 3,000V (high-voltage mode for all models) in CS-3000 Series.Maximum peak current: 1,000A (CS-3300 high-current mode). The CS-3000 Series are CE-marked and UL listed.
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Product
Single Long Pulse Solar Simulator & I-V Test System
TriSOL SLPSS
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The OAI Test System for HIGH EFFICIENCY SOLAR CELLS overcomes the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match the cell’s dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell efficiency leading to increased profitability.
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Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
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Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Product
Curved Needle Test Systems
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Instron’s Curved Needle Testing System is designed for evaluating surgical and wound closure needles through two specialized testing methods: curved needle puncture testing (per ASTM F3014) and cantilever bend testing. These fixtures assess key performance attributes such as sharpness, coating integrity, and flexural strength. Compact and efficient, the tabletop system conserves bench space while delivering robust functionality. Powered by Bluehill® Universal software, it offers comprehensive control over test execution, data collection, and reporting, along with access to a wide range of built-in calculations.
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Product
IV Analyzer / 8 Slot Precision Measurement Mainframe
E5260A
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Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5260A supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU’s versatile measurement capabilities and GUI based characterization software makes the E5260A the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Product
Curve Tracer
CS-10000 Series
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Hi-voltage devicesDevelopment of new devices (SiC/GaN)Automotive Companies
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Product
Solar Panel IV Tester
REOO GIV-20A2616
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REOO GIV-20A2616 Solar Panel IV Tester is designed for PV module manufacturing electrical inspection, enabling electrical performance verification and stable output measurement during production. Built for solar factories, it supports reliable module grading.
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Product
Power Device Analyzer / Curve Tracer
B1505A
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The Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available with the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz 5 MHz). Its ten-slot modular mainframe allows you to configure the B1505A to suit your measurement needs.
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Product
Precision I/V Source
MeasureReady™ 155
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The MeasureReady™ 155 Precision I/V source combines premium performance with unprecedented simplicity for materials scientists and engineers requiring a precise source of current and voltage. Low RMS noise: from 200 nV (10 mV)/7 pA (1 µA). Bipolar, 4-quadrant power source. DC and AC modes supported up to 100 kHz*. Full scale ranges from 10 mV to 100 V (1 μA to 100 mA). 0.001% programming resolution (from 100 nV/10 pA.
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Product
IV Characteristics Measurement Device Software
Keithley 2400, 2401 and Keithley 2450
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*Windows 10, Windows 11 (Compatible) RS-232C (Keithley 2400, 2401), USB (Keithley 2450)*NI GPIB can also be used (optional)*IPCE PEC-S02 can be used simultaneously. operation panel. *Everything from condition setting to measurement can be done on one screen.
