Near-field Scanning Optical Microscope
Near-field Scanning Optical Microscope
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Product
Area Scan Cameras
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Area scan cameras, also known as matrix cameras, are one of the most widely used technologies in industrial image processing. They capture images in two dimensions (the X and Y directions) and are ideal for applications requiring a complete image in a single capture.
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Product
Fabry-Perot Based Scanning Filter
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This new type Fabry-Perot Based Scanning Filter (FPSF) is based on Optoplex proprietary fiber optical Fabry-Perot Etalon technology. It offers F-P based scanning filter with central wavelength at 1060nm, 1310nm, 1550nm or other customized wavelength. It can be tuned manually or automatically by scanning over a wide spectral range from 10nm to 100nm with bandwidth from 0.05nm to 1.0nm. FPSF features less than 3dB insertion loss and as high as 1kHz scanning frequency. Its unique high reliability and low insertion loss design presents the most cost-effective solution for OEM application from telecommunication to fiber sensing interrogation.
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Product
OEM Scan Engines
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Zebra Technologies Corporation
When you choose Zebra as your OEM partner, you get a portfolio of scan engines and devices that deliver industry-leading features, durability and reliability — saving everyone time and money. You save on development time and cost. And, your customers get best-in-class, well-proven solutions that drive time and cost out of their everyday operations.
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Product
Boundry Scan Testers
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Qmax Test Technologies Pvt. Ltd.
Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
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Product
Microscope
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Instrument that produces enlarged images of small objects, allowing the observer an exceedingly close view of minute structures at a scale convenient for examination and analysis.
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Product
FIBER OPTIC MICROSCOPES
SpecVision
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SpecVision is a video probe that engages directly with Krell polishing machines. This permits the viewing of polished optical surfaces while connectors or bare fibers are still loaded in the polisher. This in-line video inspection technique minimizes material handling and potential damage/contamination that may occur when transferring components from the polisher to a traditional microscope. SpecVision can interface with Scepter, SpecPro and Rev Polishers.
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Product
Renishaw Scanning Probes
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Advanced Industrial Measurement Systems
The REVO® is designed to maximize CMM throughput while maintaining high system accuracy and uses synchronized motion as well as Renscan5 measurement technology to minimize the dynamic effects of CMM motion at ultra high measurement speeds. This is achieved by letting the REVO® head do the fast demanding motion while the CMM moves in a slow linear fashion.
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Product
Differential Scanning Calorimeter
DSC-L600
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The Differential Scanning Calorimeter (DSC-L600) is a powerful thermal analysis instrument that measures the heat flow of a sample as a function of time or temperature. The DSC-L600 has been designed to be a cost-effective instrument that is well suited for research or QC applications. The instrument communicates with the PC via a RS232/USB connection. The specially designed heat flux plate has demonstrated more than twice the sensitivity than other heat flow type DSC’s on the market. The reproducibility is excellent, and the noise level is virtually unnoticeable due to a precision high gain, low noise differential amplifier
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Product
Boundary Scan
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Boundary Scan is a powerful test method for digital circuit components. The hardware and software components we use for the boundary scan implementation come from Göpel electronic
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Product
Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Product
AFM (Atomic Force Microscope) Optical Platform
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The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Product
Upright Microscopes
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ACCU-SCOPE upright microscopes deliver top quality optics for bright, crisp images. Sometimes referred to as compound microscopes, our upright microscopes are favorites across a wide range of laboratories including clinical, veterinary, pharmaceutical, research, university, and education. Some of the disciplines utilizing our upright microscopes include pathology, hematology, microbiology, cytology and histology. ACCU-SCOPE upright microscopes offer a selection of magnifications from ultra-low (e.g. 2X) to high power oil immersion (e.g. 100X). Our microscopes have a variety of options and accessories to perfectly fit your application including ergonomic viewing heads, trinocular heads for camera attachment, and an assortment of objectives. Common contrast methods used with our microscopes include brightfield, phase contrast, darkfield, Differential Interference Contrast (DIC) and fluorescence.
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Product
Measuring Microscopes, Image Processing
Milling & Drilling
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Optik Elektronik Gerätetechnik GmbH
OEG manaufactures all mechanical parts in house and offers these services to other companies.
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Product
Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Product
Area Scan Cameras
Go-X Series
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The Go-X Series offers compact, attractively-priced area scan cameras with a blend of features, image quality and industrial grade reliability that is in high demand for the next generation of machine vision systems.
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Product
Electron Microscope Analyzer
QUANTAX Micro-XRF
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Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Product
3D Scanning System
CyberGage360
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Unprecedented combination of speed, accuracy and one-button simplicity for non-contact automated 3D scanning inspection.CyberGage360 dramatically Speeds Up Quality Assurance of Incoming Parts Inspection & In-Process Inspection of components on the manufacturing floor; Lowers Cost of Quality & Speeds Up Product Time-to-Market. Designed for use in general purpose metrology, the CyberGage360 has a range of potential industrial applications from automotive to aerospace to consumer electronics, where high accuracy and high speed throughput are important.
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Product
Digital Microscope Accessories
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Variety of extra accessories , such as macro lenses, remote control consoles, illuminations, image/video capture, software, stands and stages are available for Inspectis digital microscopes.
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Product
Stereo Microscopes
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Here are a few examples from our 40 years of microscopy experience in the development of special stereo microscope solutions and accessories for and with Leica , Zeiss , Nikon and Olympus .
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Product
Rapid Scanning Auto-Correlator / Cross-Correlator
FR-103XL
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The FR-103XL is a dispersion-free Autocorrelator/CrossCorrelator for monitoring the temporal width of ultrashort optical pulses. Offering unsurpassed sensitivity and resolution, it is compact and easy to operate. The FR-103XL is ideally suited for the measurement weak signals in optical telecommunications, as well as pulses from other mode-locked lasers such as Ti-Sapphire.
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Product
Electron Microscope Analyzer
QUANTAX FlatQUAD
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QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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Product
Optical Penetrator
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The Optical Penetrator from Teledyne ODI resides at the wall or bulkhead of the vessel in which the equipment is located, providing a differential barrier, fluid isolation, and reliable optical feed-through.
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Product
Metra Scan 3D
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The most accurate scanning and probing solutions, whether in lab or on the shop floor.Highly accurate measurementDynamic referencingComplete metrology solution
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Product
Atomic Force Microscope
NaioAFM
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The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
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Product
Microscope Photoluminescence Spectrometer
Flex One
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Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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Product
Stereo Microscopes
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Sometimes called dissecting microscopes, stereo microscopes provide comfortable 3-dimensional viewing of a sample in which each optical path (eye) sees the sample from a slightly different angle. Stereo microscopes are used to observe and manipulate samples in disciplines such as research, assembly and manufacturing, gemology and jewelry making, sample preparation and, of course, dissection. ACCU-SCOPE stereo microscopes can be found across a wide range of industries and institutions including biology labs, universities, research institutions, government facilities, biopharmaceuticals, manufacturing facilities, and more. Stereo microscopes are also available on a variety of stands and with a variety of illumination sources, offering features that may be particularly suited for your application.
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Product
Single Sensor - Monochrome Line Scan Cameras with Fast Scan Rates
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JAI’s monochrome line scan cameras provide an excellent combination of high resolution and fast scan rates.The Sweep SW-8000M-PMCL model features an 8192-pixel linear CMOS sensor delivering a line rate of 100,000 lines/s (100 kHz) over a Camera Link interface. The SW-4000M-PMCL model is based on a 4096-pixels sensor capable of running as fast as 200,000 lines/s (200 kHz) over Camera Link.
