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Near-field Scanning Optical Microscope
Near-field Scanning Optical Microscope
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Near-field Scanning Optical Microscope
NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Near-Field Scanning Optical Microscope Platform
MoScan-F
MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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Optical Switches
Fast and reliable optical switches to streamline your test procedures. Can be customized with a wide range of switch configurations, fiber types and connectors.
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Automated Optical Switch - PXI
Add optical switching capability to your test system with Quantifi Photonics’ automated optical switches. The fast and reliable optical switch will enable automated sequential testing, saving time and streamlining your test procedures.
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PXI Optical Switch
The PXI Optical Switch is available in many different switching configurations for customized optical switching. It offers both single-mode and multimode fiber options that can support switching of very small wavelength signals. The switch provides either SC/PC, FC/PC, SC/APC, or FC/APC fiber-optic connectors. You can use the PXI Optical Switch for repeatable, low-loss switching.
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Automated Optical Switch - MATRIQ
Add optical switching capability to your test system with Quantifi Photonics’ automated optical switches. The fast and reliable optical switch will enable automated sequential testing, saving time and streamlining your test procedures.
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Broadband Optical Source - MATRIQ
Our SLED MATRIQ instrument is a compact super-luminescent LED light source with high output power, large bandwidth and low spectral ripple.The SLED comes in various wavelength models to address various key applications across telecom and datacom, and is ideal for building a customized optical testing platform that delivers reliable and repeatable results.
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Optical to Electrical Converters
High bandwidth, broadband optical to electrical converters available in a range of configurations. Choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Scanning Electrochemical Microscope
VS-SECM (DC And AC)
The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Optical Scanning Systems
that feature high scanning speed and accuracy. Our non-contact 3D scanners are ideal for 3D digitization of physical models, quality control and reverse engineering.
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Scanning Electron Microscope
E5620
The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Broadband Optical Source - PXI
SLED 1000 Series
The SLED 1000 Series is a super-luminescent LED light source with high output power, large bandwidth and low spectral ripple. It comes in various wavelength models to address applications in the telecom and datacom markets.The SLED is a single-slot PXIe module and is ideal for building a customized optical testing platform that delivers reliable and repeatable results in manufacturing or R&D environments.
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Scanning Electron Microscope
JSM-IT510
Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Scanning Probe Microscopes
attoMICROSCOPY
The mission to create scientific impact has kept attocube at the frontier of cutting edge research instrumentation. Decades of combined experience in all relevant fields, an excellent team, and close cooperations with some of the world’s leading research institutes have evolved into a broad portfolio of high-end cryogenic scanning probe microscopes.
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Laser Scanning FLIM Microscopes
DCS-120 laser scanner: Compact - Flexible - Precise. As technology leader in equipment and techniques for single photon counting, Becker & Hickl offers the DCS-120 systems that are complete laser scanning microscopes for fluorescence lifetime imaging (FLIM) since 2007. The systems use bh’s multi-dimensional TCSPC FLIM technology in combination with fast laser scanning and confocal detection or multi-photon excitation.
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Scanning Near Field Optical Microscope
SNOM
SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Custom Microscopes and Optical Systems
OpenStand
Whether developing new automation techniques and software or developing new imaging methods, you can quickly find that you need a microscope system tailored to your application and business needs. Prior Scientific has developed OpenStand® to offer a working platform to build OEM solutions and one-off customizations with excellent value for money and reduced development time.
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400x Bench-Top Optical Fiber Microscope - FTM-400X
Shanghai Fibretool Technology Co.,Ltd.
With coaxial illumination optic magnify system, FTM-400X can easily find the slight defects and scratches on fiber endface. High resolution image sensor and 8"pure black and white digital TFT LCD can show the most real details of fiber endface.This is an integrated fiber endface inspector, it combines optical microscope and monitor in a body other than separate designs. It has clear images and long life time. it has series of adaptors for various kinds of connectors such as multi fiber connectors, optical components. It is an essential instrument for optical manufacturing.
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Near-Field Detection Module for Imaging
Transmission
Detection optimized for high performance near-field imaging in transmission-modeEnables optical amplitude and phase resolved near field measurementsPatented background-free detection technologyEnables bottom-side (transmission-mode) sample illumination with broadband mirrorSuited for visible and infrared wavelength range 0.5 20 mRequires transparent sample substrateMotorized parabolic mirror for easy beam-alignment in transmission-modeStationary focal point with respect to AFM-tipVariable illumination spot size (ca. 2m 100m)Suitable for plane-wave illuminationSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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Near-Field Detection Module for Imaging
Reflection
Reflective AFM-tip illuminationDetection optimized for high-performance near-field imagingEnables optical amplitude and phase resolved near field measurementsNear-field spectroscopy possible via sequential imaging (Requires tunable illumination unit)Patented background-free detection technologySuited for visible & infrared wavelength range (0.5 20 m)Version for infrared & THz wavelength range (5 300 m) availableSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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Autofocus Optical Fiber Microscope - AFM-700
Shanghai Fibretool Technology Co.,Ltd.
The AFM-700 is an autofocusing optical fiber microscope.
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AFM (Atomic Force Microscope) Optical Platform
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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2D Near-Field Analysis of VCSEL Arrays
VTC 4000
Instrument Systems Optische Messtechnik GmbH
The VTC 4000 near-field camera from Instrument Systems was specially developed for the ultrafast, precise 2D analysis of VCSEL arrays. It enables polarization-controlled characterization of all relevant parameters simultaneously for the single emitters of the array.
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Optical Coherence Tomography Imaging Line Scan Cameras
OctoPlus Range
Teledyne e2v spent 2 years developing a CMOS sensor specifically for OCT. This resulted in the launch of OctoPlus, which has a specially designed pixel architecture that improves sensitivity and reduces signal roll-off to improve image quality by several dB vs state-of-the-art CMOS cameras, especially in deep structures.
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Scanning Kelvin Probe Microscope
VS-SKP
The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Microscope Platforms
Applied Scientific Instrumentation
ASI Modular Microscope components consist of tube lenses along with adapters and accessories that either are primarily used in the collimated light space or adapters that are to be used on the image side. Collimated light adapters use the 38 mm diameter C60-RING system to connect components. Focus-side adapters attached to lens tubes with either a 30 mm diameter coupling to the I.D. of the C60-TUBE, or with a 50 mm coupling on the O.D. of the lens tube.
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Microscope Software
Only with the right microscope software you can unleash all features of your imaging station. Our modular software platforms are easy to learn and enable you to acquire, process and analyze images in multiple dimensions and over various timepoints. Non-destructive image handling and file formats developed specially for microscopy are just two benefits that guarantee reproducible results for your experiments.
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Scan Systems
Allows its user to achieve previously unreachable levels of dynamic performance and precision.
