Product

Metrology Solutions for Semiconductors

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Bruker Corporation

Bruker Corporation

Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.

Product

Semiconductor Test Software Solutions

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Test Spectrum, Inc.

Test Spectrum, Inc.

The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.

Product

Semiconductor & Flat Panel Display Inspection Microscopes

MX63 / MX63L

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Olympus Corp.

MX63 / MX63L - Olympus Corp.

The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.

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Comprehensive Suite of Software Tools for Semiconductor Test Applications

ICEasy Test Suite

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Marvin Test Solutions, Inc.

ICEasy Test Suite - Marvin Test Solutions, Inc.

Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.

Product

Semiconductor Testing

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Teradyne, Inc.

Teradyne, Inc.

Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.

Product

Semiconductor Probes

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Merica Technology Ltd

Merica Technology Ltd

Semiconductor Probes

Product

Semiconductor

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Haydon Kerk Pittman

Haydon Kerk Pittman

The semiconductor industry faces continuous pressure to reduce device size and costs while improving performance and reliability. Semiconductor, test and assembly automation manufacturers demand the same improvements from the motion technology which drives it. Haydon Kerk Pittman continues to develop new technologies in motors, lead-screws, gears, encoders, actuators, slides, drives and complete sub-systems that increase operational speeds and accuracy while lowering the cost of ownership.

Product

Discrete Detectors

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Inframet

Inframet

TRAL test station is a quasi-universal test station designed to measure parameters of discrete (or small linear array) infrared detectors sensitive in a wide spectral range from about 700nm to about 16 000 nm (NIR/SWIR/MWIR/ LWIR detectors or broadband non selective detectors). All main types of infrared detectors can be tested: photonic detectors: photovoltaic/photoreconductive, cooled/non-coooled, thermal detectors, pyroelectric detectors etc.

Product

Semiconductor Thermal Transient Tester

T3Ster®

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Siemens EDA

T3Ster® - Siemens EDA

T3Ster (pronounced "Trister") is an advanced thermal tester from Mentor Graphics MicReD Products for thermal characterization of semiconductor chip packages. Superior to all other thermal characterization equipment on the market due to its speed and ease of use; its extremely accurate temperature measurements (0.01oC); and its 1 micro-second measurement resolution in time.

Product

Power Cycling Semiconductor Life Test System

ITC52300

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Integrated Technology Corp.

ITC52300 - Integrated Technology Corp.

The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)

Product

6-CH Discrete Input 16-CH Discrete Output Module with UD Type Connector

HSL-DI16DO16-UD

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ADLINK Technology Inc.

HSL-DI16DO16-UD - ADLINK Technology Inc.

*Supports 16 DI channels and 16 DO channels*Transmission speeds: 3/6/12 Mbps*RJ-45 phone jack for easy installation*Compact and single board design to meet space limitati

Product

Semiconductor

DieMark

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Xandex, Inc.

DieMark - Xandex, Inc.

DieMark Inking Systems are available in Electric and Pneumatic models and utilize convenient, disposable DieMark Ink Cartridges to streamline and optimize the process of marking defective die. With models available for nearly every test platform and configuration, Xandex inking systems are in operation daily in every corner of the world where wafer sort is performed.

Product

Semiconductor Test

Ismeca NY32

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LTX-Credence

Ismeca NY32 - LTX-Credence

32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as Intelligent Features that enables extended autonomous operation and productivity.

Product

Semiconductors

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Arasan Chip Systems, Inc.

Arasan Chip Systems, Inc.

Meets SDIO card v2.0 specificationSupports SDIO SPI, 1-bit, and 4-bit SD modesHost clock rate from 0-50 MHzSingle SDIO function interfaceSD commands processed in hardwareReset output on completion of initializationIndication of high speed and high power enabling to application logicMaximum block size supported is 1024 bytesThree I/O mode selection pinsCRC7 and CRC16 modulesSupports direct R/W (IO52) and extended R/W (IO53) commandsAPB bus interfaceParallel bus interfaceStandard 8051 split bus interfaceGeneric 8051 bus interfaceUART interface

Product

Automotive Power Discretes

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STMicroelectronics

STMicroelectronics

ST offers a wide portfolio of automotive grade power discrete devices for reliable, robust and power-efficient automotive applications.

Product

Semiconductor Device Parameter Analyzer and Measurement Modules

B1500A Series

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Keysight Technologies

B1500A Series - Keysight Technologies

Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.

Product

Semiconductor Technology, Micro Scriber + Flatness, Bow, Warp, Curvature, Glass Thickness

FLATSCAN

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Optik Elektronik Gerätetechnik GmbH

FLATSCAN - Optik Elektronik Gerätetechnik GmbH

Non contact automated 2D- or 3D measurement of warp, bow, slope and surface curvature with software module for calculation of thin film stress (wafer stress) of wafers and glass substrates.

Product

Semiconductor Wafer Defect Inspection Management Software

ProcessGuard

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Microtronic, Inc.

ProcessGuard - Microtronic, Inc.

Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.

Product

Customized Semiconductor Wafer Inspection, Sorting & Metrology Equipment | Systems

Customized Solutions

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Microtronic, Inc.

Customized Solutions - Microtronic, Inc.

Unique Needs? Need better wafer inspection throughput, accuracy, versatility? Need a wafer defect inspection expert who’s not a sales person? We’ve been providing complete semiconductor wafer inspection, sorter, and microscopes solutions to semiconductor wafer manufacturers since 1994.

Product

Fully Automatic 4 Point Probe Sheet Resistance System For Semiconductor Process Evaluate

WS-3000

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NAPSON Corp.

WS-3000 - NAPSON Corp.

*Automatic probe head selection(exchanger) among 4 kinds of probe head*[No need to exchange a probe head by each different sample measurement]*Edge 1mm measurement is available by dual meas. mode*High cost performance from high speed measurement*FOUP compatible, GEM / SECS compatible