Mixed Signal
Integrated circuit that handles both analog and digital signals.
See Also: Mixed Signal ATE, Mixed Signal Oscilloscopes, Mixed-Signal Test, Mixed Signal Testers, MIxed Signal Test Systems
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Product
Pattern Generators
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Active Technologies Data Pattern Generators offer a complete and unique portfolio of instruments to address a wide range of applications starting from Digital Logic and Semiconductors characterization, Aerospace & Defense compliance testing, Mixed Signal Systems testing to Signal Integrity experiments.
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Product
Mixed Signal Oscilloscope - 500 MHz, 2 Analog Plus 16 Digital Channels
MSOX3052T
Oscilloscope
500 MHz2 analog plus 16 digital channels Easily view and analyze your signals with on the large 8.5-inch capacitive touch screen Isolate signals in seconds with exclusive Zone touch triggering See more signal detail with the 1,000,000 wfms/s update rate Capture more data with up to 4 Mpts memory Expand your measurement capabilities with full upgradability: Add bandwidth, 20 MHz arbitrary waveform generator, 3-digit voltmeter, serial trigger and analysis & mask testing at any time
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Product
4 GHz, 20 GS/s, 4ch, 100 Mpts/Ch High Definition Mixed Signal Oscilloscope
WavePro 404HD-MS
Oscilloscope
HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s.Up to 5 Gpts of acquisition memory enables detailed viewing of long events.15.6" 1900 x 1080 Full HD capacitive touchscreen.New ProBus2 input supports up to 8 GHz bandwidth and direct compatibility with a wide variety of existing ProBus probes - 50Ω and 1MΩ coupling modes support all input types on a single connector.MAUI with OneTouch user interface for intuitive and efficient operation.Deep toolbox enables and simplifies complex analysis.Intuitive navigation to quickly find important features in long waveforms.Zone Trigger – Simple Triggering for Complex Signals.
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Product
Mixed Signal Oscilloscope, 100 MHz, 4 Analog Plus 16 Digital Channels
MSOX3014A
Oscilloscope
100 MHz4 analog plus 16 digital channels Easily view your signals on the 8.5-inch WVGA display Capture more data with up to 4 Mpts memory See more signal detail with 1,000,000 wfms/s update rate Expand your measurement capabilities with full upgradability: Add bandwidth, memory, 20 MHz arbitrary waveform generator, 3-digit voltmeter, serial trigger and analysis, segmented memory & mask testing at any time
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Product
Mixed Signal Oscilloscope - 6 GHz, 2 Analog and 16 Digital Channels
MSOX6002A
Oscilloscope
1 GHz - 6 GHz2 analog plus 16 digital channels Easily view and isolate signals on the 12.1-in capacitive multi-touch screen with Zone triggering and 450,000 wfms/s update rate Make more precise measurements with 115 Vrms noise floor at 1 mV/div (1 GHz)Get performance measurements anywhere with the portable 6-in deep size Quickly see analysis details with standard histogram and color grade View signal integrity with jitter and eye diagram analysis options
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Product
Build to Print
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In today’s fast paced manufacturing environment, where time to market and cost competitiveness is key, having a manufacturing partner like ARC can be a valuable resource for your company. ARC has a build-to-print manufacturing capability with our unique ‘engineer-to-print’ philosophy to make sure precision manufacturing and final build accuracy is top priority for your module level or system level builds. ARC can support up to several hundred module level assemblies (CCA subassemblies, cabling, mechanical and paneling elements) with abilities to perform a variety of software, embedded tasks and functional testing including a mixed signal test capability using our in-house MSAT (Mixed Signal Automated Tester) platform. We have a thorough process created through the development of our own products and test solutions. We know the importance of having a regimented manufacturing process, augmented with engineering expertise to address challenges that come up with building complex, high-mix, medium volume products.
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Product
WaveRunner Oscilloscope, 4 GHz Bandwidth, 4+16 Input Channels, 40 GS/s on 2 Ch Sample Rate
WaveRunner 9404M-MS
Oscilloscope
4 GHz, 40 GS/s, 4ch, 64 Mpts/Ch Mixed Signal Oscilloscope with 15.4" Capacitive Display.
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Product
Logic Probes
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Logic probes allow you to capture signals using the logic portion of a mixed signal instrument. Yokogawa offers low and high voltage, isolated and non-isolated logic probes.
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Product
Mixed Signal Oscilloscope: 350 MHz, 4 Analog Plus 16 Digital Channels
MSOX3034A
Oscilloscope
InfiniiVision 3000 X-Series 350 MHz oscilloscope provides 4 analog plus 16 digital channels, up to 4 Mpts memory, and 1,000,000 waveforms/sec update rate
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Product
Mixed Signal Oscilloscopes
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The design, validation, and manufacturing of modern electronics necessitate the measurement of both analog and digital signals. Mixed signal oscilloscopes enable the simultaneous, time correlated observations and analysis of analog with digital (logic) signals, to establish causal relationships between the various areas of a device's electronics. They are purpose built tools for troubleshooting electrical anomalies, measuring parametric values, and monitoring cause and effect relationships between signals.
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Product
Wafer Probe Test System
STI3000
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The STI3000 is a wafer-level MEMS and mixed signal ASIC probe test system that combines several functional STI test equipment blocks for testing gyros, accelerometers, pressure sensors, microphones, resonators, and mixed signal ASICs.
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Product
Dual-Directional Couplers
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KRYTAR’s directional couplers are uniquely designed for systems applications where external leveling, precise monitoring, signal mixing or swept transmission and reflection measurements are required. These couplers provide simple solutions for many applications including electronic warfare (EW), commercial wireless, SATCOM, radar, signal monitoring and measurement, antenna beam forming, and EMC testing environments. For many space-restricted applications the compact size makes KRYTAR directional couplers ideal solutions.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Combination Board Tester
V250 / V250PXI
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Qmax Test Technologies Pvt. Ltd.
V250 / V250PXI is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities and conventional PCBs. An In –Circuit device test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed and on board clock disable HW feature are the all time favorite . The in-built high frequency 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices with high degree of accuracy.
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Product
High-Speed Digital Analyzer
HDA125
Analyzer
Plug in a high performance logic analyzer to your oscilloscope for enhanced visibility during mixed signal analysis. The HDA125 High-Speed Digital Analyzer supplies 12.5 GS/s sample rate and up to 18 leads in a small modular form factor.
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Product
Qualification Hardware & Sockets
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Reltech Limited holds over 35 years’ experience in the design and manufacture of all types of qualification test hardware. Our advanced technology products include: HTOL Boards (Mother and Daughter cards) Burn-In Boards HAST Boards THB (humidity) Boards Burn-In Modules and frames Dynamic Driver cards (Digital, Analogue and Mixed signal) Back Planes Voltage regulator cards Custom electro-mechanical assemblies DUT Cassettes and test Fixtures
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Product
Telemetry
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Single channel system, offering wireless transfer of a single analogue signal, either 4-20mA or DC voltage. Mixed signal radio telemetry solution. Analogue I/O: 2x 2-40mA or DC Voltage. Digital I/O: 2x volt free or optional pulse counting required. Multi-channel radio telemetry system, 4 Analogue and 8 digital inputs. Significant signal connectivity and data transfer in a standard package.12 I/O channels allow greater signal monitoring capability SENSOR LINK Compact wireless telemetry link for any strain gauge sensor or RTD. Transmissions distance 1 to 300 meters. Licence free radio operation.16 bit ADC resolution.
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Product
Mixed Signal Oscilloscope - 350 MHz, 2 Analog Plus 16 Digital Channels
MSOX3032T
Oscilloscope
350 MHz2 analog plus 16 digital channels Easily view and analyze your signals with on the large 8.5-inch capacitive touch screen Isolate signals in seconds with exclusive Zone touch triggering See more signal detail with the 1,000,000 wfms/s update rate Capture more data with up to 4 Mpts memory Expand your measurement capabilities with full upgradability: Add bandwidth, 20 MHz arbitrary waveform generator, 3-digit voltmeter, serial trigger and analysis & mask testing at any time
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Product
MEMS Device-Oriented Testers
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Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.
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Product
Mixed Signal Test Systems
MTS1020i
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The MTS-1020i is a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Product
Logic Analyzer
LAP-16128U
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Zeroplus Technology Corperation
Sample rate (Internal clock): 200MHz asynchronous operation. Sample rate (External clock): 100MHz synchronous operation. Channels may be selectively defulted to /Channels: 16 CH. Upgrade Oscilloscope to measure and decode I2C / UART (RS232C & RS485) / SPI Protocols and mixed signals.
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Product
Component Test and Analysis Laboratories
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The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.
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Product
Engineering Support Platform
ESP
Platform
ESP, or Engineering Support Platform, is a low cost, powerful and versatile platform for the development, deployment and support of FPGA Applications. ESP is powered by DSX core, ARC’s core element for the development and deployment of digital and mixed signal systems. The standard system contains 2 custom FPGA system, often configured in combination where one acts as the application firmware, and the other is used for test. But the system is expandable and configurable in any combination to solve any problem in a digital, analog or mixed signal system. The FPGAs can be configured to generate, analyze, process and/or output complex signals at a wide range of voltages, frequencies and serial protocols. It has been used to develop solutions for Radar systems, testers, Pattern Generation, digital signal processing and generating, Video processing, and many more. ESP comes as a desktop or rack mounted solution, and no special interfaces are needed.
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Product
Test Service Offerings
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ASE Industrial Holding Co., Ltd.
ASE provides a complete range of semiconductor testing services to our customers, including front-end engineering testing, wafer probing, final testing of logic, mixed signal, and memory semiconductors, and other test-related services. Our testing services employ technology and expertise that are among the most advanced in the semiconductor industry.
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Product
PC Oscilloscopes & Mixed Signal Oscilloscopes
PicoScope® 3000 Series
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PicoScope 3000 Series USB-powered PC oscilloscopes are small, light, and portable and can easily slip into a laptop bag while offering a range of high-performance specifications.
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Product
Mixed Signal Oscilloscope: 25 GHz, 4 Analog Plus 16 Digital Channels
MSOV254A
Oscilloscope
25 GHz analog bandwidth (upgradable)4 analog plus 16 digital channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (1.73 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Access the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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Product
Digital Oscilloscope
MSO/DS4000
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The 4000 series digital oscilloscope is a versatile, high performance mixed signal oscilloscope that incorporates many of today’s most advanced technologies and processes. Featuring bandwidths between 100MHz and 500MHz, sample rates up to 4GSa/s, 2 or 4 analog channels, and 16 digital logic channels, the 4000 is ideal for a wide variety of engineers working in communications, industrial electronics, R&D and educational fields.
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Digital and Mixed-Signal Test Solutions
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A digital device processes electronic signals that represent either a one (on) or a zero (off). The ‘ones’ and ‘zeros’ represent data. Each one or zero is referred to as a bit and a group of 8 bits equals a byte
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Product
Ethernet PHY
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Macom Technology Solutions Holdings Inc.
MACOM’s portfolio of 10G/25G/40G/50G/100G Ethernet Physical Layer (PHY) devices offer unparalleled performance while maintaining high density at low cost. Integrated high-speed, high performance mixed signal I/O using advanced CMOS process nodes support a variety of optical and copper connectivity interfaces allowing the Ethernet PHY product line to span rack and cluster connectivity within the data center, wireless fronthaul, midhual and backhaul connectivity for 5G wireless infrastructure, and seamlessly extend to core networks over DWDM optical links. Advanced features such as in-service eye monitors, traffic monitoring, optical module identification and link training are just a few of the advantages that MACOM’s portfolio provides for end users to leverage for faster bring up, higher reliability and smarter networks.
