Semiconductor
active or passive elements connected as an electronic circuit using a crystalline subtance, eg. silicon or germanium.
See Also: iJTAG
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Product
Desolvating Nebulizer
Aridus3
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The CETAC Aridus3 Desolvating Nebulizer System is a specialized liquid sample introduction accessory for inductively coupled plasma mass spectrometry (ICP‑MS). The Aridus3 can enhance analyte sensitivity up to 10 times or more and can greatly reduce solvent-based interferences such as oxides and hydrides.The Aridus3 couples a low-flow (50, 100, or 200 µL/min) PFA nebulizer and a heated PFA spray chamber with an inert fluoropolymer membrane. This combination provides enhanced analyte sensitivity while reducing solvent based interferences such as oxides and hydrides. The Aridus3 is particularly advantageous for small volume and highly corrosive samples such as those generated in the earth sciences and the semiconductor industry.
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Product
MPI Advanced Technologies & Accessories
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MPI Advanced Semiconductor Test
MPI become very fast the truly innovation leader in the Advanced Semiconductor Tests market. By offering wide range of system’s accessories and unique advanced technologies, such as Automated Test over Multiple Temperatures ATMT™, NoiseShield™, PHC™, VCE™, mDrive™, MPI is offering variety of complete test solutions at highest value.
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Product
50MHz Arbitrary Waveform/ Function Generator
Model 645
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Berkeley Nucleonics Corporation
The BNC Model 645 50MHz Function/Arbitrary Waveform Generator delivers many advanced features and user modes than our previous models, with a price that is designed to meet tough economic constraints. New DDS+ technology embraces advancements in the semiconductor industry and leverages state-of-the-art components for both standard and complex functions. The resulting design is a box for every bench, far more capable than the ARBs and Function Generators of the past. We have even incorporated IP support, so a web browser can control the instrument over LAN.
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Product
13MP 4K Camera Module
e-CAM131_CUMI1335_MOD
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e-CAM131_CUMI1335_MOD is a high performance, 13 MP 4K camera module with S-Mount lens holder and it has better low light performance. This small form factor 4K camera module is based on 1/3.2” AR1335 CMOS image sensor from ON Semiconductor® and has a dedicated, high-performance Image Signal Processor (ISP) that performs the entire Auto functions like auto white balance, auto exposure control in addition to complete image signal processing pipeline that provides best-in-class images and video and the optional MJPEG compression.
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Product
0 Hz/DC to 14 GHz, Single-Pole, Four-Throw MEMS Switch With Integrated Driver
ADGM1304
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The ADGM1304 is a wideband, single-pole, four-throw (SP4T) switch, fabricated using Analog Devices, Inc., microelectro-mechanical system (MEMS) switch technology. This technology enables a small, wide bandwidth, highly linear, low insertion loss switch that is operational down to 0 Hz/dc, making it an ideal switching solution for a wide range of RF applications. An integrated control chip generates the high voltage necessary to electrostatically actuate the switch via a complementary metal-oxide semiconductor (CMOS)-/low voltage transistor-transistor logic (LVTTL)-compatible parallel interface. All four switches are independently controllable. The ADGM1304 is packaged in a 24-lead, 5 mm × 4 mm × 0.95 mm lead frame chip-scale package (LFCSP).
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Product
AMIDA ATI 600 Tester
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AMIDA ATI 600 Tester is a dedicated test system for semiconductor components (MOSFET, BJT, DIODE, ... etc.), which can accurately and quickly measure product parameters through form filling and editable program control. In practical applications, AMIDA ATI 600 Tester is the best choice for users, whether it is CP or FT mass production testing, or research projects of component characteristics.
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Product
Panel-mount Type Conductivity Meter (Four-Wire Transmission, For Low-concentration)
HE-480C
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HE-480C connects conductivity sensor (ESH /FS Series) and measures conductivity and temperature in the sample water. This is a highly functional model, with high-performance temperature compensation, and is applicable to a wide range of tasks, from managing pure water for use with semiconductors, to managing the quality of boiler water.
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Product
ULTRA Test Cells
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The ULTRA Series of high performance MEMS handling, stimulus and test cells provides unparalled flexibility and capability for engineering development, characterization or high volume production test of inertial MEMS (accelerometer, gyroscope) semiconductor devices.
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Product
Centralized Motion Controller
Motion Controller
ADLINK‘s pulse train controllers provide comprehensive and application-oriented motion functions for servo and stepper motors through digital signal processing (DSP)-based and Application Specific Integrated Circuit (ASIC)-based two pulse train mode controllers to achieve excellent synchronous motion control and precise positioning suitable for laser engraving, marking and cutting applications in semiconductor, AOI, and conventional manufacturing industries.
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Product
4K Multi-Camera System (TRICAM)
E-CAM130_TRICUTX2
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e-CAM130_TRICUTX2 (TRICamera) is a multiple camera solution for NVIDIA® Jetson TX2 developer kit that consists of three 13 MP 4-Lane MIPI CSI-2 camera board and an base board to interface with the J22 connector on the Jetson TX2. Each camera is based on the camera module e-CAM137_CUMI1335_MOD, 1/3.2" AR1335 color CMOS image sensor from ON Semiconductor® and integrated high performance Image Signal Processor (ISP).
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Product
WATOM
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Wafer edge and notch profile measurementThe use of smaller and smaller patterns in the semiconductor industry calls for increasingly advanced materials of extremely high quality. In response to the steady improvements in the quality of wafers, KoCoS Automation has developed WATOM, a wafer edge and notch profile measurement tool which heralds a new era of extremely precise wafer geometry measurement.WATOM supports quality assurance throughout the wafer manufacturing process, starting at the very beginning and continuing on through to wafer reclaim.The WATOM Edge and Notch Wafer Geometry Analyser sets the worldwide benchmark for the quality assurance of geometrical measurements in semiconductor wafer manufacturing, combining the highest quality standards with top-class service. These high-precision, laser-based edge profile measurement tools are specially designed for optimum integration in manufacturing lines within the semiconductor industry.
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Product
High Temperature Digital Mass Flow Controller
SEC-8000 F/D/E Series
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The SEC-8000F/D/E series can operate in high temperature environments, from 15 ℃ to 120 ℃, for a variety of tasks including semiconductor and compound semiconductor processing.
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Product
Compact Semiconductor Tester
QST4416-FC
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Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST4416-FC is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features facilitates it to test linear & mixed signal IC components which covers a wide range of products like linear, Power management, Opto electronics, digital and mixed signal devices etc.
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Product
3.4 MP Autofocus Low Light USB Camera Board With Liquid Lens
See3CAM_30
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See3CAM_30 is a 3.4MP UVC Compliant, low light, autofocus USB camera with liquid lens. It is a two-board solution with AR0330 CMOS image sensor from ON Semiconductor and USB 3.1 Gen1 type C interface board. See3CAM_30 is a colour camera with S-mount lens holder and does not require any special camera drivers to be installed in the host PC. See3CAM_30 is customizable and it is a Ready-to-Manufacture camera with all the necessary firmware built in and compatible with the USB Video Class (UVC). It consumes less power and doesn't heat up. There is no mechanical movement like in VCM motor for autofocus. Hence the life of the lens increases.
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Product
Automated Test Equipment
test
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
DC Bias Injector
J2130A
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When using the network analyzer to measure impedance, such as the capacitance and ESR or a capacitor, or the DCR of an inductor, etc., it is often necessary to provide a voltage bias to the device being tested. This is true of semiconductor junction capacitances, varactors, and some ceramic capacitors (especially X5R). In these cases the impedance is a function of the DC bias on the device. The Picotest DC bias injector (J2130A) is used for this purpose during impedance measurements.
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Product
Digital Pressure Sensor (For Gas)
DP-0
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Panasonic Industrial Devices Sales Company of America
With the DP-0 Series, Panasonic launches a new digital Pressure Sensor which focuses on very simple operation. This Pressure Sensor has been developed especially for the electrical and electronic, semiconductor and auto-assembly industry, but can be also used in the biomedical industry (laboratory automation), where simplicity and performance are key objectives.Compared to the DP-100 series, which features a multitude of functions, the DP-0 Series has been designed to make configuration fast and simple.
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Product
Measuring & Analysis Equipment
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Quality management for semiconductor manufacturing processes and liquid crystal panel manufacturing processes, which require nano-order precision. Oxygen analyzers used in firing furnaces and N2 reflow ovens.Water quality meters used to monitor the water quality of plant discharge and the pure water used in semiconductor manufacturing processes.Our measuring and analysis equipment is used in a wide range of fields.
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Product
Mixed Signal Test Systems
MTS1010i
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The MTS-1010i is a more economical version of the MTS-2010i & MTS-1020i testers. It has a reduced platform size and reduced power supplies. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process.
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Product
Dissolved Ammonia Delivery System
DI-NH3
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MKS' DI-NH3 is a compact, stand-alone system providing dissolved ammonia water. With Semiconductor 3D IC architectures using new materials like Cu-Co and Si-SiGe, the ability to wet clean with precise alkaline chemistries is growing in frequency and importance. The DI-NH3 delivers dissolved ammonia, providing optimal cleaning capability in an alkaline chemistry, minimizing material loss and contamination and inhibiting Electrostatic Discharge (ESD). Using closed-loop control, conductivity and pressure are kept stable under changing flow conditions. The dissolved ammonia concentration is monitored and adjusted, delivering the specific NH4OH concentration needed. Dissolved ammonia’s alkaline chemistry provides ESD protection during rinsing, particle lift-off, and residual photoresist removal in middle-of-line (MOL) and prevents corrosion of cobalt/copper interfaces.
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Product
Mercury Probes
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Materials Development Corporation
MERCURY PROBES are precision instruments that enable rapid, convenient, and non-destructive measurements of semiconductor samples by probing wafers with mercury to form contacts of well-defined area.
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Product
USB Stereo Camera For NVIDIA GPU
TaraXL
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TaraXL is a USB Stereo camera which is optimized for NVIDIA® Jetson AGX Xavier™/TX2 and NVIDIA GPU Cards. TaraXL's accelerated Software Development Kit (TaraXL SDK) is capable of doing high quality 3D depth mapping of WVGA upto 60fps. This 3D stereo camera is based on MT9V024 stereo sensor from ON Semiconductor.
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Product
Package Inspection Products
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Image quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.
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Product
Impact Series Power Discrete Semiconductor Tester
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The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
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Product
Laser Head
5517FL
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The Keysight 5517FL is used primarily in VME and PC based laser interferometer systems where the velocity of motion is faster, such as semiconductor lithography and flat panel applications. Please contact Keysight for custom requirements.
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Product
Kelvin Contact Spring Probes
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We have spring probes for Kelvin contact, which best suits to use for sensitive and extremely precise test. It is used by contacting to one terminal of semiconductor by two probes. We have 0.3, 0.4 and 0.5mm pitch probe for Kelvin contact.
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Product
Moisture Analyzer
5800
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The 5800 is ideal for high-purity gas production, semiconductor gases, and the production, storage and transmission of olefins. It is suitable for use in industries including hydrocarbon processing, industrial gas and semiconductors.
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Product
Calibration Services
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For over 25 years, OAI (Optical Associate Inc.), is the leader in NIST traceable calibration of instruments for measuring Ultra Violet (UV) light. Originally designed to meet the demanding needs of the semiconductor wafer fabrication industry, OAI developed the most repeatable NIST traceable calibration in the industry.
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Product
PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope
780319-03
Oscilloscope
1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Product
Analytical Probe Station with Laser Cutting System
LCS- 4000 Series
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The LCS-4000 Probe Station with Integrated Laser Cutting System gives the user maximum flexibility in semiconductor diagnostic cutting, failure analysis, trimming, marking and topside layer removal. All of these functions can be performed on a microscopic level, all on this one system which provides a high level of performance that is remarkably easy to use.
