-
Product
Pharmaceutical Analyser
RA802
-
The RA802 Pharmaceutical Analyser is a compact benchtop Raman imaging system designed exclusively for the pharmaceutical industry. It rapidly determines API/excipient domain statistics enabling you to formulate tablets more efficiently. With Renishaw's LiveTrack™ focus-tracking technology, the RA802 can efficiently analyse uneven, curved, or rough surfaces at incredible speeds and without any sample preparation. Look at tablets, powders, granules and liquids in their original form.
-
Product
Impact Test Apparatus
IT-50
-
Impact test is an essential physical test prescribed in many standards to test samples for mechanical shock. It is designed to perform such tests. The test is carried out to ensure that the test items have adequate mechanical strength to withstand the stresses and rough handling imposed during installation and use. It is adapted to test various types of electrical accessories such as switches, sockets, plugs, starter seats and other electrical appliances.
-
Product
Surface Roughness Tester Profilometer
TIME®3231
-
Beijing TIME High Technology Ltd.
TIME® 323X series is advanced high-end surface roughness measuring instruments with wide testing range (±400µm) and high accuracy (tolerance±5%, repeatability 3%). Meanwhile, TIME® 323X surface roughness tester features with skidless/skid measurement, which means it can reach smaller and harder to reach parts than other conventional tools.
-
Product
Model A8: All-Purpose Moisture Meter
N/A
-
Designed for flat, curved, smooth, or rough surfaces such as cones or beams of yarn, rolls or stacks of paper or paperboard. Covers 3" a diameter (7.6mm) and penetrates 3/4" (1.9cm). Reliable, long battery life. Includes a rechargeable battery, carrying case, and operating instructions book.
-
Product
Integrating Spheres
-
Artifex Engineering GmbH & Co. KG
We offer integrating spheres made from a special polymer suitable for the wavelength range 250nm – 2.5 µm. For longer wavelengths in the range 700nm – 20 µm, a gold coating on a rough, metallic surface is used. Since lasers in this spectral range are usually also high power, we use solid copper as a thermally conductive substrate material. By choosing the size of the integrating sphere, the overall sensitivity of the system can be adjusted. In addition, the detector is independent of inhomogeneities in power density and polarization. The detector is also independent of the incidence location and angle of the laser radiation.
-
Product
Wafer Thickness Measurement System
MPT1000
-
Laser based Wafer Thickness and Roughness Measurement System designed by Chapman Instrument Inc., USA and OEM by Creden Mechatronic Sdn Bhd. A non-contact measurement system measures several parameters in a single system. (wafer & tape thickness, roughness, TTV, bump height, bow and warp measurements)
-
Product
High Voltage Probe, 100:1, 3.7 KVpk, 500 MHz
10076C
-
The Keysight 10076C 3.7 kVpk, 100:1 passive probe gives you the voltage and bandwidth you need for making high-voltage measurements. Its compact design makes it easier to probe today's small power electronics components, and its rugged construction means it can withstand rough handling without breaking.
-
Product
Surface Texture And Contour Measuring Instruments/Systems
-
We provide high performance, easy-to-use systems from highly efficient hybrid types that can measure the surface roughness and the contour in one trace, to portable types that can be used even on the production site.
-
Product
Optical CMM Systems
-
Our OmniLux metrology system is highly versatile and provides unparalleled levels of 3D CMM capture for component measurement in seconds. This high precision non contact, metrology system is extremely versatile because it measures components of any geometry and of any material. Geometries possible include: spheres, asphere, cylinder, internal bore, cone/taper, step height or freeform in any material such as polished or rough metals or ceramics and polymers. The Omnilux is fast and accurate because, unlike direct contact sensors, the use of optical sensors means that the whole surface can be analysed while the object is suspended in space, ensuring that no damage comes to delicate surfaces. Our easy-to-use software interface, developed from years of experience enables the operator to effortlessly control the system. Rich data analysis, automation and export of results for the immediate generation of reports as well as a compact footprint means OmniLux is the leading solution for production or R&D environments where reducing cycle times is critical to sustainable success.
-
Product
Surface Roughness Gage
1000
-
The Adcole Model 1000 represents the state of the art in surface roughness measurement for crankshafts, camshafts and other cylindrical components. The machine is pre-programmed for optimized workflows. Operators simply need to load and unload the parts. In addition to its unprecedented accuracy, this product is also the fastest system for taking critical surface measurements.The base gage is a rugged, self-standing horizontal granite surface plate with affixed headstock, tailstock and carriage. Scanned data is immediately available for review on the touchscreen monitor or printing.
-
Product
Rope Testers
-
The LMA Signal measures loss of metallic cross-sectional area (LMA) caused by corrosion, abrasion, etc. The LMA Signal is quantitative and can be calibrated. (Typically, a rope must be retired when the LMA exceeds 10%).The WRR Signal measures wire rope roughness (WRR). WRR is defined as the aggregate surface roughness of all wires in a rope. WRR is typically caused by and indicates internal and external corrosion pitting, broken wires and clusters of broken wires. The WRR signal is quantitative, and it is calibrated together with the LMA Signal.The LF Signal can indicate localized flaws (LF), for example, broken wires, corrosion pitting, etc. Because it is only qualitative - and cannot be calibrated - it is of limited value for assessing rope deterioration and for making rope retirement decisions.
-
Product
Benchtop 3D Optical Profilometers
-
Compact, non-contact metrology instruments used for high-precision, sub-nanometer to micrometer-level measurement of surface topography, roughness, and step heights.
-
Product
Portable Hydrostatic Hose Tester, 15000 psi; USMC
9901HT-8762
-
The 9901HT-8762 Hydraulic Hose Test System is utilized by the United States Marine Corp. for their portable forward base maintenance stations. The system includes it's own onboard "quiet" air compressor and a set of 37 degree flared test adapters from 3/16" through 2" as well as an onboard calibration gauge and pneumatic castors for use on rough terrain.
-
Product
Sound Quality Evaluation Function for O-Solution
OS-0525
-
The sounds generated from the equipment are mainly measured by evaluation based on general analysis such as sound pressure level, FFT analysis and 1/3 Octave analysis. However, since those analysis don’t take into consideration the human hearing characteristics enough, sounds with even the same analysis result may give different impression.When a human listens to a sound, various sensations such as loudness, sharpness, and roughness occur.
-
Product
Profilometer
MicroCam™
-
MicroCam™ fiber-based optical non-contact 3D profilometers deliver: High-Speed Non-Contact Surface and Cross-Sectional Inspection 3D Online Measurements, GD&T and Imaging Long Stroke Profilometry with Sub-Micron Resolution Thickness, Roughness and Vibration Measurements Fiber-based Probes which reach into Bores, Tubes, and Crevices
-
Product
Metal InspectionSystems
-
Metal surfaces must undergo a reliable inspection, because defects impair the functions of steel tubes or medical engineering products. Relying to the often appearing strong structures of such surfaces, special robust vision techniques are needed to make, for example, geometric measurements. Our systems are prepared to provide a fully automated, 100 % inspection rate in a rough industrial environment.
-
Product
Substrate Thickness, Warp, and TTV Measurement
413 Series
-
Substrate Thickness, Warp, and TTV Measurement- with or without Tape- for Wafer Backgrind and Etch Thinning processes.Non-contact Echoprobe Technology.Thin film and surface roughness options.
