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Si
atomic number 14 tetravalent metalloid chemical element.
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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High Purity Germanium (HPGe) Radiation Detectors
Semiconductor based photon radiation detectors have been evolving for over half a century, with ORTEC pioneering commercial availability for a majority of that time. Initial offerings were based around lithium-drifted germanium Ge(Li) and lithium-drifted silicon Si(Li). Ge(Li) was later replaced with more advanced, high purity germanium (HPGe) detectors. ORTEC provides a comprehensive suite of HPGe detector solutions covering an extensive range of energies and for a variety of applications.
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Electrical Calibration
Trescal provides full Electrical Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Electrical Calibration services can be delivered at your site or at our lab. Accreditations for our electrical calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Spectrometer
VIS-NIR
Wavelength range is 420 nm to 1100 nm with 4 nm resolutionHD Volume Phase Holographic GratingBack-thinned Si CCD with low noise electronicsExtreme low stray light and high transmissionShort acquisition time and high SNR spectraTEC cooling option availableBluetooth option availableFiber coupled or free spaceOEM Solution
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EMC Calibration
Trescal provides full EMC Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. EMC Calibration services can be delivered at your site or at our lab. Accreditations for our emc calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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MPI PCB Probe Systems
MPI Advanced Semiconductor Test
Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.
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Seismometers
SI value, the so called “velocity response spectrum”, is one of the standards to express an earthquake''s destructive power against structures. SW-74SI is an advanced model equipped with alarm output to 10-step and SI value output.
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Velocity Calibration
Trescal provides full Velocity Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Velocity Calibration services can be delivered at your site or at our lab. Accreditations for our velocity calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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FCB Probe Card
The FCB Probe Card is the most mature technology of buckling beam probe card. It is aimed to achieve the semiconductor ship manufacture time-to-market (TTM) and cost of test (COT) demand. FCB is a proven solution for a variety of semiconductor production tests from early engineering pilot-runs to high volume manufacturing (HVM). FCB is ready for device requiring high signal integrity probing (SI) and/or power integrity probing (PI). Applications include cutting-edge SiPs/SoCs, WLP, graphic processors, micro processor, industrial microcontrollers, and more. FCB guarantees the world’s best overall cost-of-ownership (COO) for various DUT applications.
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Humidity Calibration
Trescal provides full Humidity Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Humidity Calibration services can be delivered at your site or at our lab. Accreditations for our humidity calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Scanning Slit Beam Profilers
DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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AAA Solar simulator
SS50AAA-PLC
Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs) ■Gallium aluminum arsenide (GaAlAs) ■Gallium indium phosphite (GaInP)
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Lux Meters
Lux meter is used for measuring illuminances in work places.The lux is the SI unit of illuminance and luminous emittance. It is used in photometry as a measure of the apparent intensity of light hitting or passing through a surface.
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Volume Calibration
Trescal provides full Volume Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Volume Calibration services can be delivered at your site or at our lab. Accreditations for our volume calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Process EDXRF Spectrometer
NEX LS
Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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Magnetic Calibration
Trescal provides full Magnetic Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Magnetic Calibration services can be delivered at your site or at our lab. Accreditations for our magnetic calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Temperature Calibration
Trescal provides full Temperature Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Temperature Calibration services can be delivered at your site or at our lab. Accreditations for our temperature calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Voltage and Current Measuring Technology
HIGHVOLT Prüftechnik Dresden GmbH
Designed for the measurement of alternating current (AC), direct current (DC), lightning (LI) and switching (SI) impulse high voltages (HV) as well as AC and impulse high current (HC) according to IEC 60060, IEC 61083 and IEC 60052, available as indoor and outdoor design.
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Accelerometry Calibration
Trescal provides full Accelerometry Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Accelerometry Calibration services can be delivered at your site or at our lab. Accreditations for our accelerometry calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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AC Insulation Testing
Weshine Electric Manufacturing Co., Ltd
High-voltage Dividers (High Potential Divider) are used to measure voltages and decouple partial discharges in high-voltage test systems. Depending on the specific type, they are used to measure alternating voltage (AC), direct voltage (DC), lightning impulse voltage (LI), and switching impulse voltage (SI) systems. High-voltage dividers by HIGHVOLT comply with the relevant IEC standards. The systems are available for both indoor and outdoor use.
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RF Front-end
The RF integrated passive device (RF IPD) uses a high-resistivity substrate to integrate quality factor components such as capacitors and indictors. Many functions like impedance matching networks, harmonic filters, couplers, baluns, and power combiners/splitters can be designed using IPD technology. ST's IPDs are manufactured using thick film and HiRes Si or glass wafer manufacturing technology and photolithography processing.
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Mass Calibration
Trescal provides full Mass Calibration services that are accredited and/or certified in accordance with ISO/IEC 17025. Mass Calibration services can be delivered at your site or at our lab. Accreditations for our mass calibration service guarantees calibration results are traceable to the International Systems of units (SI) through NIST or NRC.
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Solar Radiation Sensors
The silicon solar radiation sensor (Si) sensor provides an inexpensive but yet robust and reliable solution for measuring the solar irradiance specifically for the monitoring of photovoltaic (PV) systems. Due to the structure of the sensor element, which corresponds to a PV module, these sensors are ideally suited as a reference for the monitoring of PV systems to determine the solar radiation.
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Automated I-V/AOI/EL and Sorting System
OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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Semiconductor Metrology Systems
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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General Purpose Geiger Counter
Radalert® 100X
The Radalert® 100X is a general purpose geiger counter that measures alpha, beta, gamma, and X-radiation. Features of the Radalert® 100X, include a three-second update and a Utility Menu that allows you to change the default settings for several operating parameters. Its digital liquid crystal display (LCD) shows the current radiation level in your choice of SI units (microsieverts per hour) from .000 to 1,100 and counts per minute (CPM) from 0 to 350,000 or counts per second (CPS) from 0 to 3,500. For users of conventional units mR/hr (milliroentgens per hour) from .000 to 110 and CPM are optional in the Utility Menu. This instrument also offers an accumulated total and timer function, up to 9,999,000 counts and 40 hours.
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KV CAPS
500 V
Macom Technology Solutions Holdings Inc.
The MACOM KV CAPSTM Si high voltage capacitors feature very high working voltage ratings, very low loss and excellent stability by virtue of their novel internal construction and very high-quality dielectric layers. These capacitors are available as unpackaged chips. The chips have gold bonding surfaces on both terminals to enable excellent bonding and minimum contact resistance.
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General Purpose Radiation Survey Meter/Geiger Counter
Rad 100™
The RAD 100™ is a general purpose radiation survey meter/geiger counter that detects and measures alpha, beta, gamma, and X-radiation. It is intended for personal safety and educational purposes. Like the popular Radalert® 100X, the RAD 100™ features a 3-second update on its digital liquid crystal display (LCD). The LCD shows the current radiation level in your choice of microSieverts per hour (SI units) or mR/hr for gamma radiation measurements. For mixed sources (alpha, beta, gamma) the CPM mode is recommended. This instrument also offers an accumulated total and timer function, up to 9,999,000 counts and 40 hours. A red LED blinks and a beeper chirps with each count (the chirp can be muted). This is a professional instrument that is also easy to learn to use and to operate, and carries the industry leading Medcom warranty (2 years overall limited to 1 year on the GM sensor). Many instruments designed by the Medcom team are still working perfectly after 30 years of use, so this instrument should provide a lifetime of useful information.
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Resister
Our ARFC type Film Flat Chip Resistor & ARFCN type Thin Film Chip Resistor Network are high precision Metal Film resistors produced with high purity. Alumina Substrate and Ni-Cr-Si Resistor Film based on high precision Etching Technology. The electrode Terminals are made with Spattering Film and Nickel-Solder Plating, and solderability is very good in all Flow, Reflow and Dipping type soldering for Hybrid IC, SMT, PCB etc. Our ARFC Metal Film Resistor & ARFCN type Thin Film Chip Resistor are being produced under the thorough quality control, and are being used widely in high precision and high reliability electronics circuit such as Measuring Instrument, Medical Instruments, Communication and other Industrial Instruments.
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NRZ Analysis for Signal Integrity Studio, WavePulser 40iX High-Speed Interconnect Analyzer
WAVEPULSER-SI-STUDIO-NRZ
Signal Integrity (SI) Studio uses SDA Expert (SDAX) serial data analysis software options to simplify NRZ or PAM serial data jitter, eye diagram, noise and crosstalk measurement and analysis setup.
