Picoprobe
Line of microwave and oscilloscope probes, has served the on-wafer probing needs of the worldwide semiconductor industry, beginning with a line of high impedance troubleshooting probes for diagnostic studies of the internal workings of complex logic and memory chips.
- (239) 643-4400
- 239 643-4403
- email@ggb.com
- 4196 Corporate Sq
Naples, Fl 34104
United States of America
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Product
Microwave Testing
500B
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The Model 500B Picoprobe sets new® standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 500B Picoprobe achieves an insertion loss of less than 4.0 db and a return loss of greater than 15 db over its frequency range (see accompanying data).
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Product
Microwave Testing
140
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The PICOPROBE® MODEL 140, a high performance microwave probe which incorporates a WR-8 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
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Product
Microwave Testing
40A
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The GGB Industries, Inc., MODEL 40A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 40A achieves an insertion loss of less than 0.8 db and a return loss of greater than 18 db through 40 GHz.
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Product
Microwave Testing
50
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The MODEL 50 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 50 Picoprobe®, with or without the bias T option, achieves an insertion loss of less than 0.8 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
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Product
Calibration Substrates
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The GGB Industries, Inc., line of CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe® at the probe tip. The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected
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Product
Probe Cards
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PICOPROBE® PROBE CARDS by GGB Industries, Inc., allows for more chip design flexibility because each probe card is custom configured to your circuit for testing wafers on either manual or automatic probe stations. Probe cards with complex layouts consisting of numerous DC contacts and multiple microwave probes with operating frequencies of 40, 50, 67, or 110 GHz can be custom fabricated quickly and inexpensively.
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Product
Integrated Balun Probes
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This is an example of a 900 MHz Integrated Balun Probe. It incorporates a 50 ohm unbalanced to 200 ohm balanced differential transformer. The probe can be built with or without a center tapped ground needle and may also incorporate DC bias through the differential pair or via separate needle contacts.
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Product
Dual Microwave Probe
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The PICOPROBE® DUAL MICROWAVE PROBE consists of two separate probes mounted on a single holder. One probe is fixed to the holder; the other is adjustable. Each probe may be individually configured with GSG, GS, or SG footprints having any fixed pitch from 50 to 2540 microns. The probe to probe (signal to signal) spacing is user adjustable over a 4000 micron (160 mil) range. When ordering, an initial signal to signal spacing should be specified (up to .75 inches).
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Product
Microwave Testing
1100B
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The Model 1100B Picoprobe sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics.
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Product
Solid Tungsten Probe Tips
ST Series
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The ST SERIESof probe tips, available from GGB Industries, Inc., are precision crafted from a 0.020 inch (0.51mm) diameter solid tungsten shaft that is electrochemically sharpened to a specified point. These durable, 1.5 inch long solid tungsten shaft probe tips are for use in most standard micropositioners when probing an integrated circuit, pad, or line. A variety of radius point sizes from 0.5 microns to 10 microns are available to accommodate any probing need.
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Product
Microwave Testing
10
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PICOPROBE® MODEL 10 is a multipurpose, high speed, passive probe which can be used for driving as well as receiving signals. The Model 10 consists of a one meter length of flexible 50 ohm coaxial cable terminated by a carefully trimmed SMA on one end and by a miniature, high speed 50 ohm connector, specially developed to receive Model 10 replaceable coaxial probe tips, on the other. The 50 ohm coaxial cable was custom designed for Model 10 to be high speed, yet very flexible, so that moving the cable would not disturb the probe points.
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Product
Multi-Contact Wedge
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The GGB Industries MULTI-CONTACT WEDGE allows for more chip design flexibility because it is custom configured to your circuit. Four Wedges can be used at the same time to probe a complete chip.
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Product
High Impedance Active Probes
34A
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Engineered to meet the stringent demands of advanced high frequency circuit designers. This high impedance probe combines full DC capability, rise/fall times of 120 ps, and a nominal loading input impedance of 10 megohm shunted by 0.1 pf. Signal attenuation is 20:1 with a 50 ohm oscilloscope input.
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Product
Microwave Testing
220
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The PICOPROBE® MODEL 220, a high performance microwave probe which incorporates a WR-5 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
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Product
High Impedance Active Probes
12C
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A high speed, high input impedance active probe for measuring the internal node voltage of integrated circuits. The input is 1 megohm shunted by 0.1 pf and the rise/fall times are 0.8 ns. This instrument has full dc capability and can be used with any oscilloscope. The Model 12C was specially designed so that when used in conjunction with a high input impedance oscilloscope, signal attenuation is 10:1 and with a 50 Ohm input, signal attenuation is 20:1.
