Picoprobe
Line of microwave and oscilloscope probes, has served the on-wafer probing needs of the worldwide semiconductor industry, beginning with a line of high impedance troubleshooting probes for diagnostic studies of the internal workings of complex logic and memory chips.
- (239) 643-4400
- 239 643-4403
- email@ggb.com
- 4196 Corporate Sq
Naples, Fl 34104
United States of America
Categories
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product
Microwave Testing
67A
A coplanar probe with patented flexible tips, the MODEL 67A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 67A achieves an insertion loss of less than 1.1 db and a return loss of greater than 14 db through 67 GHz.
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High Impedance Active Probes
18C & 19C
High impedance probes, PICOPROBE® MODEL 18C and MODEL 19C, combine the most advanced MOS and bipolar technologies with special, low capacitance packaging techniques to achieve truly remarkable electronic measurement capabilities. While being manufactured each instrument is individually optimized for the best possible performance. The extremely low input capacitance, high input impedance, and almost negligible input leakage current permits the direct probing of even the most sensitive MOS dynamic nodes. At the same time, the full dc capability of this Picoprobe coupled with the high speed capability permits the full characterization of circuits.
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Microwave Testing
220
The PICOPROBE® MODEL 220, a high performance microwave probe which incorporates a WR-5 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
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Microwave Testing
90
The PICOPROBE MODEL 90, a high performance microwave probe which incorporates a WR-12 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
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Multi-Contact Wedge
The GGB Industries MULTI-CONTACT WEDGE allows for more chip design flexibility because it is custom configured to your circuit. Four Wedges can be used at the same time to probe a complete chip.
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Microwave Testing
140
The PICOPROBE® MODEL 140, a high performance microwave probe which incorporates a WR-8 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
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Microwave Testing
50
The MODEL 50 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 50 Picoprobe®, with or without the bias T option, achieves an insertion loss of less than 0.8 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
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Integrated Balun Probes
This is an example of a 900 MHz Integrated Balun Probe. It incorporates a 50 ohm unbalanced to 200 ohm balanced differential transformer. The probe can be built with or without a center tapped ground needle and may also incorporate DC bias through the differential pair or via separate needle contacts.
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Microwave Testing
1100B
The Model 1100B Picoprobe sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics.
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High Impedance Active Probes
7
Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
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Calibration Substrates
The GGB Industries, Inc., line of CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe® at the probe tip. The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected
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Probe Cards
PICOPROBE® PROBE CARDS by GGB Industries, Inc., allows for more chip design flexibility because each probe card is custom configured to your circuit for testing wafers on either manual or automatic probe stations. Probe cards with complex layouts consisting of numerous DC contacts and multiple microwave probes with operating frequencies of 40, 50, 67, or 110 GHz can be custom fabricated quickly and inexpensively.
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Differential Calibration Substrates
The GGB Industries, Inc., line of DIFFERENTIAL CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe at the probe tip. The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected.
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Microwave Testing
50A
The GGB Industries, Inc., MODEL 50A probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 50A achieves an insertion loss of less than 1.0 db and a return loss of greater than 18 db through 50 GHz.
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Microwave Testing
40M
We have shaved another .35 db insertion loss off of our industry standard MODEL 40A PICOPROBE®.
