Picoprobe
Line of microwave and oscilloscope probes, has served the on-wafer probing needs of the worldwide semiconductor industry, beginning with a line of high impedance troubleshooting probes for diagnostic studies of the internal workings of complex logic and memory chips.
- (239) 643-4400
- 239 643-4403
- email@ggb.com
- 4196 Corporate Sq
Naples, Fl 34104
United States of America
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Product
Microwave Testing
110H
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The PICOPROBE® MODEL 110H is a high performance microwave probe which incorporates our patented coaxial design techniques and has inherent low loss and low dispersion characteristics.
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Product
Calibration Substrates
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The GGB Industries, Inc., line of CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe® at the probe tip. The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected
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Product
Microwave Testing
10
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PICOPROBE® MODEL 10 is a multipurpose, high speed, passive probe which can be used for driving as well as receiving signals. The Model 10 consists of a one meter length of flexible 50 ohm coaxial cable terminated by a carefully trimmed SMA on one end and by a miniature, high speed 50 ohm connector, specially developed to receive Model 10 replaceable coaxial probe tips, on the other. The 50 ohm coaxial cable was custom designed for Model 10 to be high speed, yet very flexible, so that moving the cable would not disturb the probe points.
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Product
Microwave Testing
40M
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We have shaved another .35 db insertion loss off of our industry standard MODEL 40A PICOPROBE®.
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Product
Microwave Testing
90
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The PICOPROBE MODEL 90, a high performance microwave probe which incorporates a WR-12 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
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Product
Microwave Testing
50A
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The GGB Industries, Inc., MODEL 50A probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 50A achieves an insertion loss of less than 1.0 db and a return loss of greater than 18 db through 50 GHz.
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Product
High Impedance Active Probes
12C
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A high speed, high input impedance active probe for measuring the internal node voltage of integrated circuits. The input is 1 megohm shunted by 0.1 pf and the rise/fall times are 0.8 ns. This instrument has full dc capability and can be used with any oscilloscope. The Model 12C was specially designed so that when used in conjunction with a high input impedance oscilloscope, signal attenuation is 10:1 and with a 50 Ohm input, signal attenuation is 20:1.
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Product
Multi-Contact Wedge
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The GGB Industries MULTI-CONTACT WEDGE allows for more chip design flexibility because it is custom configured to your circuit. Four Wedges can be used at the same time to probe a complete chip.
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Product
Microwave Testing
140
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The PICOPROBE® MODEL 140, a high performance microwave probe which incorporates a WR-8 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
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Product
High Impedance Active Probes
28 AND 29
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Designed to serve the needs of integrated circuit engineers working in the most advanced high speed, submicron, MOS technology. These high frequency instruments include the attractive features of the Models 18C and 19 including full dc capability, negligible dc current drain, and extremely low input capacitance. In addition the frequency range of the Models 28 and 29 has been extended to a full 1 GHz.
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Product
Microwave Testing
67A
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A coplanar probe with patented flexible tips, the MODEL 67A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 67A achieves an insertion loss of less than 1.1 db and a return loss of greater than 14 db through 67 GHz.
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Product
Solid Tungsten Probe Tips
ST Series
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The ST SERIESof probe tips, available from GGB Industries, Inc., are precision crafted from a 0.020 inch (0.51mm) diameter solid tungsten shaft that is electrochemically sharpened to a specified point. These durable, 1.5 inch long solid tungsten shaft probe tips are for use in most standard micropositioners when probing an integrated circuit, pad, or line. A variety of radius point sizes from 0.5 microns to 10 microns are available to accommodate any probing need.
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Product
High Impedance Active Probes
18C & 19C
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High impedance probes, PICOPROBE® MODEL 18C and MODEL 19C, combine the most advanced MOS and bipolar technologies with special, low capacitance packaging techniques to achieve truly remarkable electronic measurement capabilities. While being manufactured each instrument is individually optimized for the best possible performance. The extremely low input capacitance, high input impedance, and almost negligible input leakage current permits the direct probing of even the most sensitive MOS dynamic nodes. At the same time, the full dc capability of this Picoprobe coupled with the high speed capability permits the full characterization of circuits.
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Product
High Impedance Active Probes
7A
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An unterminated version, can be used for capacitance and resistance measurements or in low to medium speed signal applications where a 50 ohm termination is not required. A flexible coaxial cable length of 6 feet in length is standard on the Model 7A; however, when used for capacitance measurements, GGB Industries, Inc., recommends using a shorter 3 foot cable. If a shorter length of cable is desired for capacitance measurements, please specify it when ordering (Model 7A-3ft.). Please note that Model 7A uses Model 7 replacement tips.
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Product
High Impedance Active Probes
7
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Designed as a companion probe to Models 12C and 18C for driving integrated circuit lines so the Model 12C and 18C can be used to measure the response of adjacent nodes. The Model 7 consists of a flexible 6 foot, 50 ohm coaxial cable accurately terminated to 50 ohms in order to avoid undesirable reflections. A special miniature connector receives replacement coaxial probe tips that provide a shielded environment to within 3 mm of the fine tungsten probe point, thus minimizing capacitive coupling to other parts of the circuit. The replaceable coaxial probe tips are offered in various point sizes and can also be bent to any shape in order to accommodate a variety of probing geometries.
