Chroma ATE Inc.

Product

TO-CAN Package Inspection System

7925

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Chroma ATE Inc.

7925 - Chroma ATE Inc.

Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.

Product

AC and DC Electronic load

63800 series

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Chroma ATE Inc.

63800 series - Chroma ATE Inc.

The Chroma 63800 Loads can simulate load conditions under high crest factor and varying power factors with real time compensation even when the voltage waveform is distorted. This special feature provides real world simulation capability and prevents overstressing thereby giving reliable and unbiased test results. The 63800's state of the art design uses DSP technology to simulate non-linear rectified loads with its unique RLC operation mode. This mode improves stability by detecting the impedance of the UUT and dynamically adjusting the load's control bandwidth to ensure system stability. Comprehensive measurements allow users to monitor the output performance of the UUT. Additionally, voltage & current signals can be routed to an oscilloscope through analog outputs. The instrument's GPIB/RS232 interface options provide remote control & monitor for system integration. Built-in digital outputs may also be used to control external relays for short circuit (crowbar) testing.

Product

Photonics Module Test System

58625

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Chroma ATE Inc.

58625 - Chroma ATE Inc.

Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.

Product

VLSI Test Systems

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Chroma ATE Inc.

Chroma ATE Inc.

50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P

Product

Single Site Test Handler

3210

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Chroma ATE Inc.

3210 - Chroma ATE Inc.

Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.

Product

IC Pick & Place Handlers

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Chroma ATE Inc.

Chroma ATE Inc.

Chroma's IC test and handler solutions assure that IC packaging meets the original design specifications and verify the performance of the IC before it is assembled into the electronic product.

Product

PXIe High Voltage Device Power Supply - 2 Channels Per Card, 18-bit Voltage Programming Resolution and Measurement Resolution

33021

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Chroma ATE Inc.

33021 - Chroma ATE Inc.

Max. 48V DC output with 2 channels per card, 12V-48V independently Programable voltage level, Max. 250mA current per channel

Product

High Speed PXIe Digital IO Card - 32 Channels, Extendable up to 256 Channels in One Chassis

Model 33010

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Chroma ATE Inc.

Model 33010 - Chroma ATE Inc.

Chroma 33010 is a high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO Card consists of a Sequencer Pattern Generator (SQPG) and 32 Channels of fill ATE-like features. The 33010 IO card is expandable up to 356 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.

Product

Battery Pack Power HIL Testbed

8610

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Chroma ATE Inc.

8610 - Chroma ATE Inc.

Chroma ATE launches the 8610 Battery Pack Power HIL Testbed for testing battery systems and components of new energy vehicles, incl. the battery module, battery management system, and cooling/heating system. Various hardware options are available for integration, such as a DC power supply, battery charge/discharge system, digital meter, Hi-Pot tester, and short-circuit and overvoltage protection devices.

Product

LCM Tester

Model 27012

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Chroma ATE Inc.

Model 27012 - Chroma ATE Inc.

To meet the high accuracy and low price requirements for LCM TV test device, Chroma 27012 that integrates the signal and power source provide a complete test solution for LCD Module. Its LVDS, TTL (Option) signal source fully complies with the digital signal standard, meanwhile with the 24V, 12V, 5V, 3.3V DC source output it is able to supply power to VDD, Backlight for LCM test without obtaining external power source. Equipped with the interface of single key to switch the Timing, Pattern and Program rapidly for test in auto or manual mode, the 27012 is able to provide a direct and convenient test environment for LCM TV by its complete hardware configuration and easy operation.

Product

PXIe Short SMU

52403P

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Chroma ATE Inc.

52403P - Chroma ATE Inc.

Chroma's 52403P is a PXI Express Short Pulse SMU (Source/Measure Unit) designed for fast, precise and reliable sourcing and measurement of thermo-sensitive devices such as high-power laser diodes (LD). Integrating a high-speed pulser, a high precision SMU and a DAQ module into a single PXIe SMU, the 52403P can measure both the LIV and the low-level leakage current of a high-power LDs.

Product

Multi-Channel Power Module

67394

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Chroma ATE Inc.

67394 - Chroma ATE Inc.

The 67394 Multi-Channel Power Module is a new generation of compact, stable and high reliability AC to DC power supply that can test the small size panels. It has multiple power sources with voltage/timing adjustable functions, protection functions and measurement circuits. Its modular design can work with FPD tester and PG card to provide standard power source for testing the panels.

Product

Automated Optical Inspection Solutions

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Chroma ATE Inc.

Chroma ATE Inc.

Adjustable criteria for different process application or modelFlexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cellsMultiple interface to communicate with manufacturing equipment or information systemVarious defects inspection capability from multilayer LED lighting designFlexible design that can be easily integrated to your in-line printing system and sorting system

Product

Solar Array Simulator

62000H-S series

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Chroma ATE Inc.

62000H-S series - Chroma ATE Inc.

The latest programmable solar array simulator power supply 62000H-S Series released by Chroma provide simulation of Voc (open circuit voltage) up to 1800V and Isc (short circuit current) up to 30A. The 62000H-S provides an industry leading power density in a small 3U high package. The solar array simulator is highly stable and has a fast transient response design, which are both advantageous to MPPT performance evaluation on PV inverter devices. The 62000H-S Series have many unique advantages including high speed & precision digitizing measurement circuits with a 100kHz A/D, 25kHz D/A controlled I-V curve and a digital filter mechanism. It can simulate an I-V curve accurately and response the mains ripple effect from the PV inverter. In addition, the built-in EN50530/Sandia SAS I-V model in the standalone unit can easily program the Voc, Isc, Vmp, and Imp parameters for I-V curve simulation, without a PC controller.

Product

Package Level Test

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Chroma ATE Inc.

Chroma ATE Inc.

Applicable for burn-in, reliability andlife testingACC and APC control modesIndividual channel driving and measurementDriving current 500mA per channel