Langer EMV-Technik GmbH
Langer EMV-Technik GmbH is a medium-sized electro-technical company which is active in the field of electromagnetic compatibility-related
- +1 888 687 5 687
+49 (0) 351 430093-0 - +49 (0) 351 430093-22
- mail@langer-emv.de
- sales@langer-emv.de
- Nöthnitzer Hang 31
Bannewitz, D-01728
Germany
Categories
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Optical Signal Transmission
Analog
Used for oscillographing analog signals under EFT/EDS/RF interference.
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Near Field Probes 30 MHz up to 3 GHz
RF2 set
The RF2 near field probe set consists of 4 passive near field probes for measurements in the development phase of the magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF2 set allow the step by step localization of interference sources of the RF magnetic field on assemblies. From greater distances the electromagnetic interference can be detected by RF-R 400-1 and RF-R 50-1 probes. The RF-B 3-2 and RF-U 5-2 probes with their higher resolution can more precisely detect the interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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Accessory EFT/Burst generators IEC 61000-4-4
The field sources and the burst transformer are used to harden the device under test. They are powered by an EFT/burst generator.
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Near Field Micro Probes ICR HH H Field
The measuring coil is horizontally located in the probe head. The near field micro probes are operated with a positioning system (Langer Scanner).
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MP CI set
The MP CI set up to measure coupling impedance is used to determine EMC characteristics of connectors and cables. The coupling inductivity defines the coupling inductance of external disturbance on the shield or on the ground with the desired signals. If the coupling inductivity is considered in the construction set-up and the pin or wire assignment of connectors or cables, then the connectors or cables will be more interference-resistant. The MP CI set-up for measuring coupling impedance can be used for following measurements at connectors or cables: 1. measurement of a single signal (common mode) 2. measurement of a symmetrical signal (common mode) 3. measurement of a symmetrical signal (differential mode)
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Immunity Development System
Used for EMI suppression in printed circuit boards during the development phase. The developer can use the E1 set to quickly identify the causes of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken.
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Measurement Technology for Teaching and Training
Is particulary suitable for training and further education. With the disturbance emission model, a variety of different experiments which improves one`s understanding of electromagnetic processes in modern electronic engineering are possible. The coupling mechanisms of disturbance emissions are visualized from their sources to the antenna. The impacts of EMC measures are then easier to understand. At VM 251 the electromagnetic d
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Measuring and Calibration Stations
PCB
Is used to measure electric and magnetic fields of an ESD generator
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Immunity
RF coupling
is used for the conducted measurement of the immunity according to IEC 62132-4.
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IC EMC Analysis
We carry out standard measurements according to BISS/IEC and analysis of the interference immunity and interference emissions of ICs during development.With the targeted EMC analysis, we uncover weak points in the ICs so that the IC developer can use them to develop improvements for the product
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H-Field Burst Detector
BD 11
The BD 11 is used to detect a burst or ESD current pulse on a cable, for example in a complex system. This makes it easier to investigate the causes of sporadic faults in the system. It is small and handy, its sensitivity is very high and continuously adjustable.
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Near Field Probes
MFA Family
The micro probes allow detailed measurements of high-frequency magnetic fields in the layout, at the smallest SMD components(0603-0201) and at IC pins of printed circuit boards.
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Near Field Probes 30 MHz up to 6 GHz
XF1 set
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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MP field sources calibration set
The MP field source calibration set is used to measure electric or magnetic fields in a frequency range up to 3 GHz. RF fields or transient fields can be measured. The MP field source calibration set is used to check fields of the Langer EMV-Technik GmbH field sources, fields of TEM cells and IC striplines.
