Applied Image, Inc.
APPLIED IMAGE Inc. is a world leader in the design and manufacture of precision-imaged optical components intended for a wide range of applications and industries that require NIST-traceable standards and/or precision-imaged components to test, calibrate, align, control or measure their optical or photonics systems. In addition to its large catalog of standard products, APPLIED IMAGE specializes in designing and manufacturing custom components, imaged to the strictest tolerances. Its mission is to provide the highest-quality products and customer service to consistently meet and exceed the expectations of its customers such as NASA (Mars Rover) and Goddard (International Space Station).
- (585) 482-0300
- (585) 288-5989
- info@appliedimage.com
- 1653 East Main Street
Rochester, NY 14609
United States of America
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Product
Reticles, Optical Slits, Optical Apertures
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With over 30 years of experience in the manufacturing of high precision Reticles, Slits, Apertures, and Pinholes, APPLIED IMAGE has gained a reputation for delivering precise and accurate parts. We have supplied thousands of these parts to be used in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
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Product
EIA Test Charts
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EIA Test Charts by Applied Image - EIA Halftone Gray Scale Chart, EIA Video Resolution Pattern
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Product
O.E.M. Optical Standards
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O.E.M. Optical Standards by Applied Image - Boston Scientific Checkerboard Array, Cognex Glass Calibration Plate Set
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Product
Reticles / Graticules
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With over 30 years experience in the manufacturing of high precision Custom and Standard Reticles for a wide range of applications, APPLIED IMAGE has gained a reputation for delivering precision and accuracy parts on time. Using our state of the art technology, our components are the most precise in the industry. Applications of this technology is useful in Day/Night Sights, Binoculars, Targeting Systems, Telescopes, Tank Sights, Microscopes, and many other Bore-Sight devices.
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Product
Image Analysis Micrometers
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For calibrating and analyzing microscopy measurement systems, the IAM line of Image Analysis Micrometers are perfectly suited. Calibrated to NIST Standards, and imaged with the best line edge quality in the industry, the IAM series is a diversified line of slides that function in areas of color calibration (IAM-9C), Optical Magnification, Frame Distortion, and other applications. Custom features, substrates, sizes and designs are available as custom solutions.
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Product
Custom Optical Components and Standards
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With the amount of applications that optical components have, no one could hope to have the perfect component for every possible scenario. For this reason, APPLIED IMAGE makes easy the process of designing, building, and delivering custom components to our customers. Our engineering process is designed to produce the best parts in the industry and more importantly, the best component for your specific needs. The APPLIED IMAGE experience will cover the project with expert engineers from start to finish. Use the form below to start the conversation for checkerboard and dot arrays, stage and image analysis micrometers, reticles and machine vision components.
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Product
FBI / MITRE Test Charts & Kits
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FBI / MITRE Test Charts & Kits by Applied Image - FBI SIQT Scanner Test Chart, Individual Personal Identity Verification Test Charts for Single Fingerprint Capture Devices, Personal Identity Verification Kits for Single Fingerprint Devices
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Product
SINE M-19 Sinusoidal Array
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The Sinusoidal Array SINE M-19 is a remarkable new test array that achieves 256 cycles per mm while maintaining a significant modulation. It is designed for testing high resolution optical systems such as microscopes. Because its maximum width is 7.5mm, the SINE M-19 is small enough to fit easily onto a standard microscope slide (the TM-G variation is mounted in glass).
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Product
SINE M-6 Sinusoidal Array
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The Sinusoidal Array SINE M-6 contains the same gray scales and sinusoidal areas as the M-5 but is arranged in a shorter and wider format, making it particularly useful when the complete array is to be imaged at one time.The overall size of the array is 70mm x 46mm; centered on an 8.5 inch (215mm) strip of 70mm film, which can also be mounted in glass (TM-G variations) at each modulation (-35, -60, -80).
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Product
AIIM Test Charts (Scanner/Microfilm/Digital/ Copier)
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AIIM Test Charts (Scanner/Microfilm/Digital/ Copier) by Applied Image - Motion-Rotary Target, Planetary-Static Target, Small Area Target/AIIM MS-303-1980, Small Scanner Resolution Target , Copier Test Array, Rotary Test Target/AIIM X113, Film Strip Target, Eastman Kodak Copier/Scanner Digital Test Target, Small Color MTF Target
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Product
SINE Sinusoidal Single Frequency Gratings
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Our SINE Sinusoidal Single Frequency transmittance patterns have proved to be very useful for specialized MTF Measurement as well as for such applications as moirè contouring. They are made on film base material with a nominal thickness of 0.175mm. This material is polyester and tends to be somewhat birefringent. The harmonic modulation values are generally 3% or less.
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Product
ACCUplace Grid Indexing Pattern
AP-G Series
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Ensuring precise motion and positional accuracy is critical for a number of video analysis systems and automated measuring instruments. The AP-G series is ideally suited for calibrating such elements, in addition to its uses in determining stage squareness, and travel distance image analysis and visual inspection systems where precise motion must be calibrated and measured. All AP-G targets have number/letter indexed columns and rows for easy calibration and are offered on four standard materials; Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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Product
Individual UPC Bar Code Standards
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The UPC Verification Calibration standards are a unique set of symbols that assures an exact and reliable primary bar code standard exists for UPC codes based on ANSI X3.182/ISO 15416 methodology. These standards assures that manufactures of verification equipment, scanners, QC labs and end users now have an accurate basis for checking the measurement capabilities of their equipment. These standards are intended as a fundamental calibration tool for an QC program, providing a continuous scale from best to worse case characteristics of each parameter. With complete NIST traceable data supplied, it is ideally suited to those requiring traceability, such as ISO certification. Each symbol is individually calibrated to ANSI X3.182/ISO 15416 standards using a custom built microdensitometer. These cards are supplied calibrated for use with a 6 mil scan aperture and 660nm wavelength. (calibration wit other aperture sizes or wavelengths is available)
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Product
SINE M-15-60 Sinusoidal Array
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The reflective Sinusoidal Array SINE M-15-60 is similar to the M-13-60 (1X version) except that the range of spatial frequencies begins with 0.25 cycles per mm and extends to 20 cycles per mm. To compensate for the additional frequencies, the 3/16 cycles per mm area has been eliminated. Both arrays are imaged on Photo Paper.
