Applied Image, Inc.
APPLIED IMAGE Inc. is a world leader in the design and manufacture of precision-imaged optical components intended for a wide range of applications and industries that require NIST-traceable standards and/or precision-imaged components to test, calibrate, align, control or measure their optical or photonics systems. In addition to its large catalog of standard products, APPLIED IMAGE specializes in designing and manufacturing custom components, imaged to the strictest tolerances. Its mission is to provide the highest-quality products and customer service to consistently meet and exceed the expectations of its customers such as NASA (Mars Rover) and Goddard (International Space Station).
- (585) 482-0300
- (585) 288-5989
- info@appliedimage.com
- 1653 East Main Street
Rochester, NY 14609
United States of America
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Individual UPC Bar Code Standards
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The UPC Verification Calibration standards are a unique set of symbols that assures an exact and reliable primary bar code standard exists for UPC codes based on ANSI X3.182/ISO 15416 methodology. These standards assures that manufactures of verification equipment, scanners, QC labs and end users now have an accurate basis for checking the measurement capabilities of their equipment. These standards are intended as a fundamental calibration tool for an QC program, providing a continuous scale from best to worse case characteristics of each parameter. With complete NIST traceable data supplied, it is ideally suited to those requiring traceability, such as ISO certification. Each symbol is individually calibrated to ANSI X3.182/ISO 15416 standards using a custom built microdensitometer. These cards are supplied calibrated for use with a 6 mil scan aperture and 660nm wavelength. (calibration wit other aperture sizes or wavelengths is available)
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Product
Siemens/RIT/Other Targets
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Siemens/RIT/Other Targets by Applied Image - RIT Alphanumeric Chart, Siemens/Star Sector Target, Resolution 2-Cycle Long Test Chart, Sayce Target, Resolution Linear Test Chart, Ultra-High Resolution Target, Digital/Electronic Pixel Target
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O.E.M. Optical Standards
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O.E.M. Optical Standards by Applied Image - Boston Scientific Checkerboard Array, Cognex Glass Calibration Plate Set
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Square Wave Patterns (Ronchi Gratings/Rulings)
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Square Wave patterns (Ronchi Gratings/Rulings) have extremely sharp edges. At APPLIED IMAGE, this sharpness is achieved through our unique manufacturing capabilities and processing technologies which produces the sharpest edges available anywhere. Our standard line of Ronchi Gratings is offered on Chrome on Glass (CG) and Photo Paper (RM).The Ronchi rulings are available on other substrate materials such as B270, quartz, BK-7, and White Opal as well as in English frequency metrics (cycles per inch).
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Product
O.E.M. Specific Test Charts
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O.E.M. Specific Test Charts by Applied Image - IMATEST SFRPlus Chart, ISA ColorGauge Targets, ISA Device Level Target, ISA Object-Level Target Family, ISA Spatial Frequency Response Target
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Product
IEEE Test Charts (Video /Cine)
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IEEE Test Charts (Video /Cine) by Applied Image - IEEE Video Resolution Chart, Picture Height Test Chart, Microsoft WebCam Image Quality Test, OTTO-2 Otto Nemenz Cine Lens Calibration Reticle
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Robotics and Machine Vision Standards
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Accuracy in machine vision systems is critical to achieving strategic goals regarding quality, efficiency, and consistency. Use our ACCUplace product lines to calibrate vision systems’ distortion, placement/alignment, or other field parameters in systems used for guidance, identification, gauging, and inspection. Using our specialized ACCUedge® technology, our Robotic and Machine Vision Standards are manufactured with line-edge quality that is second to none in the industry, providing the precision needed to calibrate almost any system. Should you need to alter feature patterns, size, or substrate to fit your needs, fill out our Optical Components and Standards form to start the conversation.
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PhotoMASK Services
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For years APPLIED IMAGE has been serving customers who work with semiconductors, displays, PCB, MEMS, along with college professors, researchers, and students with Photomask making solutions tailored specifically to each customer’s needs. Working with a dedicated sales engineer means that you will have all of your questions answered.
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SINE (Sinusoidal) Targets & Arrays
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Sinusoidal Target Arrays have been recognized as a superior test method for a variety of applications, from moiré contouring to reliable MTF Evaluation of materials, lenses, cameras, and electro-optical systems (Follow the hyperlink to learn about using Sinusoids for MTF eval). Sinusoidal Pattern Arrays are manufactured on two different materials for both reflective and transmissive applications. Because of the inherent limitations of reflective materials, the maximum spatial frequency of the reflective pattern arrays is limited to 20 cycles per mm, while the transmission film arrays are offered in various sizes up to 256 cycles per mm. In addition, the sinusoidal arrays are available in a Single Frequency Grating or with Multi-Frequency Gratings. If instead of continuous sinusoidal frequency, you are looking for a square wave frequency design, then look to the Ronchi Gratings page. Should you need to alter the size of the pattern or the substrate, fill out our Custom Test Targets and Charts form and start the conversation.
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Product
SINE Sinusoidal Vision Demonstration Array
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The Sinusoidal Visual Demonstration Array is designed to demonstrate the Modulation Transfer Function (MTF) of the human eye. Its transmittance varies sinusoidally and increases in spatial frequency from 0.2 to 20 c/mm, following a logrithmic scale. The modulation increases linearly from top to bottom. One can see, in the image, where the visual contrast contour disappears which is the MTF of the eye. Ideally suited for teaching and demonstration, the Array is available on film mounted in glass (-G), or mounted in a 2″x 2″ projection slide.(-SL)
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SINE M-6 Sinusoidal Array
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The Sinusoidal Array SINE M-6 contains the same gray scales and sinusoidal areas as the M-5 but is arranged in a shorter and wider format, making it particularly useful when the complete array is to be imaged at one time.The overall size of the array is 70mm x 46mm; centered on an 8.5 inch (215mm) strip of 70mm film, which can also be mounted in glass (TM-G variations) at each modulation (-35, -60, -80).
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NBS Targets
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NBS Targets by Applied Image - NBS-1952 Resolution Test Chart, ANSI/ISEA Z87.1-2020 Test Resolution Standard
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Barcode Conformance Calibration Standards
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Barcode symbol quality has been at the forefront of discussion among practitioners in the automatic identification and data capture (AIDC) industry since they were invented in 1951. Barcodes became commercially successful when they were used to automate checkout systems at grocery stores, with the very first scanning of the Universal Product Code (UPC) on a pack of Wrigley Company chewing gum in June 1974. The Uniform Code Council (UCC) published barcode quality guidelines, and ANSI X3.182-1990 became the first published standard for barcode quality. Since then, ISO/IEC 15416 for 1D symbols and ISO/IEC 15415 for 2D symbols have become the global standards for grading printed barcodes.
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SINE M-15-60 Sinusoidal Array
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The reflective Sinusoidal Array SINE M-15-60 is similar to the M-13-60 (1X version) except that the range of spatial frequencies begins with 0.25 cycles per mm and extends to 20 cycles per mm. To compensate for the additional frequencies, the 3/16 cycles per mm area has been eliminated. Both arrays are imaged on Photo Paper.
