Cohu, Inc.

Product

Kelvin Test Contactor

nano

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Cohu, Inc.

nano - Cohu, Inc.

nano Kelvin™ test contactor is a well-established Cantilever Kelvin test contactor with proven performance in the automotive market and further increasing popularity due to the robustness and reliability of the product.Featuring a small imprint area, contact motion decoupled from the test board and simple and cost-efficient test boards.

Product

Test Contactor/Probe Head

Hydra

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Cohu, Inc.

Hydra - Cohu, Inc.

Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface.Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design.With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.

Product

High-Performance Strip Handler

MCT SH-5300

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Cohu, Inc.

MCT SH-5300 - Cohu, Inc.

SH-5300™ high-performance strip handler for testing advanced semiconductor packages, LEDs, MEMS sensors, and traditional ICs. It can handle a vast array of strip and laminate lead-frame sizes. Capable of tri-temp testing -55˚C to +160˚C and ambient testing to +160˚C.

Product

High-Throughput Film Frame Handler

MCT FH-1200

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Cohu, Inc.

MCT FH-1200 - Cohu, Inc.

FH-1200™ film frame test handler is designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted. No change kits are required regardless of package size (if same frame is used).

Product

MEMS Pressure Test

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Cohu, Inc.

Cohu, Inc.

Cohu‘s well established pressure test equipment are providing high volume final test solutions for all pressure sensor markets.

Product

Kelvin Test Contactor/Probe Head

Gemini

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Cohu, Inc.

Gemini - Cohu, Inc.

At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.

Product

Inspection & Metrology Platform

Neon

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Cohu, Inc.

Neon - Cohu, Inc.

Neon is Cohu’s next generation inspection platform optimized for small, fragile semiconductors used in automotive, consumer, industrial and medical, and mobility applications.

Product

Test Contactor/Probe Head

xWave

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Cohu, Inc.

xWave - Cohu, Inc.

Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.

Product

Scalable Multi-Channel Active Thermal Control (ATC)

T-Core Thermal Control System

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Cohu, Inc.

T-Core Thermal Control System - Cohu, Inc.

Cohu’s proprietary T-Core thermal system’s controller provides precise, multi-site temperature management of power dissipation ICs, such as graphic chips and CPUs, optimizing test yield.The T-Core thermal control system optimizes test yield at cold, ambient, and hot temperatures and offers better than +/- 1°C accuracy with response speeds of >125°C/sec. The system’s flexibility to control air, liquid, and refrigerant based thermal heads gives semiconductor manufacturers excellent temperature control capability for high volume manufacturing.

Product

InCarrier Loader/Unloader

NY32-LU

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Cohu, Inc.

NY32-LU - Cohu, Inc.

NY32-LU™ loader unloader provides a high parallel single solution for singulated and strip IC testing with controlled and sensitive handling. The system is scalable; one system can be used as a Loader or Unloader, or can be reconfigured as a dedicated Loading or Unloading system.

Product

Test Contactor/Probe Head

cBoa

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Cohu, Inc.

cBoa - Cohu, Inc.

cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.

Product

Gravity Test Handlers

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Cohu, Inc.

Cohu, Inc.

Extremely small to very large packages, very wide temperature range, high throughput octal site and quad site testing.

Product

Tri-Temp Pick-and-Place Handler

MT9510 XP / x16

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Cohu, Inc.

MT9510 XP / x16 - Cohu, Inc.

MT9510 XP™/ MT9510 x16™ test handler provides full temperature control during test in extreme environmental conditions from -55˚C to +175˚C. A variety of options, upgrades and retrofits are available to configure the product to customer applications such as; automotive battery management systems (BMS) for electric (EV) and hybrid electric vehicles (HEV) and precision power regulators.

Product

Pick And Place Test Handlers

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Cohu, Inc.

Cohu, Inc.

Cohu offers a broad range of IC pick-and-place test handling solutions for the automotive, mobile, and computing markets. Our commitment is to provide world-class innovative products that incorporate thermal, vision and factory 4.0 automation options to meet your existing and future IC handling needs.

Product

Semiconductor Testers

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Cohu, Inc.

Cohu, Inc.

Designing and manufacturing scalable Automated Test Equipment (ATE) targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices