Cohu, Inc.
We are a global leader in test handling, thermal subsystems, package inspection, contactors and MEMS test solutions used by the semiconductor industry.
- 858.848.8000
- 858.848.8180
- info@cohu.com
- 12367 Crosthwaite Circle
Poway, CA 92064
United States of America
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product
Test Contactor
RF Scrub
RF Scrub™ Test Contactor’s innovative design combines an extremely short signal path (0.90mm test height) with high wear resistance pins that can operate in a wide temperature range.The RF Scrub Test Contactor’s long-life, elastomer free design and easy field maintainability makes it an optimal solution for testing of high-performance devices.The RF Scrub design minimizes load board wear and with the unique pin base material and plating, the cleaning intervals can last up to 100,000 cycles.
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MEMS And Sensor Test Automation Platform
Sense+
Sense+™ ultra-precise MEMS & sensor test automation platform allows for significant improvement in test accuracy, parallelism for a lower cost of test, and the ability to handle and inspect, small delicate sensors. Fully configured, Sense+ delivers a one-pass automated test, inspection, and metrology for the most complex MEMS devices including <1 mm WLCSP.
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Kelvin Test Contactor
cCruiser
cCruiser™ Kelvin contactor was designed with cost of test optimization in mind, boasting a cantilever design that allows the testing of challenging discrete ICs and small logic package types. Providing a best-in-class proven lifespan of up to 5 million touchdowns increasing handler uptime. cCruiser reduces the cost of test for customers significantly, lasting longer and testing longer than previous contact solutions.cCruiser is the versatile solution for testing small discrete ICs. Its side-by-side Kelvin design is optimized for tri-temp capable insulation layer with extended Automotive temperature range -60°C to + 175°C. Contact socket is G-Pin footprint compatible with a contact spring wear out zone. Featuring conventional onboard socket contact mounting and 80 mΩ low and stable contact resistance. Denmark base material with various plating options, including pure Springs, LEDA, cGold and “state of the art” Thebe.
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Semiconductor Testers
Designing and manufacturing scalable Automated Test Equipment (ATE) targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices
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MEMS Magnetic Sensor Test
Cohu offers a big variety of magnetic test solutions applying magnetic field in all three dimensions. Depending on the requirements we can integrate coils with and without magnetic core, single- or Helmholtz coils, as well as permanent magnets, static and rotating.
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product
InCarrier Loader/Unloader
NY32-LU
NY32-LU™ loader unloader provides a high parallel single solution for singulated and strip IC testing with controlled and sensitive handling. The system is scalable; one system can be used as a Loader or Unloader, or can be reconfigured as a dedicated Loading or Unloading system.
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Turret Test And Scan Handlers
Turret platforms for semiconductor test, inspection and packaging.
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High Speed Gravity Handler
MT9928 xm
This well-established test handler provides field-proven reliability and performance. Its modular and scalable design and variety of options allow configuration of the MT9928 exactly according to the test needs. Easy-access design and easy-to-change conversion kit parts support fast and easy package style changes. The MT9928 has a large soak capacity and features the entire tri-temp range at outstanding temperature accuracy and stability.
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Scalable Multi-Channel Active Thermal Control (ATC)
T-Core Thermal Control System
Cohu’s proprietary T-Core thermal system’s controller provides precise, multi-site temperature management of power dissipation ICs, such as graphic chips and CPUs, optimizing test yield.The T-Core thermal control system optimizes test yield at cold, ambient, and hot temperatures and offers better than +/- 1°C accuracy with response speeds of >125°C/sec. The system’s flexibility to control air, liquid, and refrigerant based thermal heads gives semiconductor manufacturers excellent temperature control capability for high volume manufacturing.
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Kelvin Test Contactor/Probe HEad
cPython
cPython™ Kelvin contactors and probe heads provide superior electrical and thermal performance with significant cost savings. This makes cPython Kelvin ideal for lab and high-volume production test of analog and mixed signal integrated circuits – for applications such as power control, A-D and D-A converters, audio, video, power amplifiers, photonics, optical MEMS and sensors.cPython Kelvin probes are electrically isolated and mechanically independent force and sense paths for true Kelvin contact for taking accurate measurements, even under high current conditions. These robust probes provide hundreds of thousands of insertions or touchdowns, and a bandwidth up to 26 GHz.
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High-Throughput Film Frame Handler
MCT FH-1200
FH-1200™ film frame test handler is designed to handle leadless devices mounted on film frame, such as QFN, DFN, WLCSP, BGA, µBGA and eWLB packages. The FH-1200 enables high parallelism testing of post-saw IC devices at ambient temperature. It can accommodate 200 mm and 300 mm wafer rings and custom shapes onto which multiple strips can be mounted. No change kits are required regardless of package size (if same frame is used).
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Tube-To-Tube Gravity Handler
Rasco SO1000
The SO1000 test handler’s mature design and high reliability it provides excellent cost of test. Highly flexible as a result of a broad range of device kits can be combined with various Sensor and MEMS applications.Featuring a fast plunger with up to four plunger heads for high speed and high throughput with index time down to 500 ms. Available in single, dual, and quad configurations.
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Test Contactor/Probe Head
Atlas
QuadTech™ probe solution with cruciform tip strength that stands up to lateral force without bending, plus an enhanced compliance window to accommodate package stack height tolerance.Atlas™ test contactor offers electrical performance that allows the customer to test to the true performance of the device. Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Cohu’s QuadTech flat probe technology. The Atlas offers a short electrical path, with lower capacitance and inductance, that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications.
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ECT
Has been a leader in the development of advanced probes and fixtures since 1965.
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Equiptest Engineering Pte Ltd
Equiptest Engineering (EQT) is focused in providing innovative test interface solutions to cater today rapidly changing technological environment.
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KITA Manufacturing Co.,Ltd.
KITA Manufacturing Co.,Ltd. is manufacturing company and specializing in spring probes(Pogo pin) for testing semiconductor and PCB based in Osaka, Japan.
