Cohu, Inc.

Product

Test Contactor

cDragon

-

Cohu, Inc.

cDragon - Cohu, Inc.

cDragon™ Test Contactor pin’s thermal design supports fast temperature control response and stabilization for repeatable at temperature testing of devices in a handler environment.The homogenous MEMS elastomer-free multi-beam pin delivers long life and high wear resistance. By design the cDragon’s pin decouples insertion motion from the test-interface-board side of the pin. This eliminates test-interface-board pad wear.

Product

Environment And Burn-in Temperature Chambers

9000 Series

-

Cohu, Inc.

9000 Series - Cohu, Inc.

Delta 9000 Series Temperature Chambers offer a wide choice of temperature ranges and capacities in addition to smart electronics. Field proven by satisfied customers for over four decades, Delta chambers are quality instruments that provide service longevity and integrity unique in their field. Over the years, Cohu has added advanced features to the proven basic chamber design and has refined system components and programming capability to deliver outstanding quality and value.

Product

MEMS Optical Sensor Test

-

Cohu, Inc.

Cohu, Inc.

For optical sensor test Cohu offers a variety of solutions being driven by requirements for tri-temp, parallelism and stimulus spacing. Customized optical stimulus units are integrated into Cohu’s test handling systems. For light detector test, we implement different types of light sources, such as infrared, ambient- and colored light. We offer different solutions for 3D image sensors combining emitter and receiver tests of LiDAR, Time of Flight and Structured Light devices.

Product

Kelvin Test Contactor

nano

-

Cohu, Inc.

nano - Cohu, Inc.

nano Kelvin™ test contactor is a well-established Cantilever Kelvin test contactor with proven performance in the automotive market and further increasing popularity due to the robustness and reliability of the product.Featuring a small imprint area, contact motion decoupled from the test board and simple and cost-efficient test boards.

Product

Kelvin Test Contactor/Probe HEad

cPython

-

Cohu, Inc.

cPython - Cohu, Inc.

cPython™ Kelvin contactors and probe heads provide superior electrical and thermal performance with significant cost savings. This makes cPython Kelvin ideal for lab and high-volume production test of analog and mixed signal integrated circuits – for applications such as power control, A-D and D-A converters, audio, video, power amplifiers, photonics, optical MEMS and sensors.cPython Kelvin probes are electrically isolated and mechanically independent force and sense paths for true Kelvin contact for taking accurate measurements, even under high current conditions. These robust probes provide hundreds of thousands of insertions or touchdowns, and a bandwidth up to 26 GHz.

Product

Test Contactor/Probe Head

Mercury

-

Cohu, Inc.

Mercury - Cohu, Inc.

Mercury™ test probes and contactors are excellent spring probes for the laboratory though they were designed with the robust qualities needed for high-volume production test. Their unique design ensures excellent plating quality for low, consistent resistance, long life, and high-test yields.Mercury probes are available with minimum pitches of 0.3 mm, 0.4 mm, 0.5 mm, and 0.8 mm, to provide the best performance at any device pitch. Mercury probes have bandwidths of up to 22 GHz, and can carry over 3 Amps of current. The Mercury is an excellent choice for any test application.

Product

Test Contactor

RF Scrub

-

Cohu, Inc.

RF Scrub - Cohu, Inc.

RF Scrub™ Test Contactor’s innovative design combines an extremely short signal path (0.90mm test height) with high wear resistance pins that can operate in a wide temperature range.The RF Scrub Test Contactor’s long-life, elastomer free design and easy field maintainability makes it an optimal solution for testing of high-performance devices.The RF Scrub design minimizes load board wear and with the unique pin base material and plating, the cleaning intervals can last up to 100,000 cycles.

Product

Solution For Test-in-Strip

InCarrier

-

Cohu, Inc.

InCarrier - Cohu, Inc.

The InCarrier process is based on a strip-like device carrier for single devices that combines the advantages of the singulated device test with the advantages of high parallel strip test. Leveraging the strip like design the InCarrier ensures robust test-handling for even smallest devices and supports high parallel test.

Product

Inspection & Metrology Platform

Neon

-

Cohu, Inc.

Neon - Cohu, Inc.

Neon is Cohu’s next generation inspection platform optimized for small, fragile semiconductors used in automotive, consumer, industrial and medical, and mobility applications.

Product

Test Contactor/Probe Head

Hydra

-

Cohu, Inc.

Hydra - Cohu, Inc.

Engineered for excellence and efficiency, Hydra™ spring probe series offers precision, reliability, and standardized semiconductor test interface.Designed to be best-in-class at a competitive price point, Hydra is optimized to maximize your operational efficiency. Hydra is built to withstand demanding high-volume manufacturing test environments with its robust and durable design.With a common test-height, Hydra offers the ability to mix and match power, RF, and Kelvin probes within the same test socket. In addition, Hydra streamlines inventory management with fewer probe part numbers to manage and shorter lead times.

Product

MEMS Magnetic Sensor Test

-

Cohu, Inc.

Cohu, Inc.

Cohu offers a big variety of magnetic test solutions applying magnetic field in all three dimensions. Depending on the requirements we can integrate coils with and without magnetic core, single- or Helmholtz coils, as well as permanent magnets, static and rotating.

Product

Probe Head

cViper

-

Cohu, Inc.

cViper - Cohu, Inc.

cViper™ is an ultra-fine pitch probe head for RF and high speed digital WLCSP. cViper is ideal for lab and large volume production test for precision analog, RF, sensors and mobility devices. Low loop inductance and high bandwidth up to 27 GHz, cViper offers low and stable contact resistance for singulated devices or wafer-level test. A variety of contact materials to optimize performance are available with device pitch down to 100 µm.

Product

Test Contactor

MiCon

-

Cohu, Inc.

MiCon - Cohu, Inc.

The MiCon™ Test Contactor is spring pin footprint compatible supporting advanced temperature requirements as well as advanced power/current requirements. The footprint compatibility allows for easy and cost-efficient conversion from spring pin setups. The fully decoupled load board side of the spring ensure no degradation of the load board pad.MiCon features a single piece design, which ensures a long lifespan, low and stable contact resistance, high current carrying capability and an extended temperature range. The MiCon allows for testing at full specification values. The extended operating range accommodates device lead trim and form variability such as device alignment accuracy and device lead coplanarity.

Product

Flexible Test And Scan Solution For FFC Devices

Ismeca NY32W

-

Cohu, Inc.

Ismeca NY32W - Cohu, Inc.

32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.

Product

High Parallel Test Handlers

-

Cohu, Inc.

Cohu, Inc.

High parallelism test in strip or singulated device batch handling on carriers, WLCSP post singulation test.