Cohu, Inc.

Product

MEMS And Sensor Test Solutions

-

Cohu, Inc.

Cohu, Inc.

Modular design based on standard handlers, high parallelism, ambient to automotive tri-temp handling.

Product

Turret Test And Scan Handlers

-

Cohu, Inc.

Cohu, Inc.

Turret platforms for semiconductor test, inspection and packaging.

Product

Probe Cards

-

Cohu, Inc.

Cohu, Inc.

High-performance field repairable direct-attach probe cards.

Product

Pick And Place Test Handlers

-

Cohu, Inc.

Cohu, Inc.

Cohu offers a broad range of IC pick-and-place test handling solutions for the automotive, mobile, and computing markets. Our commitment is to provide world-class innovative products that incorporate thermal, vision and factory 4.0 automation options to meet your existing and future IC handling needs.

Product

Kelvin Test Contactor

cCruiser

-

Cohu, Inc.

cCruiser - Cohu, Inc.

cCruiser™ Kelvin contactor was designed with cost of test optimization in mind, boasting a cantilever design that allows the testing of challenging discrete ICs and small logic package types. Providing a best-in-class proven lifespan of up to 5 million touchdowns increasing handler uptime. cCruiser reduces the cost of test for customers significantly, lasting longer and testing longer than previous contact solutions.

Product

MEMS Microphone Test

-

Cohu, Inc.

Cohu, Inc.

The market is driving the need for improved voice recognition for security, automobile infotainment control, VoIP, accurate language translation, voice-activated consumer devices and high precision hearing aids. The latest next-generation microphones require highly accurate precision testing with SNR tests up to 78 dB with high parallelism, high UPH, in a high volume production environment.

Product

Configurable OSAT Friendly Pick-and-Place Handler

Delta Eclipse

-

Cohu, Inc.

Delta Eclipse - Cohu, Inc.

Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors.  The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.

Product

Scalable Multi-Channel Active Thermal Control (ATC)

T-Core Thermal Control System

-

Cohu, Inc.

T-Core Thermal Control System - Cohu, Inc.

Cohu’s proprietary T-Core thermal system’s controller provides precise, multi-site temperature management of power dissipation ICs, such as graphic chips and CPUs, optimizing test yield.The T-Core thermal control system optimizes test yield at cold, ambient, and hot temperatures and offers better than +/- 1°C accuracy with response speeds of >125°C/sec. The system’s flexibility to control air, liquid, and refrigerant based thermal heads gives semiconductor manufacturers excellent temperature control capability for high volume manufacturing.

Product

Test Handlers

-

Cohu, Inc.

Cohu, Inc.

Cohu has 50+ years of semiconductor test expertise designing and manufacturing pick-and-place, gravity feed, test-in-strip handlers, MEMS test cells, and turret-based test handling and back-end finishing equipment for ICs, LEDs and discrete components.Our test handlers support a variety of package sizes and device types, including automotive, mobile, power, micro-electromechanical systems (MEMS) and microcontrollers, among others.

Product

Kelvin Test Contactor/Probe Head

Gemini

-

Cohu, Inc.

Gemini - Cohu, Inc.

At 3.22 mm test height, the Gemini™ Kelvin test contactor is an excellent all-around spring probe with low inductance, high bandwidth, and excellent current-carrying capacity. The device under test (DUT) side tip design accurately maintains its 100 µm spacing for the life of the probe. Customers report typical probe life of 500 k to 800 k package insertions, or over 2M touchdowns at wafer-level test. The offset tip allows manageable board layout with a board-side spacing of 0.4 mm.Gemini Kelvin probes and contactors provide a first-rate solution that effortlessly makes reliable, true Kelvin contact for high-volume final test of both singulated packages and wafer-level devices. Gemini Kelvin is an ideal solution for devices such as power controllers, A-D and D-A converters, power amplifiers and audio and video circuits.

Product

InCarrier Loader/Unloader

NY32-LU

-

Cohu, Inc.

NY32-LU - Cohu, Inc.

NY32-LU™ loader unloader provides a high parallel single solution for singulated and strip IC testing with controlled and sensitive handling. The system is scalable; one system can be used as a Loader or Unloader, or can be reconfigured as a dedicated Loading or Unloading system.

Product

Test Contactor/Probe Head

xWave

-

Cohu, Inc.

xWave - Cohu, Inc.

Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.

Product

Turret Kelvin Test Contactor

cHybrid

-

Cohu, Inc.

cHybrid - Cohu, Inc.

cHybrid™ Kelvin contactor contains a new and unique contact spring architecture which allows the test socket to adapt to challenging IC pad geometry requirements of todays and future small package types. Great lifetime up to 3 million touchdowns, with best-in-class contact resistance repeatability reduces cost of test significantly. A multi-beam contact structure optimizes signal integrity and current capability according to challenging electrical test requirements.cHybrid Kelvin contactor with multi-beam contact spring architecture delivers improved yield and long life minimizing cleaning cycles. This innovative solution will help customers reduce cost and maximize productivity.

Product

Tube-To-Tube Gravity Handler

Rasco SO1000

-

Cohu, Inc.

Rasco SO1000 - Cohu, Inc.

The SO1000 test handler’s mature design and high reliability it provides excellent cost of test. Highly flexible as a result of a broad range of device kits can be combined with various Sensor and MEMS applications.Featuring a fast plunger with up to four plunger heads for high speed and high throughput with index time down to 500 ms. Available in single, dual, and quad configurations.

Product

Semiconductor Testers

-

Cohu, Inc.

Cohu, Inc.

Designing and manufacturing scalable Automated Test Equipment (ATE) targeted at testing SOC, MCU, RF PA/FEM, Sensors/MEMS and Power and Analog devices