Switch Test
Make, break, or change the connection of a circuit.
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Product
Combination Board Functional Test System
QT 4256 ATE
Functional Test
Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
Automotive Electronics Functional Test System
TS-5020
Functional Test
The Keysight TS-5020 Automotive Functional Test System is a low cost, scalable test system designed with “just-enough-test” concept for medium complexity electronic control modules, such TPMS, RKE and body electronic modules
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Product
PXI/PXIe RF Switch, Hex SPDT, 3GHz, 50Ω, SMB
42-870A-006
Switch Module
The 40-870A-006 (PXI) and 42-870A-006 (PXIe) are 50Ω RF switches with 6 separate SPDT relays in a single slot. They have low insertion loss and VSWR through the use of modern RF relay technology at an affordable cost. The switch banks been carefully designed to ensure excellent and repeatable RF characteristics to frequencies of 3GHz.
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Product
PXI Dual 2 x 2 Fibre Optic (M Mode) SC M50
40-860-222-M50
Switch Module
Pickering PXI Fiber Optic MEMS Switching cards are available in many high density formats with a choice of 5 different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications. Fiber optic multiplexers create a signal path by redirecting the optical signal into a selected output fiber. This is achieved using Micro-Mechanical Mirrors driven by a highly precise mechanism and activated via an electrical control signal.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
test
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
LFH200 to 4X50-pin DSub Switch Cable (CH-Com Twisted), 60 VDC, 2m
783139-02
Switch Cable
LFH200 to 4X50-pin DSub Switch Cable (CH-Com Twisted), 60 VDC, 2m
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Product
Multiport Electromechanical Coaxial Switch, DC to 40 GHz, SP6T
87106D
Coaxial Switch
The Keysight 87106D multiport switch improves signal accuracy in RF and microwave signal routing and testing applications. This high performance electromechanical switch provides unmatched isolation and a 0.03 dB insertion loss repeatability, which is warranted for the 5-million life cycle of the switch. The 87106D’s low insertion loss repeatability reduces sources of random errors in the measurement path, which improves measurement accuracy. The repeatability and reliability of this switch guarantee measurement accuracy and can cut the cost of ownership by reducing calibration cycles and increasing test system up time. Highly repeatable switching capability is made possible through Keysight's rigorous design and tight manufacturing specifications.
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Product
6TL22 Off-Line Testing Platform
H71002200
Test Platform
Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Product
PXI Fault Insertion Switch, 6-channel, Two Fault Buses, 10 A
40-192A-012
Switch Module
The 40-192A-012 is a PXI fault insertion switch using solid state switching elements and is capable of switching current up to 10A. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test
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Product
PXIe Flexible Microwave Module, Dual SP6T Terminated 26.5 GHz, Single SPDT 26.5 GHz, 50 Ω, SMA
42-890-004
Switch Module
The 40-890 (PXI) and 42-890 (PXIe) range of PXI microwave modules allows users to specify the mix of relay types, frequencies and quantities based on the application requirements within the capabilities of the module driver card. Choose from the extensive relay selection already available in the Pickering microwave range to create a flexible solution.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
Test Port Cable, 1 Mm
11500K
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 20-cm cable featuring a return loss of 16 dB minimum
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Product
PXI/PXIe MEMS Optical Switch, Triple Insert/Bypass, Single-Mode, 9/125 Fiber, LC Connectors
42-860A-432
Switch Module
The 40/42-860A-432 is a PXI/PXIe triple insert/bypass switch with LC connectors and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules.
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Product
1.5-m, 78-pin Dsub Cable
Y1137A
Switch Cable
The Y1137A is a M/F twisted-pair cable with outer shield. The 300-V cable provides a direct connection for the Keysight multifunction switch / measure mainframe and modules. Some modules require two cables.
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Product
OLED Lifetime Test System
58131
Test System
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
PXI Solid State Switch Module, 6xSPST, 10 A
40-182A-011
Switch Module
The 40-182A-011 has 6 off high current SPST switches in two PXI slots and is part of our range of high power solid state switching solutions. Each SPST switch uses a fully isolated solid state relay which has been designed to offer fast operation under hot switching conditions and high inrush current with no operational life degradation. Each SPST switch can support 10A of continuous current and switch up to 200V signals. The switch can sustain inrush currents in excess of 50A. AC or DC signals can be switched since the switch is polarity insensitive.
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Product
Automated Optical Switch - MATRIQ
Optical Switch
Add optical switching capability to your test system with Quantifi Photonics’ automated optical switches. The fast and reliable optical switch will enable automated sequential testing, saving time and streamlining your test procedures.
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Product
Coaxial Switch, DC to 26.5 GHz, SPDT
8765C
Coaxial Switch
The Keysight 8765C offers excellent electrical and mechanical performance with broadband operation, high isolation, low SWR, long life, and exceptional repeatability.
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Product
PXI/PXIe MEMS Optical Switch, Triple Insert/Bypass, Single-Mode, 9/125 Fiber, MU Connectors
42-860A-332
Switch Module
The 40/42-860A-332 is a PXI/PXIe triple insert/bypass switch with MU connectors and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules.
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Product
General Purpose PXI Relay Switch Modules
Switch Module
PXI relay switch modules offer reliable switching in a variety of configurations. They consist of multiple independent single-pole single-throw (SPST), single-pole double throw (SPDT), double-pole single-throw (DPST) and double-pole double-throw (DPDT) relays. Our PXI relay switch modules come in a variety of relay types including reed relays, electromechanical relays (EMR) and solid state relays—offering you the optimum switching performance for your application.
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Product
PXI Solid-State SPST Switch, 6-Channel 25A 100V
40-184-001
SPST Switch
This range of PXI high power switches support 6-off high current SPST switches into two PXI slots or 3-off high current SPST switches into one PXI slot. Each SPST switch uses a fully isolated solid-state relay which has been designed to offer fast operation under hot switching conditions and high inrush current with no operational life degradation. Each PXI solid-state SPST switch can support 25A of continuous current and switch up to 100V signals. The switch can sustain inrush currents of up to 90A. AC or DC signals can be switched since the switch is polarity insensitive.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
Functional Test
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
Memory Test System
T5511
Test System
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Functional Test Trainer System
QT65
Functional Test
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Test Fixture
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Product
Test Fixture
N1295A
Test Fixture
The Keysight N1295A Device/Component Test Fixture provides a low-cost solution to quickly and easily test packaged devices and components. For more advanced packaged testing needs, the Keysight 16442B Test Fixture provides more capabilities.
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Product
True Concurrent Test
TestStation Duo
Test System
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
SoC Test Systems
Test System
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
ESD Test System
58154 Series
Test System
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
