Test Frameworks
faciliate automation by a system integrating test; libraries, data, objects and processes.
-
Product
Bluetooth RF Test System
FRVS
-
FRVS is recognized by the Bluetooth SIG as a validated test system for qualification testing of products to Bluetooth BR/EDR and low energy RF test specifications.
-
Product
Optimize Throughput And Cost For MmWave 5G Device Functional Test
-
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
-
Product
VLSI Test System
3380P
-
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
-
Product
Positioning Test System
TS-LBS
-
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
-
Product
Mini In-Circuit Test System
U9403A
-
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
-
Product
Test Fixture
16047E
-
Perform impedance evaluation of lead type devices of up to 120 MHz; includes a guard and a shorting plate
-
Product
NI Vehicle Radar Test System
-
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
-
Product
Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
-
Stopper kit includedYAVCANCON2 for fixture identification not included
-
Product
SSD Test Systems
-
Enables Rapid SSD Development and Production Ramp with Flexible Test Solution In the high-growth and highly competitive SSD market, a test system that supports multiple protocols can eliminate the need for retooling and achieve faster transitions from one product version — or one product generation — to the next. Advantest SSD Test System allows manufacturers to rapidly grow their product portfolios while remaining adaptable to the many changing needs of the evolving SSD market. This tester improves users’ engineering efficiency with powerful, easy-to-use software tools and a revolutionary multi-protocol hardware architecture, enabling accelerated SSD product development and a faster time-to-manufacturing ramp.
-
Product
VLSI Test Systems
-
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
-
Product
Radio Frequency, Communications, & Navigation Test Systems
-
Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
-
Product
Automotive Ethernet Test Fixture
AE6941A
-
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
-
Product
Test Port Adapter Set, 2.4 Mm To 3.5 Mm
85130F
-
The Keysight 85130F test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector designed for connecting to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. The set contains a 2.4 mm to PSC-3.5 mm male adapter and a 2.4 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 26 dB or better.
-
Product
HV Test System up to 20000 Volt
-
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
-
Product
Memory Test System
T5851/T5851ES
-
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
-
Product
Regenerative Battery Pack Test System
17040
-
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
-
Product
PCI Express 3.0 Test Platform with SMBus Support
-
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
-
Product
Test Fixture, Axial And Radial
16047A
-
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
-
Product
EBIRST 200-pin LFH To 96-pin SCSI Adapter Cable
93-002-226
-
eBIRST adapters allow extension to other switching system connectors, including SMB
-
Product
Mini LED Backlight Module Automatic Optical Test System
7661-K003
-
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
-
Product
Semiconductor Test System
TS-960e
-
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
-
Product
HTOL Test Systems
-
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
-
Product
EV Power Components End of Line Test Platform
-
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
-
Product
Component Test Fixture For N1413 With B2980 Series
N1428A
-
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
-
Product
High Speed Test Bench
AT444
-
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
-
Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
-
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
-
Product
Test Handler
M4841
-
High-Throughput Device Handler for Volume Production Testing of MCUs and DSPs.
-
Product
Test Automation Framework
Gauge
-
Gauge is an open source test automation tool that is completely hackable. Written in golang, Gauge lets you write tests in plain-speak and refactor fearlessly. Its pluggable architecture allows you to customize your environment so you can write tests in the language and IDE of your choice.
-
Product
LitePoint RF Test System
J750
-
The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
-
Product
6TL19 Off-Line Base Test Platform
H71001900
-
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
