Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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Electronic Ballast Analyzer
WT3000
• It has 8 windows to display each parameter of input and output characteristics • Frequency response for testing input current up to 1MHz, suitable for precise testing of various kind of electronic ballast • WT3000 has expanding analysis for envelope wave. • Symmetry analysis for envelope wave’s crest factor of lamp current • Sampling at ultra-high speed, dynamic analysis single frequency curve, highest sampling frequency is up to 10MHz • Portable with built-in chip micro-processor, particular suitable for development and spot production • RS-232C standard interface can be connected to PC, English version software can run in WinXP or Win7
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Electronic Component Testing Services
New Jersey Micro Electronic Testing, Inc.
NJMET is proud to provide procurement and testing services to the commercial, military, aerospace, industrial automotive and medical industries. We also provide custom engineering consultation services. NJMET Inc. is AS9100/ISO9001:2008 certified and has recently successfully completed of The Defense Logistic Agency’s (DLA) laboratory suitability assessment and is qualified to test federal stock classes (FSC) 5961 (Semiconductor Devices) and FSC 5962 (Microcircuits) to DLA’s QTSL test requirements.
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Laser-induced Breakdown Spectroscopy (LIBS)
LIBS
HORIBA designs and manufactures for Laser-induced Breakdown Spectroscopy (LIBS) very high resolution OEM spectrometers. Thanks to a low stray light aberrations corrected concave holographic grating (Jobin Yvon Technology), HORIBA LIBS spectrometer offers in a ~90x70x30mm footprint (without electronics) a very robust and accurate spectrometer.Adopt the HORIBA LIBS spectrometer to monitor the elemental fingerprint of your liquid, solid or gas samples.
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Input Characteristic Analyzer of Electronic Ballast
UI2001
• 4 display windows for V (600V), A (2A), W, PF/Hz • THD, 0 to 39th harmonic components • Accuracy: ± (0.4% reading + 0.1% range + 1 digit) • Data and curves printable. All the data and curves can be displayed after being connected with PC
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Trace Viewer (Software Application For Trace Analysis)
TraceViewer application provides you with a full range of options when analyzing traces (information on the condition of a fiber at any given point of its length, received from the optical time-domain reflectometer) - receiving, viewing, editing and labeling.
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Portable Data Acquisition & Analysis System
LapCAT III
# 4, 8, or 16 channels# 1 MHz aggregate 12 bit sampling. Resolution is 0.024% of full scale# 13 recording durations, user selected: 132 msec to 1320 sec# Digital Triggering from any channel, with +/- slope or window# 6 full scale gain ranges, user selected: 0.4, 1, 2, 4, 10, and 20 volts full scale - with a 10mV/g accelerometer these equal 40g, 100g, 200g, 400g 1000g and 2000g full scale - higher or lower ranges by different sensor selection
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Solder Paste Analysis
SPA1000
The SPA 1000 also introduces new process control capability by accurately measuring the suitability of the solder paste prior to its implementation on the production line. It achieves this by determining the "Open-Time" for the paste. It also performs the Slump Test and both of these methods provide a "Go/No Go" answer in less than 30 minutes to ensure minimum delay for the production line.
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Electric Shock Protection Analysis
60364-4-41 StandardBS 7671 StandardEN 50122 StandardTN-C, TN-S, TN-C-S, TT & IT Earthing TypesElectric shock requirementsLoop impedance and current calculationTouch voltage calculation and evaluationCalculation considers resistance to ground / earthGround Fault Current Interrupter (GFCI) or Residual Current Circuit Breaker (RCCB) or Residual Current Detector (RCD) protectionReports in Crystal Reports and MS Excel
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EQCM Electronic Quartz Crystal Microbalance
Elettra
Elettra has been designed to operate on its own, but it is also possible to connect it to a PC to control it and acquire, view and save data thanks to its extremely easy to use software that runs under MS-Windows™. The data acquisition process can be controlled extremely quickly thanks to the PLAY, PAUSE and STOP keys.
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Signal Analysis
Cross-Spectrum FFT Analysis
The program Cross narrow-band spectrum is used for evaluation of the interrelation between the signals’ parameters obtained from the two primary transducers installed at various parts of the controlled object. This program can be used for detection of noise source location, for sound absorption level evaluation and the researched object acoustic properties control, for evaluation of space-time distribution of the directional energy flux (Poynting vector), for the ground cross-section FR characteristic evaluation (Nakamura method), etc.
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Scanning Electron Microscope
SEM
Delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from 200 nA to 500 nA.
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Embedded Analysis Software for the 2000 X-Series
D2000GENB
Test and debug I²C, SPI, RS232/422/485/UART designs with triggering, decoding, and pass / fail mask limit testing.
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Time Frequency Analysis Function
OS-0527
This function can evaluate transient phenomena that were difficult to capture by FFT analysis, and display clearly time change of the frequency component while maintaining its frequency resolution . The OS-0527 is equipped with STFT (Short Time Fourier Transform) and Wavelet transform.
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Molecular Spectroscopy
Characterize advanced complex materials on any budget. Our comprehensive portfolio of analytical solutions has the ideal molecular spectroscopy instruments for any lab to measure UV, infrared, and fluorescence.*Higher accuracy, increased sensitivity*Sample size flexibility*Wide array of sampling techniques*Shorter sample setup time*Easy-to-use software providing expert results
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Probing & Analysis Adapters
No matter how well designed a circuit is, there is almost always a need to hook up test instruments to it to verify function, look for bugs, or baseline performance. As IC packages become smaller and pin counts grow this becomes harder and harder. probing adapters are required to alleviate this de-bug problem. Many different types of adapters fall into the test and debug category. The common feature is that they bring the signals of an IC out to a format that is easy to interface with test and analysis equipment.
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Spectrum Analysis For P50xxB Up To 53 GHz
S970908B
Add spectrum analysis to your P50xxB Streamline series vector network analyzer
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Carbon/Nitrogen Analysis by Combustion
928 Series
By incorporating state-of-the-art hardware and an on-board touch-screen software platform, the 928 Series allows you to easily handle the most demanding sample applications. The core capabilities and performance of previous generations of LECO macro combustion instruments have been maintained, while key improvements have been made in throughput, uptime, and reliability. Macro sample mass ability (up to 3 grams for Nitrogen/Protein model regardless of sample carbon content) with rapid cycle times and a resulting low cost-per-analysis make the 928 Series ideal for analysis of characteristically heterogeneous, difficult to prepare, or low analyte level samples.
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Electronic Load Board 3U CPCI-S (air cooled)
056-377
The 3U load boards are designed to simulate the power consumption of a single board computer and other boards on the backplane.
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Electronically Tunable Filters
ETF
Radar. Communications. EW/SIGINT. Frequency agile channelization. Frequency agile noise rejection filter. Local oscillator tracking filter. Controlled bandwidth and center frequency noise source.
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Gas Analysis
HPR-20 S1000
The Hiden HPR-20 S1000 gas analysis system configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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High-power DC Electronic Load (6kW~60kW)
FT68200A/AL/E Series
Shenzhen FaithTech Technology Co., Ltd.
FT68200 series high performance high-power DC electronic load provides three voltage ranges 150 V/600 V/1200 V, maximum current 2400 A per single unit, stand-alone power from 4 kW to 60 kW, expandable up to 600 kW, 10000A by master-slave paralleling. Ultra-high power density, 6kW is with only 4U height. Wider operating region, faster dynamic frequency, as well as transient mode, OCP/OPP test, sequence test, automatic test and battery discharge test functions greatly enhances its test strength and expands application coverage. Furthermore, two times instantaneous overpower loading capability can effectively reduces user’s test cost. Built-in standard RS232, RS485, LAN, USB (serial), optional GPIB and CAN interface, supports SCPI, ModBus RTU and CANopen protocol, which facilitates system integrators. FT68200 series has full protection functions, which can be applied to power battery discharge, DC charging station, charging piles, charging pile modules, vehicle On Board chargers (OBC), high-power switching power supplies, power electronics and other power electronics products.
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High Power DC Electronic Load
63200A series
The 63200A series high power DC electronic loads are designed for testing a wide range of power conversion products including AC/DC and server power supplies, DC/DC converters, EV batteries, automotive charging stations, and other power electronics components. These units can be synchronously paralleled up to 240kW and dynamically synchronized for generating complex multi-channel transient profiles. The 300% peak overpower capability provides extra headroom for fault condition simulations in automotive batteries, fuel cells, and more. The 63200A series have three operating voltage choices, 150V, 600V & 1,200V, with models covering power levels from 4kW to 24kW and up to 2,000A in a single unit. The DC loads have unique user defined waveform (UDW) capability and external analog modulating input for s imul a t ing re a l-wor ld, cus tom waveforms. Another distinct feature is the dynamic auto-frequency sweep function, which enables detecting a UUTs worst case output deviation across a wide range of current frequencies. In addition, a 255-set of data storage function has been built in for recall of the stored settings at any time. For automated testing, the save and recall functions can save a great deal of time.
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Cell Culture Media Analysis Platform
C2MAP System
The C2MAP™ System can be automated the process from pretreatment to measurement for culture supernatant samples and display temporal changes in the components as graphs. With the optimized LC/MS/MS simultaneous analysis method, the system can be used for the optimization of culture conditions in animal cell cultures by monitoring the consumption and depletion of media components during culturing, as well as the variation in metabolites secreted from cells.
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4500~6000W DC Electronic Loads
JT634 Series
Nanjing Jartul Electronic Co., Ltd
JT634 series electronic load is functioned with 500KHz high-speed synchronous sampling, DSP technology, powerful dynamic test and multi-aspect intelligence analysis. All these are fully integrated into auotmatic test function, which makes JT634 series load very suitable for testing power supply when produced in large quantity. Besides, JT634 series load also possesses the features of current rising slew rate programmable, high-speed dynamic loading and programmable list function, which makes JT634 series load satisfing most of R&D requirements. Moreover, JT634 series load’s special parallel operation method can satisfy the synchronous loading requirements of multi-channels output power supply and satisfy single-channel output power supply requirement for big power.
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Dynamic Mechanical Analysis
The DMA systems from Anton Paar perform dynamic mechanical analysis in torsion, tension, bending and compression at unprecedented precision. Whatever your DMA requirements are, the DMA systems from Anton Paar are efficiently and comfortably adapted to meet your needs. Use the systems for the dynamic mechanical analysis of solutions, melts, solid bars, films, foils, or reactive resins.
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Destructive Physical Analysis (DPA)
Is the process of disassembling, testing, and inspecting a component for the purpose of determining conformance with applicable design and process requirements. This process of sample testing is used to ensure that a high reliability component or device is fabricated to the required standards. Destructive Physical Analysis is also used effectively to discover process defects for troublesome production lot problems.
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Near-infrared Spectroscopy Evaluation Module
DLP® NIRscan™ Nano
The DLP NIRscan Nano is a compact battery-operated evaluation module (EVM) for portable near-infrared spectroscopy solutions. Featuring the DLP2010NIR digital micromirror device (DMD), the NIRscan Nano supports Bluetooth low energy to enable mobile lab measurements for hand-held spectrometers.
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Regenerative DC Electronic Load
IT8300 Series
ITECH newly launched IT8300 Regenerative DC Electronic Load, it not only can simulate various load characteristics, but also can feed power back to grid without pollution. IT8300 series unique regenerative function can convert the absorbed DC power into AC power and feed it back to local grid.
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Scanning Electron Microscope (SEM)
Prisma E
Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Refinery Gas Analysis
Gas compositions produced in refinery plants consist of hydrocarbons, permanent gases, H2S, etc. Analyzing these gases is essential to control the quality of chemical products and plant operation. Shimadzu's RGA systems, available in numerous configurations, are designed to analyze various compositions in a variety of processes. In research and development for petrochemical and its catalysis field, target compounds often contain high-boiling point compounds and isomers. The Shimadzu CERGA makes it possible to precisely analyze those samples.
