Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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Big Data Analysis Platform
Essentia
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Essentia is a highly efficient and highly scalable solution for managing, processing and analyzing vast amounts of unstructured, semi-structured and structured data stored in cloud data lakes. This can be categorized as big data and/or complex data.
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Laboratory And Analysis Systems
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High performance UV-VIS-IR spectrophotometer with superb optical performance for the determination of spectral absorption coefficient and spectral effective scattering coefficients
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Electronics
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Electromagnetic, Signal Integrity, Thermal and Electro-Mechanical Simulation Solutions. The use of Ansys Electronics solution suite minimizes the testing costs, ensures regulatory compliance, improves reliability and drastically reduces your product development time. All this while helping you build the best-in-class and cutting-edge products. Leverage the simulation capability from Ansys to solve the most critical aspects of your designs
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Noise Analysis Software
noiseLAB
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noiseLAB is a professional software recording and analysis package for making Type 1 Precision measurements to international standards. Precision Recorder: noiseLAB makes high quality recordings of up to 8 channels of sound. Precision Analysis of: Sound Level (Fast, Slow, Impulse, Taktmak. Custom Time Constant, Leq). Statistical Values (L1, L5, L10, L50, L90, L95, L99). Octave Spectra (1/1, 1/3, 1/6, 1/12, and 1/24th octave).....
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Electronic Pressure Switch With Digital Display
PPG
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31mm compact 1-screen 2-color display pressure switch.Supports protection structure IP65. (Piping connection: Female thread added)
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Impurity Analysis In Bulk Gas
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High-purity gas is necessary in industries such as chemical, medical, and foods. Precisely controlled GC enables identification and quantitation of a trace amount of impurities in bulk gas. If the gas resources in a factory consist of multiple lines, a sample line selector SLS-2020 can be utilized to switch sample lines automatically, allowing a single GC to analyze all samples.
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Destructive Physical Analysis (DPA)
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Is the process of disassembling, testing, and inspecting a component for the purpose of determining conformance with applicable design and process requirements. This process of sample testing is used to ensure that a high reliability component or device is fabricated to the required standards. Destructive Physical Analysis is also used effectively to discover process defects for troublesome production lot problems.
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Scanning Electron Microscopes
SEM
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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Tracking Analysis Software
DS-0322
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This software enables tracking analysis with high-speed (calculation speed: approx. at 20ms/4-ch), high-resolution (1000 blocks max.) and high-accuracy (more than 100dB dynamic range). It can plot rotation-tracking diagram during calculation, and also can set and plot the diagram of intended order or frequency after the calculation. *DS-0321 series FFT analysis software is required.
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Sulfur and Carbon Analysis by Combustion
832 Series
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LECO’s 832 series will redefine the way you determine sulfur and carbon in a wide variety of organic materials. Using extensive customer feedback and innovative engineering, our latest instrumentation takes advantage of an on-board software platform powered by a touch-screen interface, increasing usability and operational control without using valuable bench space. A high-efficiency combustion furnace, improved IR cell design, and a robust, rugged design make the 832 a valuable resource for any laboratory needing fast and accurate analysis of sulfur and/or carbon in organic materials.
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Electronic Loads
T3EL Series
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The T3EL series is a family of single channel, 200 & 300 Watt Electronic Loads that are ideal for R&D, product validation and Q&A in a bench or automated environment for low to medium power applications starting from 60mA, such as electronic components, batteries, portable chargers and power products. Electronic Loads are typically used to provide a load to the outputs of a power supply, usually capable of dynamic loading, and are fully programmable. Electronic Loads help designers to test electronic power products and ensure quality, reliability, and performance.
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AFM-Raman for Physical and Chemical Imaging
XploRA Nano
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Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.
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Modular DC Electronic Load
63600
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Chroma Systems Solutions, Inc.
Chroma’s 63600 Modular DC Electronic Load is designed for testing multi-output AC/DC power supplies, DC/DC converters, chargers, batteries, adapters, and power electronic components. They are excellent for use in research, development, production, and incoming inspection applications. The 63600’s state-of-the-art design uses DSP technology to simulate non-linear loads using an unique CZ operation mode allowing realistic loading behavior.
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Network Analysis
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Network analysis includes a powerful set of analytical tools that allow for simulation, prediction, design and planning of system behavior utilizing an intelligent one-line diagram and the flexibility of a multi-dimensional database.
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Electronics Testing Solutions
Test System
Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Enhanced Time Domain Analysis With TDR
S96011B
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Use S96011B to perform enhanced time domain analysis for high-speed data applications. Includes all functionality of the S96010B (TDR/TDT mode). In addition, the S96011B enables more detailed measurements and evaluations, such as eye diagram / mask modes, without adding PLTS software. Jitter and emphasis / equalization capabilities enable simulation of real-world signals and environment. The S96011B covers up to 53 GHz bandwidth. Full calibration is available and the automatic deskew ensures easy removal of fixture and probe effects. To get the best accuracy, use mechanical calibration kits or ECal with DC option (i.e. N469xD or N4433D with Option 0DC).
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Stand-Alone Type Chemical Concentration Monitor
CS-100 Series
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The CS-100 Series offers a complete lineup of high precision chemical solution concentration monitors for various solutions in cleaning and etching processes during semiconductor manufacturing. In addition to the high-speed response and compact design, measurement of each component concentration is conducted in real-time and the timing of chemical solution changes and automatic supply is warned with an alarm. The ability to perform short measurement cycles allows for accurate monitoring of concentration changes.
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Dynamic Imaging particle analysis system
FlowCam® Biologics
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Yokogawa Fluid Imaging Technologies, Inc.
Detection & measurement of protein aggregates and other paticulates Formulation research & development QC diagnostics Stability studies and shelf-life simulation
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Analysis Software for FCS and cross-FCS
Burst-Analyzer
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*FCS Fit with User-Defined Model Functions*Identification of Single-Molecule Photon Bursts in Parameter-Tag Data*Analysis of Fluorescence Intensity and Lifetime within Photon Bursts*One- and Two-Dimensional Histograms of Burst Parameters*Filtered Histograms of Burst Parameters*Discrimination of Different Fluorescent Species or FRET States*Determination of FRET Efficiencies*Exclusion of Artifacts in Intensity Traces
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Workshop Equipment for Electronics
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PeakTech Prüf- und Messtechnik GmbH
Is a new development for fast and uncomplicated voltage measurements as a two-pole voltage tester with digital LCD display and additional LED display of the current voltage values.
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Gas Analysis
HPR-20 EPIC
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The Hiden HPR-20 EPIC gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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Advanced Spectroscopy System
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Nuclear Physics is the field of physics that studies atomic nuclei and their constituents and interactions. We offer Geiger-Mueller tube systems for investigating the statistics of radioactive decay, as well as scintillator based systems for gamma spectroscopy.
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Measurement, Data Analysis, Visualization, Automation
Imc STUDIO
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With imc STUDIO, you are ready to start your measurement in a few minutes. A clearly organized channel configuration list, extensive sorting and filtering functions, numerous assistants, built-in sensor management and support of TEDS are just some of the useful functions for achieving quick, intuitive system configuration.
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Electronic Loads
Series EL
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The EL Series is a line of modular aircooled, DC electronic loads used to test power sources such as batteries, power supplies, generators, chargers, fuel cells, etc.Power ratings start at 1KW; standard models have maximum test capabilities of 50, 200, 400 and 600 volts. High current and power operation are achieved via parallel connection in a master/slave configuration. Individual modules are capable of up to 5KW and 800 amperes.
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Spectrum Analysis, Up To 50 GHz
S930905B
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The S930905B spectrum analysis adds high-performance microwave spectrum analysis to the N522xB/N523xB/N524xB PNA network analyzer family up to 50 GHz.
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Automotive Electronics Functional Test Systems
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Keysight Technologies’ TS-5000 Family of Automotive Electronics Functional Test Systems helps automotive electronics manufacturers get their products to market faster by accelerating test system deployment. It utilizes common architecture and core instrumentations to offer maximum flexibility to keep pace with the dynamic changes in the automotive electronic industry.
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Electron Microscope Sample Preparation
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Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
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Circuit Breaker Analysis System
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Weshine Electric Manufacturing Co., Ltd
1. Time measurement: 12 fracture intrinsic points, closing time, with the same period, phase with the same period.2. Reclosing measurement: each fracture closing - minute, minute - closing, minute - closing - minute process time, one minute time,one closing time, two closing time, gold short time, no current value.3. Bounce measurement: closing bounce time, bounce times, bounce waveform of each fracture, rebound amplitude of each fracture.
