Discrete Component Testers
check connected individual semiconductor components.
-
Product
Impact Series Power Discrete Semiconductor Tester
-
The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
-
Product
The Lorlin© Impact Series
-
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
-
Product
Benchtop Discrete Component Tester
Imapact 7BT
-
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.
-
Product
Bit Error Rate Tester - MATRIQ
Tester
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
-
Product
Universal A/V Tester
Tester
This tester was built for our client with the specific requirement that specific UUTs can be added to the system by our client. We handled developing test software for the first 2 UUTs utilizing an open programming structure that allowed programming modules to be strung together to create test programs for any additional UUT that our client wants to add in the future.
-
Product
Bit Error Rate Tester - PXI
BERT 1001/1005 Series
Tester
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
-
Product
PXI Vector Component Analyzer, 100 kHz to 44 GHz
M9817AS
Vector Component Analyzer
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
-
Product
Passive Component Integration - PXIe
Passive Series
Passive Component Integration
The Passive PXIe module is a highly customizable PXIe module that can integrate the passive components of your choice.We can customize the Passive module with a wide range of passive components: WDM couplers, splitters, circulators, band-pass filters, PM beamsplitters, MUX, DeMUX and more.Our spec sheet contains a selection of popular configurations.Please contact us to discuss your specific requirements at sales@quantifiphotonics.com.
-
Product
Gearbox Tester
Tester
The gearbox tester was designed to test the Azimuth Drive Unit (ADU) for a missile launcher. The ADU is the horizontal position controller for the launcher. It consists of a main drive shaft, a manual drive shaft and an output drive shaft. This system uses a multi-axis motion controller to operate.
-
Product
Passive Component Integration - MATRIQ
Passive Component Integration
The Passive is a highly customizable benchtop accessory that can integrate the passive components of your choice for convenient storage and integration into your test set up.We can customize the Passive module with a wide range of passive components: WDM couplers, splitters, circulators, band-pass filters, PM beamsplitters, MUX, DeMUX and more.Our spec sheet contains a selection of popular configurations.Please contact us to discuss your specific requirements at sales@quantifiphotonics.com.
-
Product
PXI Vector Component Analyzer, 100 kHz to 26.5 GHz
M9815AS
Vector Component Analyzer
The PXI vector component analyzer (VCA) enables complex multiport device characterization with continuous wave (CW) and modulated signal measurements.
-
Product
PAM4 Bit Error Rate Tester.
BERT-1102
Tester
The BERT-1102 is a 4 or 8-channel PPG and Error Detector for the design, characterization and manufacturing test of optical transceivers and opto-electrical components with symbol rates up to 29 GBaud/s in both NRZ and PAM4 formats. With scalability and exceptional signal fidelity, it is a cost-effective test solution for up to 400 Gb/s communication eco-systems.
-
Product
Hoist Tester
Tester
The system has the capability of operating hyraulic powered hoists, DC powered hoists and 400Hz AC powered hoists. When a unit is connected to the system it is automatically detected and the system will load the unit's control software, acceptance procedures and operational safety limits. By doing all of this the operator does not need to worry about anything other than installing the unit and clicking Run to execute a full test procedure.
-
Product
Error Detector Remote Head 32 and 17 Gb/s
N4952A
Bit Error Rate Tester (BERT)
The N4952A is an affordable and compact error detector remote head available in 4 to 17 Gb/s and 5 to 32 Gb/s configurations. Compatible with the N4960A Serial BERT controller, it is the perfect solution to test up to 32 Gb/s per channel for 100 Gigabit Ethernet applications and other high-data rate devices. The N4952A error detector supports PRBS or user patterns and operates up to 32 Gb/s in a single band with no gaps or missing data rates. The remote head allows the test equipment to be located very close to the device under test, eliminating the need for long cables that degrade signal quality.
-
Product
26.5 GHz Single-Mode Lightwave Component Analyzer
N4375E
Lightwave Component Analyzer
The new N4375E single-Mode LCA is based on the latest 5222A series network analyzers with 2-port or 4-port configuration. This LCA is the ideal measurement solution for electro-optical components up 26.5GHz electro-optical components, as well as Radio over Fiber (RoF) and aerospace and defense (A&D) electro-optical test applications. The N4375D is traceable to international standards and provides guaranteed specifications for electro-optical responsively S-parameter measurements in a turn-key solution. In combination with N4691B electronic calibration kit you get fastest setup of your test, so you can focus on developing your components. The new N4375D replaces the industry standard 8703A/B series and supports specified modulation frequencies up to 26.5 GHz at 1310nm and 1550nm source wavelength or individual wavelength with external optical input.
-
Product
Passive Component Integration
Passive Component Integration
Integrate passive optical components of your choice such as WDM couplers, splitters, band-pass filters, PM beamsplitters and circulators. PXIe and benchtop models support SMF, MMF and PMF.
-
Product
Lightwave Detector
N4377A
Lightwave Component Analyzer
The N4377A Lightwave Detector is a USB-powered optical-electrical converter with built-in optical power meter capability. If used with a vector network analyzer or a spectrum analyzer it enables frequency domain applications in photonics.
-
Product
110 GHz Lightwave Component Analyzer
N4372E
Lightwave Component Analyzer
The N4372E lightwave component analyzer helps you with optoelectronic tests with its measurement capability of 110 GHz in an extended wavelength range. It also offers RX testing up to 110 GHz in the full 1260 nm to 1620 nm range. It has a built-in optical power meter that enables you to check and control the operating power. The N4372E lightwave component analyzer's optical transmitter input port connects to an auxiliary tunable laser to verify S-parameters over wavelength.
-
Product
MTM-Bus Tester
PXIe-1149.5
BUS Tester
The Corelis PXIe-1149.5 is a versatile, multi-mode instrument for interfacing with MTM-Bus modules. The PXIe-1149.5 adds MTM-Bus master, slave, and monitoring with full IEEE-1149.5 electrical and protocol compatibility with a standard PXIe interface for convenient integration into any Test Program Set (TPS).
-
Product
120 GBd High-performance BERT
M8050A
Bit Error Rate Tester (BERT)
The Keysight M8050A high-performance bit error ratio tester (BERT) enables accurate characterization of receivers used in next-generation data center networks and server interfaces. With uncompromised signal integrity, support for NRZ, PAM4, PAM6, and PAM8 signals, and data rates up to 120 GBd, the flexible architecture of the M8050A supports 1.6T pathfinding as well as other leading-edge technologies.
-
Product
Lightwave Component Analyzer
N4373E
Lightwave Component Analyzer
The new Keysight N4373E LightWave Component Analyzer offers the latest N5224B, N5225B, and N5227B network analyzers with 2-port or 4-port configurations. This LCA is the ideal measurement solution for tests of electro-optical components up to 67 GHz. It is the ideal test instrument for electro-optical components for 40G/100GbE, for 400Gbit/s and 1 Tbit/s coherent transmission systems, as well as Radio over Fiber (RoF) and aerospace and defense (A&D) electro-optical test applications.
-
Product
Power Discrete Tester
Mostrak-2
-
M2 test system has multiple test generators which cover static and dynamic test procedures. It is our first truly modular tester which allows for the system to be upgraded and expanded when needed. M2 are designed to get the tester as close as possible to the handler interface and operator at the highest possible speeds. M2 is capable of HV (3 kV) and LV (600A) testing and has dynamic switching capabilities up to 1200V. MOSTRAK systems can test the following device types: MOSFET, IGBT, Bipolar transistor, Diode - rectifiers, Thyristor (SCR) - Triac, Linear voltage regulator (VReg), Transient voltage suppressor (TVS).
-
Product
Automated Discrete Semiconductor Tester (ATE)
5000E
-
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
-
Product
KVS Rugged Igniter Tester With Current Monitor
4314
Tester
The Valhalla Scientific Model 4314 KVS Digital Igniter Tester is designed to provide extremely safe and reliable resistance testing of explosive or volatile devices. Proven uses include fuses, squibs, igniters, explosive bolts, automobile airbag initiators and many others.
-
Product
Automated Discrete Semiconductor Tester (ATE)
5300HX
-
The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
-
Product
Component Testers
-
Unlike other handheld instruments such as LCR meters that make measurements using an AC signal with a specific test frequency, the 830C measures capacitance by applying a constant current that briefly charges, then discharges the connected capacitor.
-
Product
Switching Components
-
Designed to minimize layout restrictions and maximize ease of operation, Omron’s innovative switching components make manufacturing flexibility more attainable than ever.
-
Product
Passive Components
-
Focusing on frequency control products, electromagnetic interference (EMI/RFI) filters, and resistive components (potentiometers/encoders).
-
Product
X-Ray Components
-
Photonis designed the Micro Pore Optics detector to be used in X-Ray imaging applications. Its perfectly square, flat channels are optimized to allow X-Ray and UV photons to be focused or collimated due to the total external reflection at a grazing angle (<2°). Micro Pore Optics are installed on a number of international space missions.
-
Product
PLD/PED Components
-
Neocera offers a variety of components that can be fitted and combined into new or existing PLD and PED systems to provide improved functionality and enhanced capability. Components include:*Oxygen-compatible substrate heaters for epitaxial oxide film depositions..*Automated Target Carousels for preparing multilayer heterostructures.*Deposition chambers design specifically for PLD and PED systems.*Manual and automated laser window-change Accessories.*Pulsed Electron Deposition (PED) sources for laser transparent materials.*Ideal for retrofitting existing systems or construction of new systems.
