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CrystalCalHP Calibration System
AMETEK Sensors, Test & Calibration
This portable gauge and transmitter calibration system is 7 to 10 times faster than a deadweight tester. It allows you to do a 10 point up and down calibration in less than 3 minutes including printing out a calibration certificate.
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Automated Potentiometer Systems
Measurements International Ltd.
Intrinsically Accurate Self-Calibrating Ratio Divider, Best Accuracy < 0.05 ppm, Built-in 20-Channel Scanner, Arbitrary Voltages from 1 mV to 1200 V, Bipolar Voltage Measurements, Calibration of Fluke 5700A/5720A, Calibration of 3458A and 8508A, Calibration of Voltage Ratio Dividers (F752A, MI 1340A, G7520), Linearity Calibration of Digital Volt Meters (DVM), Traceability to 10 V Zener Reference.
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LHe/LN2 Cryostat System
129610A
Liquid nitrogen (LN2) or liquid helium (LHe) can be used as the cryogen depending on the required operating temperature range. This allows standard tests to be performed using relatively low cost LN2 as the cryogen. Higher cost LHe can be substituted for the duration of tests where very low temperature is required, providing an economical solution to your test requirements.
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Railway Testing
In the railway transportation testing filed, PONOVO has launched the DC testing equipment from low current output level upto 15,000 dc current to meet different testing requirement.
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Test Probe
INGUN, which has earned tremendous trust and achievements from customers all over the world in terms of quality and durability , has a network of distributors in about 50 countries around the world, and has a product lineup of more than 20,000 types.
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Software Abstraction for Easy Control of Digital IO Devices
Konrad DigitalIO
It consists of three modules:- A windows driver which is responsible for the communication and device abstraction- A DLL with NI TestStand Test Steps which allows easy integration in automated production environments- A standalone executable which simplifies debugging and setup of test sequencesThis architecture allows to open a communication channel from multiple instances to the same device. This is important when for example an I/O channel should be used in two independent applications.
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Diagnostic Test Tools For Switching Systems
You know that verification and diagnosis of complex switching operation in a test system has always been an issue. Two of our latest offerings in diagnostic test tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.
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Cable Identification System
After excavation, sometimes it is confusing to identify the right cable from a bunch of cables. Cable Identification is very important for the safety of field personnel – Cutting a wrong cable can be fatal. So, we require a Cable Identification System to identify the wanted cable.
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Discrete & Power Modules
A product portfolio that offers full spectrum of high, medium and low voltage power discrete devices along with advanced power module solutions, including IGBT, MOSFET, SiC, Si/SiC Hybrid, Diode, SiC Diode, and Intelligent Power Modules (IPMs).
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Embedded Device Analytics Sytem
VQmon
VQmon® is the most widely deployed and trusted technology for analyzing the performance of IP based voice and video services. VQmon is highly compact and resource efficient, and can be integrated into a wide range of environments including routers, business and residential networking and telecom equipment, soft clients and test equipment
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Vacuum Probing Systems
Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
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Torque Measurement Systems
Proper torque measurement is critical in many assembly operations. AIMCO provides expertise and measurement equipment for all three phases - before, during, and after assembly. Tool testing and capability studies can be easily performed in the tool crib or lab. Fine tuning of torque settings and process verification are achieved on the assembly line with rotary transducers. Use our complete line of electronic wrenches for final residual torque testing.
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Silicon Inspection System
NIR-01
The NIR-01 imaging system is made of CNC engineered Aluminium alloy. The suruface protection is powder painting and electrolitic oxidation on pure aluminium surfaces. The frame of the system is a high quality industrial design. All components are designed for long term heavy usage with minimal maintenance needs. Electrical components are also selected for stability and durability. The block like electronics gives the advantage of easy and quick repair.
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Brinell Optical Systems
Newage Testing Instruments, Inc.
Newage offers optical solutions for your hardness testing include the popular B.O.S.S. Brinell Optical Scanning System, HiLight optical scope and pocket optical scope.
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SIP-90-3 Test System Interface Probe
SIP-90-3
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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EMULATION TESTING
STORAGE
SANBlaze Technology, Inc. is a pioneer in storage emulation testing technologies and a leading provider of storage, networking and multifunction solutions for embedded systems. SANBlaze emulation systems are deployed in the test and development labs of most major storage hardware and software vendors worldwide.
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Blackbody System
IR-564/301
Infrared Systems Development Corp.
The IR-564 extends the temperature range of the IR-563 to 1200 º C by changing cavity materials to Silicon Carbide and high purity Alumina ceramics, otherwise the two units are virtually identical.
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Primary Injection Test Systems
Primary current injection testing is utilised in high current/high voltage scenarios found at large electrical installations such as substations. A large current (between 100A and 20,000A depending on system specifications and test requirements) is injected directly on the primary side of the electrical system such as a circuit breaker. The objective of the test is to identify how the system operates under various levels of current load.
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Automatic System
By combining with Hardness Tester, stage control is automated in indent/multi-pointmeasurement to reduce the dispersion caused by each operator. This system is very effective for large-scale rationalization and energy saving.
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Monitoring Devices
TDK Monitoring Devices - rf shielded hd video camera, rf shielded hd mini video camera, camera controller
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Modular Testing
Modular testing requirements come in all shapes and sizes. It is therefore important that we are able to match your requirement with a suitable ATE System. At ATE Solutions, we have a range of modular test and test automation products to choose from, with a tester to suit every situation.
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4 Channels DC Power Data Acquisition Device
NuDC-4U
NuDC-4U is an innovative product that provides better solution for power probing. Common DC power statistics including voltage, ampere and even the watt can be read instantly via NuDC-4U. Moreover, up to 4 sets of individual powers can be monitored simultaneously and the LCD screen can also display the maximum and minimum value of the current power during the test.
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Personal Dosemeter System
05NK003
Measure personal noise levels with the Dosemeter System. Kits consist of either 1 or 5 non-logging dosemeters with calibrator and case. Ideal for checking worker's exposure to noise and adhering to Control Of Noise At Work Regulations.
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Test Manufacturing
Since forming in 1986, Amfax has always recognised the importance of having a strong manufacturing department in house, staffed by skilled qualified individuals.
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Differential And I/Q Device Measurements
S96089B
The S96089B combines source-phase control of multiple internal or external sources with frequency-offset mode, enabling simplified test of I/Q modulators/converters, differential mixers, and harmonics or amplifiers.
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Vacuum Handling Systems
RECIF Technologies history started in 1982 offering its first wafer handling solution: Vacuum handling Systems.Based on this historical technical mastery, Recif Technologies provides today a full range of single wafer manual vacuum handling solutions adapted to our customers’ and current Semiconductor industry’s’ requirements.
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Device Connectivity
The ability of electronic devices to link and exchange data with each other, users, or the internet using wired or wireless technologies, forming networks that enable functions like remote monitoring, automation, and seamless data sharing, crucial for the Internet of Things (IoT) and smart systems.
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Automated Discrete Semiconductor Tester (ATE)
5000E
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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Product Testing
Verification of advertising promotional material in relation to operating, electrical, mechanical, or pneumatic performance; ease of assembly, type of material furnished, general capabilities, and overall safety. Detailed internal and external inspections conducted. Extensive facilities for furniture testing.
