-
Product
Active Scanning Technology
-
ZEISS invented scanning in response to the drawbacks of single-point measurement nearly 50 years ago. This game-changing development enables the capture of thousands of data points within just a few seconds for truly reliable tactile quality assurance. It also saves time and money by delivering the high throughput and accurate results that are vital for manufacturing.
-
Product
Scanning Electron Microscope
JSM-IT510
-
Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
-
Product
Laser Scanning Microscopes
-
The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
-
Product
Differential Scanning Calorimeter
DSC-60 Plus Series
-
DSC (Differential Scanning Calorimeter) is an indispensable thermal analyzer for materials characterization in R&D and quality control applications in such areas as polymers, pharmaceuticals, electronic parts , foods , etc . It offers the sensitivity and easy operation required for the development of high-performance, highly functional new materials.
-
-
Product
Scanning Probe Microscopes
SpectraView 2500
-
* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
-
Product
Scanning Vibrating Electrode Technique
VS-SVET
-
The Scanning Vibrating Electrode Technique uses a single wire to measures voltage drop in solution. This voltage drop is a result of local current at the surface of a sample. Measuring this voltage in solution images the current at the sample surface. Current can be naturally occurring from a corrosion or biological process, or the current can be externally controlled using a galvanostat.
-
Product
Scanning Probe Microscope
SPM-9700HT
-
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to observe their three-dimensional image or local properties at high magnifications. The SPM-9700HT takes high-throughput observations to the next level.
-
Product
Scanning Electron Microscopy (SEM Analysis)
-
Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
-
Product
Scanning Instruments
-
X-Rite scanning solutions automate press-side color control and are ideal for printers and converters who want to benefit from fast, accurate color. These systems not only remove the possibility of human error, they speed up make-ready and generate predictable and repeatable color results.
-
Product
Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
-
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
-
Product
Ultraschallmikroskop And Scanning Acoustic Microscopes
-
Microtronic Microelectronic Vertriebs GmbH
mage quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.Sonix has been the innovation leader since 1986. Today, the ECHO line of scanning acoustic microscopes sets the standard for package inspection speed and image quality, to help you keep pace with new packaging materials and difficult form factors. The ECHO platform will remain at the forefront as we continue to add features and enhance performance for years to come.
-
Product
Variable-Frequency Scanning Matrix
-
AllWin Instrument Science and Technology Co., Ltd.
1. Continuous Variable-frequency2. 4 way scanning matrix3. Constant pressure output
-
Product
Differential Scanning Calorimeters
-
Differential Scanning Calorimeters (DSC) measure temperatures and heat flows associated with thermal transitions in a material. Common usage includes investigation, selection, comparison and end-use performance evaluation of materials in research, quality control and production applications. Properties measured by TA Instruments’ DSC techniques include glass transitions, “cold” crystallization, phase changes, melting, crystallization, product stability, cure / cure kinetics, and oxidative stability.
-
Product
3D Scanning Coordinate Measurement Machine
CUBE-R™
-
CUBE-R™ is a fast, reliable, and efficient complete turnkey solution for automated quality control applications. This automated 3D measuring machine features MetraSCAN 3D-R, a powerful robot-mounted optical 3D scanner that can be integrated into factory automation systems without compromising on accuracy. It is the perfect alternative to solve any productivity issues caused by bottlenecks at the traditional coordinate measuring machine (CMM).
-
Product
Ultra-High Vacuum Scanning Kelvin Probe
-
Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
-
Product
3D Laser Scanning Systems
-
3D laser scanning is a construction, engineering, and architectural tool often used to document the existing conditions (as-builts) of any structure.
-
Product
Scanning Head For Energy Meter Test
PACB108
-
PACB08 is the accessory device to perform the energy meter test, which can work together with PONOVO’s relay test sets to test energy meter by using Energy Meter Module in Powertest software.
-
Product
kSA Scanning Pyro
-
For use on Veeco K465i and EPIK700 MOCVD reactors, the kSA Scanning Pyro performs automated temperature mapping in order to measure temperature variations across wafer carriers and wafers. Use it to tune heater zones and optimize process and hardware to achieve higher yields, wafer uniformity and device performance.
-
Product
Imaging Scanning Monochromator
H1034
-
HORIBA Scientific OEM has developed a high-throughput imaging scanning monochromator based on an aberration-corrected concave holographic grating with low stray light and high efficiency. This proprietary layout with single optics design is ideal for imaging for low-light applications. It features a 3-position external filter wheel, TTL drive electronics, 4-phase stepper motor and associated worm/gear 90:1 ratio mechanism, encoded, aligned and focused at factory.
-
Product
Spectro UV-Vis Auto Scanning Spectrophotometer
UV-2602
-
The new 2 way communication system allows the user, to give instructions right from your computer and gives you the ability to print and record results in an easy to use interface.A 2nm bandwidth gives you the accuracy needed in today's laboratories and its auto adjustment feature makes it easy to work with, providing more answers to scientific problems in less time.
-
Product
Scanning Auger Nanoprobe
PHI 710
-
The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.
-
Product
Brinell Optical Scanning System
B.O.S.S.
-
Newage Testing Instruments, Inc.
The B.O.S.S. brinell optical scanning system measures your brinell impressions faster, more accurately and more consistently. And it improves your quality control with advanced data acquisition and analysis capabilities, including the ability to save your high-resolution image of our impression to file.
-
Product
Spectro UV-Vis Double PC 8 Auto Cell Scanning Spectrophotometer
UVD-3000
-
Spectro UV-Vis Double PC 8 Auto Cell is a high performance UV-Vis double beam automatic scanning spectrophotometer. Spectro UV-Vis Double has a brand new optical system design, microcomputer controlled. It is capable of processing data, from analytical and spectrum testing.
-
Product
Scanning Tunneling Microscope for Ultra High Vacuum
STM
-
A.P.E. Research instrument is a versatile Scanning Tunneling Microscope, STM, capable of scanning samples of almost any size. It can operate in UHV and in air. The systems have been designed to evaporate (e.g. metals, organic molecules) in UHV directly onthe sample mounted on the STM head.
-
Product
Scanning Electron Microscopes
-
Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
-
-
Product
3D Scanning Services
-
The 3D scanning services provided by our 3D scanning facilities can capture 3D measurements from objects as small as a pin head or as large as a nuclear power generation facility. When we remove the constraints imposed by conventional measurement technologies, the scope of applications becomes virtually limitless with 3D digital data in hand.
-
Product
Scanning XPS/HAXPES Microprobe
PHI Quantes
-
The PHI Quantes is the only commercially available automated, high-throughput lab-based HAXPES spectrometer. It is a unique scanning X-ray photoelectron microprobe that combines a high energy (HAXPES) monochromatic X-ray source (Chromium Kα) with a conventional monochromatic soft X-ray source (Aluminum Kα). Both sources are high flux focused X-ray beams that can be scanned across the sample surface and can be used to define analysis points, areas, lines, and maps with 100% confidence.
-
Product
Scanning Probe Workstations
M470.
-
A modular, state-of-the-art instrument allowing users to exploit 9 local electrochemistry techniques.
