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Product
Scanning Kelvin Probe Microscope
VS-SKP
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The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Product
Talon 26 GHz Sentinel Intelligent Signal Scanning RTX Extreme Recorder
Talon RTX 2684
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- Search and capture system using Pentek's Sentinel™ Intelligent Signal Scanner- Captures RF signals from 1 GHz to 26 GHz- Capture and scan bandwidths up to 500 MHz- Selectable threshold triggered or manual record modes- 12-bit A/Ds with 57.5 dB SNR & 72 dB SFDR- Built-in DDC with selectable decimations of 4, 8 and 16- Rugged 1/2 ATR MIL-spec chassis for harsh mechanical and thermal environments- Environmentally sealed- Internally conduction-cooled- Fully sealed for RF emissions with EMI power line filter- MIL-STD circular connectors
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Product
Ultra-High Vacuum Scanning Kelvin Probe
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Our Ultra-high Vacuum Scanning Kelvin Probes (UHVSKP2020 and UHVSKP5050) give the user full access to work function (Φ) and contact potential difference (CPD) measurements under vacuum with the ability to scan a sample area of 20 x 20mm or 50 x 50mm respectively. Each system comes with the UHV head unit, tip amplifier (located at the mounting port), digital control unit and host PC with dedicated software. The tip can be retracted 100mm from the sample and approaches normal to the sample. The associated digital electronic unit powers the head unit and provides an interface between the head unit and the data acquisition system. The system comes with a complete user manual, which includes an introduction to work function measurements and a detailed description of the system software, including examples. The work function resolution of the Ultra-High Vacuum Scanning Kelvin Probes is 1-3 meV.
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Product
3D Scanning Reverse Engineering Services
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Reverse engineering is oftentimes a catch-all term used for many design and engineering applications. But trust us, there is so much more to this category for the uses of our 3D scanners, portable CMMs and laser trackers. Also, reverse engineering tends to imply that the 3D scanning will be used solely for product design, when in fact it can be used to address many other engineering functions such as:
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Product
Scanning Slit Beam Profiling
NanoScan
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Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Long Range Scanning
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Our contract measurement services include a variety of short-range (< 20 feet) and long-range (20 to 900 feet) high definition technologies, which use both contact and non-contact processes. With over a decade of experience in long range scanner technologies, we have the experience to determine the most affordable approach to your project and the expertise to do the job right. Our tools for long range scanner services include portable CMMs (PCMM) – both touch probes and laser trackers – and 3D laser mapping scanners.
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Product
Scanning Magnetic Microscope
Circuit ScanTM 1000
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Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Product
Scanning Probe Microscopy
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SPECS Surface Nano Analysis GmbH
As Scanning Probe Microscopy (SPM) is a key tool for nanotechnology, SPECS offers dedicated solutions for highly demanding requirements.In UHV, strong emphasis lies on spectroscopic methods such as scanning tunneling spectroscopy and inelastic tunneling spectroscopy as well as single atom and molecule manipulation. With the invention of a Joule-Thomson cryostat by Prof. Wulf Wulfhekel, SPECS now offers the JT-STM , operating sample and sensors in thermal equilibrium below 1K with optional high magnetic field.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Product
Scanning Electron Microscope
E5620
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The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Product
3D Laser Scanning Systems
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3D laser scanning is a construction, engineering, and architectural tool often used to document the existing conditions (as-builts) of any structure.
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Product
Scanning Probe Workstations
M470.
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A modular, state-of-the-art instrument allowing users to exploit 9 local electrochemistry techniques.
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Product
Rapid Scanning Auto-Correlator / Cross-Correlator
FR-103XL
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The FR-103XL is a dispersion-free Autocorrelator/CrossCorrelator for monitoring the temporal width of ultrashort optical pulses. Offering unsurpassed sensitivity and resolution, it is compact and easy to operate. The FR-103XL is ideally suited for the measurement weak signals in optical telecommunications, as well as pulses from other mode-locked lasers such as Ti-Sapphire.
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Product
Scanning Probe Workstations
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BioLogic has over 25 years of experience producing scanning probe electrochemistry instruments. Initially this included a number of single technique instruments, with the first modular scanning electrochemical workstation, the M370, introduced in 2006, under the Uniscan name.Scanning probe electrochemistry has found use in academic and commercial research settings. It is applicable in any field in which bulk electrochemical measurements have been used. Scanning probe electrochemistry has found widespread use in: Corrosion and coatings, Biology, including biosensors and biotechnology, Batteries, fuel cells and photovoltaics, Materials, Catalysis
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High-Resolution Scanning Probe Microscope (SPM)
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High-Resolution Scanning Probe Microscope (SPM)
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Product
NI-9149, 8-Slot, Zynq-7020 FPGA, Ethernet CompactRIO Chassis
783376-02
Chassis
8-Slot, Zynq-7020 FPGA, Ethernet CompactRIO Chassis - The NI‑9149 is a rugged Ethernet chassis that you can use to add C Series I/O modules to any standard Ethernet network. You can program the chassis using Scan Mode for fast expansion of your real-time system or using the onboard FPGA for inline processing and high-speed I/O and control. With the NI‑9149, you can add high-performance I/O to your PC-based application or expand your CompactRIO, PXI, or industrial controller application.
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Product
Reverse Engineering Software Module
Verisurf Reverse
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Verisurf REVERSE is a complete reverse engineering solution offering innovative tools to create CAD models from points, clouds, and meshes.REVERSE optimizes the performance of probing and scanning technologies such as portable arms, laser trackers, structured light, laser scanners, and many others.
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JTAG based Test & Flash Programming Services
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We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test: System-level DFT rule checking for production testing and inspection. Test strategy development and optimization for test cost reduction. JTAG, functional, and emulation-based test development and deployment. Product testing and troubleshooting services. Ultra fast in-system programming solutions (Flash, EEPROM).
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Product
Fourier Transform Infrared Spectrophotometer
IRTracer-100
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This system achieves excellent sensitivity with an SN ratio of 60,000:1, high resolution at 0.25 cm-1, and high-speed scanning capable of 20 spectra/second. The performance of medium and higher end models is supported by high reliability including advanced dynamic alignment and an interferometer with a dehumidifier. This is compatible with applications active in a variety of circumstances, with a library of approximately 12,000 spectra and data analysis programs for contaminant analysis, and time course and rapid scan programs for reaction tracking.
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Product
OEM Scan Engines
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Zebra Technologies Corporation
When you choose Zebra as your OEM partner, you get a portfolio of scan engines and devices that deliver industry-leading features, durability and reliability — saving everyone time and money. You save on development time and cost. And, your customers get best-in-class, well-proven solutions that drive time and cost out of their everyday operations.
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Short-Range Perimeter Surveillance Radar
Ranger® R1
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The Ranger® R1 is a ground-based perimeter surveillance and tracking radar that accurately detects personnel and vehicles at a range of up to 700 m. It scans a full 360° every second, covering up to 1.5 square km (0.6 square miles). Additional units — such as a mid-range Ranger® R2 — can be networked in an overlapping array to protect larger areas, stitching together an impassable radar area outside and inside your perimeter.
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Product
Network Testing Software
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Get the most out of your PCTEL® scanning receivers with SeeHawk® Touch and Collect network testing software and the SeeHawk™ Central cloud reporting and automation platform. Our intuitive interface makes it easy to conduct drive testing, walk testing, troubleshooting, commissioning, and reporting for cellular, WiFi, and critical communications networks indoors and out. With SeeHawk Central, you’ll also get instant online data access, workflow automation, and report sharing tools for grid-based in-building testing.
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Product
Spectrometers
OCEAN FX
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The next innovation in miniature spectrometers from Ocean Optics — Ocean FX™ — offers high-sensitivity CMOS detector performance, acquisition speed up to 3,000 scans per second, and a robust communications module that accommodates Ethernet and Wi-Fi. The new spectrometer is ideal for UV-Vis applications in food and agriculture, where acquisition speed helps with food sorting and processing; biomedical sciences, especially for absorbance measurements requiring enhanced UV sensitivity; and security and authenticity, where added communication interfaces enable simpler point-of-use instruments. Also, the onboard buffering feature ensures data integrity during kinetics measurements.
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Product
Controllers
BKM93KIO
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Clockwise and/or counter-clockwise rotation of the wand is programmable allowing an optimum adaptation to the machine.The scanning intensity is adjustable in 8 steps. Even rotating drills with small diameters can be checked.The scanning results are display as "OK" or "KO" and signalled by LEDs on the front side of the device.The PROFIBUS is a standard Sub-D 9 pin connection; the USB connection is a USB-mini plug / type B and meets the 2.0 specification.Three digital inputs serve to activate the functions "Teach-in" to learn the position to be scanned, "Start" to initialize the scanning process and "Configurable" for receiving a stop command.Two digital outputs provide the signals for the message "OK" or "KO".The relay contacts are configurable as N/C or N/O connections. They can be set as momentary (valid with start or timed) or latching.Convenient configuration software for programming and setting of tool data is available at no cost.
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Product
Sewer Laterals Scanner
ES-38
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The ES-38 is designed for scanning laterals from 3 to 8 inches in diameter. Using Electro Scan's proprietary technology, variations of electricity flowing through the pipe wall, associated with distance measurements, are automatically transmitted to Electro Scan's Smartphone application to record and display defect locations and their relative size.
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Product
XJLink2-3030
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The XJLink2-3030 provides convenient, integrated access to XJTAG’s powerful boundary scan test and programming tools from SPEA 3030 ICT machines.
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Product
JTAG Boundary-Scan Hardware
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JTAG Boundary-Scan Hardware by Corelis, including boundary-scan controllers, 12C serial bus protocol analyzers & exercisers, JTAG boundary Scan Modules, high-volume production JTAG systems, 7 support for 3rd party JTAG controllers
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Product
CL MX4 Frame Grabber
Xtium-CL MX4
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Building on the field proven capability of Teledyne DALSA’s Xcelera frame grabber series, the Xtium™-CL MX4 is based on industry standard PCI Express™ Gen 2.0 expansion bus to deliver high speed access to host memory. The new Xtium series offers higher bandwidth to sustain Camera Link® 80-Bit modes over longer cable distances and supports a wide variety of area and line scan color/monochrome cameras, all in a compact, half-length, single slot solution.
