Scanning Electron Microscopy
surface imaging from 1 to 5 nm in size.
See Also: Scanning Electron Microscopes, SEM
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Scanning Electron Microscopy (SEM Analysis)
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Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Semiconductor
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Aerotech has a long history of engineering and manufacturing motion systems and components for high precision wafer processing, scanning electron microscopy (SEM), wafer bumping, 450 mm wafer manufacturing, lithography equipment and advanced laser micromachining. We also specialize in systems and components for vacuum applications, such as EUV lithography. So whether you need off-the-shelf wafer bumping components or a custom-engineered SEM system manufactured and tested to exacting specifications, Aerotech can provide the optimal solution for your application.
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TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
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ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
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Analytical Services
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IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
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Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Cross Sections and Metallography
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Rocky Mountain Laboratories, Inc.
Cross sections are prepared by mounting samples in epoxy and then grinding and polishing the mount for imaging in the optical microscope or Scanning Electron Microscopy (SEM). Valuable information from cross sectioning can include: film thicknesses, inclusions, corrosion thickness, dimensional verification, and subsurface defects. Metallographic cross sections are typically etched to reveal the microstructure. Microstructural analysis can provide information about heat treatment history, corrosion susceptibility, as well as undesirable microconstituents.
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Integrated AI-ADAS ECU And Cameras For Large Commercial Vehicle
ADM-TJ30
Electronic Control Unit
The integrated AI-ADAS ECU is connected to 8 cameras and powered by the vision-AI algorithm. It can detect and classify different kinds of vehicles/ pedestrians/ two-wheeler riders/ lane marking and other objects to perform multiple ADAS functions.
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x1149 Boundary Scan Analyzer
N1125A
Boundary Scan Analyzer
The x1149 is a tool for engineers to perform structural test such as opens and shorts tests on their PCBAs. It also performs In-System Programming for devices such as FPGAs and CPLDs.
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RF Electronic Calibration Module (ECal), DC/300 KHz To 9 GHz, 4.3-10, 2 Port
85094D
Electronic Calibration Module
The Keysight 85094D RF electronic calibration (ECal) module makes the calibration of vector network analyzers fast, easy, and accurate. ECal is a precision, single-connection calibration technique for your vector network analyzer. Performing a full two-port calibration takes less than half the time and a number of connections using ECal versus mechanical calibration kits. Furthermore, the accuracy of the calibration is comparable between electronic and mechanical methods. Traditional mechanical calibrations require intensive operator interaction, which is prone to errors. With ECal, the operator simply connects the ECal module to the network analyzer and the software controls the rest.
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RF Electronic Calibration Module (ECal), DC/300 KHz To 26.5 GHz, 4-ports
N4433D
Electronic Calibration Module
The Keysight N4433D RF electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4433D is a precision 4-ports ECal module that supports selection of 3.5 mm connector and can be mixed up to 26.5 GHz. Select either female-female, male-male, or female-male connectors.
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RF Electronic Calibration Module (ECal), DC/300 KHz To 9 GHz, 3.5 Mm, 2 Port
85093D
Electronic Calibration Module
The Keysight 85093D RF electronic calibration (ECal) module makes the calibration of vector network analyzers fast, easy, and accurate. ECal is a precision, single-connection calibration technique for your vector network analyzer. Performing a full two-port calibration takes less than half the time and a number of connections using ECal versus mechanical calibration kits. Furthermore, the accuracy of the calibration is comparable between electronic and mechanical methods. Traditional mechanical calibrations require intensive operator interaction, which is prone to errors. With ECal, the operator simply connects the ECal module to the network analyzer and the software controls the rest.
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Electronic Calibration Module (ECal), 40 GHz, 2.92 Mm, 2-port
N4692D
Electronic Calibration Module
The Keysight N4692D microwave electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4692D is a precision 2-port ECal module that supports 2.92 mm connectors up to 40 GHz. Select either female-female, male-male, or female-male connectors. The plastic storage case for the N4692D is included for securing your ECal module and accessories.
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RF Electronic Calibration Module (ECal), DC To 13.5 GHz, 4-ports
N4431D
Electronic Calibration Module
The Keysight N4431D RF electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4431D is a precision 4-ports ECal module that supports multiple selection of connectors like Type-N, 3.5 mm, 7-16 and 4.3-10 connectors and can be mixed up to 13.5 GHz. Select either female-female, male-male, or female-male connectors.
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RF Electronic Calibration Module (ECal), DC/300 KHz To 7.5 GHz, 7-16, 2 Port
85098D
Electronic Calibration Module
The Keysight 85098D RF electronic calibration (ECal) module makes the calibration of vector network analyzers fast, easy, and accurate. ECal is a precision, single-connection calibration technique for your vector network analyzer. Performing a full two-port calibration takes less than half the time and a number of connections using ECal versus mechanical calibration kits. Furthermore, the accuracy of the calibration is comparable between electronic and mechanical methods. Traditional mechanical calibrations require intensive operator interaction, which is prone to errors. With ECal, the operator simply connects the ECal module to the network analyzer and the software controls the rest.
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Electronic Calibration Module (ECal), DC-4 GHz, 2-Port
N7550A
Electronic Calibration Module
The N7550A is part of Keysight’s family of value-line electronic calibration (ECal) modules that makes calibration of vector network analyzers fast, easy and accurate. Cut your calibration down to half the time it normally takes using a traditional mechanical cal kit. Simply connect it to your instrument and the firmware does the rest. For greater precision and higher accuracy measurements consider the N44xx and N469x family of ECal products.
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Electronic Calibration Module (ECal), 26.5 GHz, 3.5 Mm, 2-port
N4691D
Electronic Calibration Module
The Keysight N4691D microwave electronic calibration (ECal) module makes calibration of Keysight vector network analyzers fast, easy and accurate. The N4691D is a precision 2-port ECal module that supports 3.5 mm connectors up to 26.5 GHz. Select either female-female, male-male, or female-male connectors. The plastic storage case for the N4691D is included for securing your ECal module and accessories.
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RF Electronic Calibration Module (ECal), DC/300 KHz To 9 GHz, 7mm, 2 Port
85091D
Electronic Calibration Module
The Keysight 85091D RF electronic calibration (ECal) module makes the calibration of vector network analyzers fast, easy, and accurate. ECal is a precision, single-connection calibration technique for your vector network analyzer. Performing a full two-port calibration takes less than half the time and a number of connections using ECal versus mechanical calibration kits. Furthermore, the accuracy of the calibration is comparable between electronic and mechanical methods. Traditional mechanical calibrations require intensive operator interaction, which is prone to errors. With ECal, the operator simply connects the ECal module to the network analyzer and the software controls the rest.
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Scanning Electron Microscope
JSM-IT510
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Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Electronic Calibration Module, DC To 6.5 GHz, 2-Port
N7551A
Electronic Calibration Module
Reduce your calibration time by half with a smaller, lighter 2-port module that supports 3.5 mm or type-N 50 Ω connectors
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Multiport Electronic Calibration Module (ECal), DC To 9 GHz, 6-ports
N7562A
Electronic Calibration Module
A series of multiport ECal that cascade-able up to 36-ports which makes it possible to calibrate a wide frequency range from DC up to 9 GHz without making numerous connections during calibration process. Ideal for multiport measurement application with VNA in such as high-volume PA/FEM, massive MIMO antenna or high-speed digital interconnect test applications
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Scanning Thermal Microscopy Module
VertiSense™
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SThM module for thermal conductivity contrast and a temperature contrast imaging. Supports Contact, Tapping™ and Peak Force Tapping modes. Plug-in module, compatible with most commercial AFMs. Real temperature measurements up to 700° C. Ultra-low noise, high speed amplifier. Innovative probe design.
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Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
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HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Scanning Electron Microscopes
SEM
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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Cryo-Correlative Microscopy Stage
CMS196
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Linkham Scientific Instruments
Electron microscopy (EM) provides structural information at very high resolution. However, it can give only restricted insight into biological and chemical processes due to limitations in staining and sample preparation processes. Fluorescence microscopy on the other hand is a very sensitive method to detect biological, chemical and genetic processes and events inside living cells. Cryo-CLEM brings it all together: it is a new and emerging technique to combine the individual advantages from both Fluorescence and EM by imaging the same sample location with both techniques and superimposing the complementing information.
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Optical Microscopy
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Rocky Mountain Laboratories, Inc.
Optical microscopy from 1X to 1000X is achieved with a variety of microscopes. Images can be formed in bright field, dark field, and differential interference contrast (DIC or ‘Nomarski’) modes. Optical microscopy anlaysis is often used before any other techniques to document samples. Color and morphology are important clues in materials identification.
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Analytical Software for Microscopy
SPIP
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SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
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Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Electronic Calibration Module, DC To 9 GHz, 2-Port
N7552A
Electronic Calibration Module
Reduce your calibration time by half with a smaller, lighter 2-port module that supports 3.5 mm or type-N 50 Ω connectors
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Boundary Scan
TurboBSD
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TurboBSD is SynTest high-performance Boundary Scan Designer. It is 100% compliant to the IEEE 1149.1 Boundary Scan Standard. TurboBSD performs Boundary Scan logic synthesis, creates BSDL (Boundary Scan Description Language) file, and generates Boundary Scan test patterns
