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Product
Memory Testing
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C.C.P. Contact Probes Co., LTD.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
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Product
Memory
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Renesas offers MIL-STD-883-compliant CMOS random access memory (RAM) and CMOS programmable read-only memory (PROM) devices that are that are qualified to QML Class Q military standards.
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Product
Memory Tester
RAMCHECK
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RAMCHECK is our most advanced memory tester and is the latest in our product line. Highly modular and user friendly, it redefines the capabilities of an affordable and portable ram checker.
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Industrial Flash & Memory Solutions
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Advantech provides a full range of industrial storage module, memory module, and embedded I/O module.
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Product
Reflective Memory Hub
ACC-5595
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The ACC-5595 is a managed hub designed to operate with our 5565 family of Reflective Memory real-time network products. The Reflective Memory hub can automatically bypass ports when it detects a loss of signal or the loss of valid synchronization patterns, allowing the other nodes in the network to remain operational.
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Product
New Generation Memory Expansion
SQR-CX5N
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New Generation Memory Expansion_CXL 2.0 E3.S 2T DDR5. EDSFF E3.S 2T form-factor, Data Transfer Rate: PCIe Gen 5.0x8 32GT/s. Capacity : 64GB Operating Temperature: 0°C ~ 70°C.
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Product
Memory Test System
T5221
Test System
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Product
SO-DIMM DDR Memory
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Extend operating temperatures of memory with Advantech. We offer industrial grade SO-DDR 400 memory with 30μ" gold plating connector (200 pin) supporting 2.5v operating voltage and wide operating temperature ranges from 0 ~ 95℃ (32 ~ 203℉).
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Product
Memory Test System
T5835
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The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Product
Shared Memory Network
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Avionics Interface Technologies
AIT's Shared Memory Network (SMN) interface modules provide host systems with an interface to a high speed (2.125 Gbps) optical data network which can be used to share data, in real-time, between multiple distributed systems.
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Product
288-Pin Dual In-Line Memory Module
SQR-UD4(ECC)
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SQRAM is Industrial Grade DRAM memory. all of SQRAM are designed with original IC chip and adopt a rigorous test program.
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Product
DRAM DDR2 Memory
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Enable better electrical performance and speed (compared to DDR) with Advantech. We offers DDR2 800/667 memory with 30μ" gold plating connector (240 pin) featuring 1.8v operating voltage and better bandwidth. With rigorous reliability, vibration tests, and 0 ~ 85℃ (32 ~ 185℉) wide operating temperature range, our certified DIMM are fully suitable for enterprise, embedded, automotive, data centers, and networking applications.
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Product
Memory And Storage
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Intel provides technically advanced products that support every level of computing—from data center workloads to enthusiast usage. Intel® Optane™ memory creates an accelerated bridge between memory and storage. Intel® Solid State Drives (Intel® SSDs) provide storage flexibility, stability, and efficiency.
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Product
Memory Test Systems
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ICs that record and retain data are called memory devices. Our memory test systems are optimized for volume production of memory semiconductors, a market where low-mix high-volume production is the norm, and feature industry-best parallelism (the ability to test a large number of semiconductors at the same time).
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Product
SO-DIMM DDR2 Memory
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Enable better electrical performance and speed (compared to SO-DDR) with Advantech. We offers industrial grade SO-DDR2 800/667 memory with 30μ" gold plating connector (200 pin), featuring 1.8v operating voltage and better bandwidth.
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Product
Ultra-high Performance Solution for Memory Device Test
Magnum EPIC
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Teradyne’s Magnum EPIC is a high-performance test solution for latest generation DRAM devices. These devices are key enablers for technologies like 5G, AI, cloud computing, autonomous vehicles, AR/VR and applications with high definition graphics.
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Product
Shared Memory Network PCI & PCIx Interface
PCI-SMN
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Avionics Interface Technologies
2.125 Gbps Optical loop network - Single-mode and Multi-mode optical interfaces supported - Up to 256 Shared Memory Network nodes supported - Up to 200 MByte/sec sustained data rates - Maximum 500 nS latency between nodes - Network interrupts supported - Compatible with PCI & PCIx Host System Slots - Software Drivers available for Windows, Linux, LabVIEW Real-Time, and VxWorks
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Product
Memory Tester for DDR4 DIMMS
RAMCHECK LX
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USBWith the RAMCHECK LX DDR4 memory tester package (part number INN-8686-DDR4) you can quickly test and identify DDR4 DIMMs that comply with JEDEC standards. Tests are fast, reliable and easy to do. The RAMCHECK LX DDR4 package includes the RAMCHECK LX base tester and 288-pin DDR4 DIMM adapter. (This package is also available with the DDR4 DIMM Pro adapter, featuring a very rugged test socket).
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Product
Lan Ethernet Digitizer, 14 Bit, 8 Channel 125 MS/s Up To 8 GS Memory
Octopus-X
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The GaGe series of Faceless Connected Instruments (FCiX) provide test and measurement professionals new options for integrating high resolution, multi-channel digitizers into Ethernet and LAN enabled measurement systems. The applications served include manufacturing test, automotive test, remote communications monitoring, multi-site semiconductor test, and other solutions where a lightweight but powerful, multi-channel, independent digitizer system is required.
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Product
Memory Burn-in Tester
B6700 Series
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B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Product
Lan Digitizer / Oszilloscope With 8 Bit, 1x2GS/s Or 2x1GS/s Up To 8 GS Memory
Cobra-X
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The GaGe FCiX Cobra/CobraMax LAN digitizer features 2 channels of 8-bit resolution with a maximum sampling rate up to 2 or 4 GS/s for one channel and up to 1 or 2 GS/s for two channels and true Effective Number of Bits (ENOB) up to 7.6-bits with 10 MHz input.
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Product
SO-DIMM DDR5 Memory
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the 5th generation of DDR memory designed as a small-form-factor module for laptops, notebooks, and mini-PCs.
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Product
14 Bit Digitizer For PCIe With 8 Channels 65 MS/s Up To 8 GS Memory
Octopus-14 Express / CompuScope Express 8385
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The GaGe Octopus Express 83XX CompuScope PCIe digitizer board features 14-bit resolution with sampling rates up to 125 MS/s with true Effective Number of Bits (ENOB) of 11-bits with 10 MHz input.
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Product
12 Bit, 2 Channels 3 GS/s PCI Express Gen-3 Digitizer Up To 8 GB Memory
EON Express / CompuScope 123G2
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The new ultra high-speed, high-resolution Gage digitizers series EON Express CompuScope offers sampling of 3 GS/s at two channels on a single slot PCI Express card and are available with various on-board memory depths from 2 GS to 8 GS
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Product
DDR4 Pro Memory Test Adapter
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This memory test adapter for the RAMCHECK LX includes an extraordinarily rugged test socket for many thousands of insertion/removal cycles.
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Product
Volatile Memory
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CAES offers an extensive volatile memory portfolio developed to handle the demands of harsh space and terrestrial environments.
