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Product
NI-9226, 8-Channel, 400 S/s Aggregate, 0 Ω to 4000 Ω, PT1000 RTD C Series Temperature Input Module
783864-01
Temperature Input Module
8-Channel, 400 S/s Aggregate, 0 Ω to 4000 Ω, PT1000 RTD C Series Temperature Input Module - The NI‑9226 is a resistance temperature detector (RTD) input module. You can configure the NI‑9226 for two sample rate modes: high sample rate or high resolution. The NI‑9226 is compatible with 3‑ and 4‑wire RTD measurements, and it automatically detects the type of RTD (3‑ or 4‑wire) connected to the channel and configures each channel for the appropriate mode. The module provides per-channel current excitation. The NI‑9226 features calibration and includes a channel‑to‑earth ground double isolation barrier for safety, noise immunity, and a high common-mode voltage range.
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Product
Source / Measure Unit (SMU) Modules, N6700 Power System
System
The Keysight N6780 family of source/measure units (SMUs) provide advanced features and precise control and measurements of voltage and current down to the microampere and nanoampere regions. They provide stable, glitch-free output voltage and current during high-speed load changes, fast output modulation, and high-speed measurements of both voltage and current simultaneous.
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Product
NVIDIA® Jetson Xavier™ NX Edge AI Vision Inference System
EOS-JNX Series
System
The EOS-JNX series has a built-in Smart PoE feature to control PoE power remotely to reduce maintenance efforts in challenging environments and provides PoE power loss detection to alert of any unexpected PoE disconnection. The EOS-JNX-I is designed as an AI PoE switch for connecting to IP cameras to enable AI inferencing, and also provides an uplink port to connect to a network video recorder (NVR) for recording video streams, making upgrading existing surveillance systems easy. The EOS-JNX-G is designed for industrial AI machine vision applications, providing a dedicated bandwidth of 1Gb per channel with a GigE camera connection, which is crucial for production line and manufacturing applications.
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Product
NI-9217, 4-Channel, 400 S/s Aggregate, 0 Ω to 400 Ω, PT100 RTD C Series Temperature Input Module
779592-01
Temperature Input Module
4-Channel, 400 S/s Aggregate, 0 Ω to 400 Ω, PT100 RTD C Series Temperature Input Module - The NI‑9217 is a resistance temperature detector (RTD) input module. You can configure the NI‑9217 for two sample rate modes: high sample rate or high resolution. The NI‑9217 is compatible with 3‑ and 4‑wire RTD measurements, and it automatically detects the type of RTD (3‑ or 4‑wire) connected to the channel and configures each channel for the appropriate mode. The module provides per channel current excitation. The NI‑9217 features calibration and includes a channel‑to‑earth ground double isolation barrier for safety, noise immunity, and a high common-mode voltage range.
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Product
Communications System Analyzer
Freedom R8200
System
The Freedom R8200 from Astronics Test Systems represents a major step in the evolution of the Land Mobile Radio Test. The Freedom R8200 is the first and only test instrument that combines comprehensive digital and analog LMR testing with the ability to measure important RF network characteristics, such as Distance to Fault (DTF), Return Loss, and Voltage Standing Wave Ratio (VSWR). The Freedom R8200 is also the only service monitor with the abilityto display advanced RF Parameters in a Smith Chart for more complicated network analysis
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Product
Avenir VIP IFE & CMS Systems
System
The new Avenir Line is the next generation of Cabin Management and In-Flight Entertainment Systems (CMS/IFE) from Astronics. Avenir incorporates the latest technologies to deliver native 4K video distribution through the highest bandwidth Ethernet network system in the industry. It also provides a fully customizable experience, which extends to the graphical user interface.
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Product
NI-9213, 16-Channel, 75 S/s Aggregate, ±78 mV C Series Temperature Input Module
785185-02
Temperature Input Module
16-Channel, 75 S/s Aggregate, ±78 mV C Series Temperature Input Module - The NI‑9213 is a high-density thermocouple input module that is designed for higher channel count systems. With this module, you can add thermocouples to mixed-signal test systems without taking up too many slots. The NI‑9213 includes anti-aliasing filters, open-thermocouple detection, and cold-junction compensation for high-accuracy thermocouple measurements. The NI‑9213 features NIST‑traceable calibration and a channel‑to‑earth ground double isolation barrier for safety, noise immunity, and high common-mode voltage range.
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Product
Test Requirements Document (TRD) System
TRD Software
System
The Test Requirements Document (TRD) System helps users develop and document the strategy and structure of test programs.
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Product
Onboard Systems
System
Collect and store critical data securely to facilitate train operation monitoring, driver performance evaluation, and post-event investigation; reliable data management can yield improved operational efficiency and safety
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Product
NI-9216, 8-Channel, 400 S/s Aggregate, 0 Ω to 400 Ω, PT100 RTD C Series Temperature Input Module
783863-02
Temperature Input Module
8-Channel, 400 S/s Aggregate, 0 Ω to 400 Ω, PT100 RTD C Series Temperature Input Module - The NI‑9216 is a resistance temperature detector (RTD) input module. You can configure the NI‑9216 for two sample rate modes: high sample rate or high resolution. The NI‑9216 is compatible with 3‑ and 4‑wire RTD measurements, and it automatically detects the type of RTD (3-‑or 4‑wire) connected to the channel and configures each channel for the appropriate mode. The module provides per channel current excitation. The NI‑9216 features calibration and includes a channel‑to‑earth ground double isolation barrier for safety, noise immunity, and a high common-mode voltage range.
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Product
Scienlab Battery Test System — Cell Level
SL1002A
Test System
Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
Wafer Chip Inspection System
7940
System
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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Product
Advanced SoC/Analog Test System
3650-EX
Test System
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
Air Temperature Probe
U1183A
Air Temperature Probe
Measure dryer, transport pipe, and surrounding air temperature within the range of -50°C to 800°C.
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Product
LoRaWAN® Enabled Temperature And Humidity Sensor
EVA-2310
Temperature Sensor
LoRaWAN® wireless connectivity-20 °C to 55 °C temperature detection range0%RH to 90%RH humidity detection rangeBattery life up till 5 years@25 °C, 15 mins interval settingEasy to deploy and maintain
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
Mezzanine System
5235
System
The 5235 ECM provides 16 bits of simple digital I/O. The digital I/O is connected directly to the digital I/O on the carrier card. Inputs are clamped to about 3V by FET buffer ICs, and are 5V tolerant.
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Product
Mezzanine System
5174
System
The 5174 provides two major functions, serving as a precision Voltage Controlled oscillator board and a variable frequency source board. These features can be use together or independently. As a variable frequency source, the 5174 provides a high-resolution variable clock source that is based upon a reference clock supplied by the ECM carrier.
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Product
VLSI Test System
3380
Test System
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
SoC Test Systems
Test System
SoC (System on Chip) devices integrate multiple different functions into a single chip. Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.
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Product
Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
System
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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Product
Image Sensor Test System
IP750
Test System
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
NI-9226, 8-Channel, 400 S/s Aggregate, 0 Ω to 4000 Ω, PT1000 RTD C Series Temperature Input Module
783864-02
Temperature Input Module
8-Channel, 400 S/s Aggregate, 0 Ω to 4000 Ω, PT1000 RTD C Series Temperature Input Module - The NI‑9226 is a resistance temperature detector (RTD) input module. You can configure the NI‑9226 for two sample rate modes: high sample rate or high resolution. The NI‑9226 is compatible with 3‑ and 4‑wire RTD measurements, and it automatically detects the type of RTD (3‑ or 4‑wire) connected to the channel and configures each channel for the appropriate mode. The module provides per-channel current excitation. The NI‑9226 features calibration and includes a channel‑to‑earth ground double isolation barrier for safety, noise immunity, and a high common-mode voltage range.
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Product
Conformance Test System
TS-RRM
Test System
The R&S®TS-RRM 5G and LTE test system is a test solution for running 5G NR and LTE inter-RAT RRM test cases for certification of wireless devices.It is a fully automated conformance test system for running validated RRM conformance test cases. In addition to the RRM test cases required by GCF/PTCRB, the R&S®TS-RRM also supports carrier acceptance specific RRM tests.
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Product
Universal Function Test System for Industrial Electronics
Test System
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
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Product
Communications Test System for Frontline Diagnostics
ATS3000P
Test System
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Product
VLSI Test System
3380D
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
Thermistor Temperature Probe
E2308A
Temperature Probe
The Keysight E2308A is a general purpose temperature probe. The thermistor (5 k ohm at 25 degrees C) is encapsulated in a stainless steel case and typically used for liquid temperature measurements.
