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96 Channel DPST Relay And Control PXI Carrier Card
GX6196
The GX6196 is a 6U PXI switch and control board that can be used to create custom switching, signal conditioning, or specific UUT control interfaces. The board provides 96, 2 pole, form A relays, 8 digital I/O lines, and a serial digital interface. All of these resources are available via (5) inter-board connectors which interface to the user defined daughter / mezzanine board. The mezzanine board provides all connections to the unit under test (UUT) via two 78 pin D-sub connectors. The GX6196 is supplied with a front panel which accepts (2) 78 pin D-sub connectors.
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Jandel Test Unit
HM21
The Jandel HM21 Test Unit has six constant current settings between 100nA and 10mA, and can be used to measure voltages from 0.01mV to 1250mV.
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
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Test Program Execution for High-Volume Production Systems
ScanExpress Runner Gang
Electronic manufacturing test systems must be fast and efficient. Schedules today are shorter, products are more complex, and the market demands higher speed—the product needs to be built and shipped yesterday.ScanExpress Runner Gang Edition is a concurrent boundary-scan and in-system programming test executive designed specifically for high volume production. Unlike traditional test systems which execute sequentially on a single unit under test (UUT) at a time, ScanExpress Runner Gang Edition provides concurrent (gang) testing on up to 8 UUTs for improved test and programming times.
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Wafer-Level Parametric Test
Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Wireless Test Standards Software
Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Alternator & Starter Testers
JBT and AST Series
D&V's JBT and AST line of testing units are multipurpose computerized testing systems for alternators and starters.
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Testing Service
CloudTesting™ Service
CloudTesting™ Service is an Industry First, On-Demand Testing Service. CloudTesting™ Station is free rent. Fees for Testing IP are paid monthly.
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Universal relay test set and commissioning tool
CMC 356
The CMC 356 is the universal solution for testing all generations and types of protection relays. Its powerful six current sources (three-phase mode: up to 64 A / 860 VA per channel) with a great dynamic range, make the unit capable of testing even high-burden electromechanical relays with very high power demands.
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Liquid Test Fixture
16452A
The 16452A provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixure.
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sbRIO-9871, Non-Enclosed, 4-Port, RS485/RS422 C Series Serial Instrument Control Module
780879-01
The sbRIO‑9871 adds RS485/RS422 serial ports to CompactRIO systems. The serial ports are accessed directly from the FPGA to offer you flexibility in communicating with serial devices. The module has individual buffers on every port that save FPGA space and simplify programming. The sbRIO‑9870 supports standard start bit, stop bit, and handshaking settings. It uses an external power to provide maximum compatibility and reliability under all serial port conditions. Non-enclosed modules are designed for OEM applications.
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Parallel Electrode SMD Test Fixture
16192A
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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PCI Express 4.0 Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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6TL60 Rotary Test Handler
H79006010
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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PXI 16-Channel 4-Bus 2A Fault Insertion Switch
40-197A-002
This 16-channel fault insertion switch is primarily intended for routing simulated fault conditions in automotive and aerospace applications involving the reliability testing of safety critical controllers.
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Automated Test Systems
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Mixed Signal Battery Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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Imperial Test Executive
ITE
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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PXI 10A Fault Insertion Switch 10-Chan 1-Bus
40-199-001
The 40-199 is a 10 Channel Fault Insertion switch designed for the simulation of fault conditions in automotive/avionics applications, involving the reliability testing of safety critical controllers.
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PXIe-4147, 4-Channel, ±8 V, 3 A Precision PXIe Source Measure Unit
786888-01
PXIe, 4-Channel, ±8 V, 3 A Precision PXI Source Measure Unit - The PXIe-4147 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote four-wire sensing for accurate measurements. The sample rate of the PXIe-4147 can reduce measurement times, capture transient device characteristics, and help you perform current-voltage (I-V) characterization of devices-under-test (DUTs). With a high-speed sequencing engine, you can synchronize SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4147 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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64-Ch 1-Bus Fault Insertion
YAV91082
64 channels 1 thread 2A 250V 1 Fault Insertion Buses Switching up 60W CAN Control (or Ethernet with Ethernet to CAN Gateway) Drivers dll & VIs available
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Scienlab Combined Battery Test Solution
SL1133A
Solution for testing battery cells with an output power up to ±3 kW and a voltage range up to 6 V.
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PXI Fault Insertion Switch, 7-Channel, Two Fault Buses, 20 A, Hardware Interlock
40-193A-002-HI
The 40-193A-002-HI is a 7-Channel Fault Insertion switch with hardware interlock and two fault buses, designed for the simulation of fault conditions in automotive systems. The module is capable of switching current up to 20A.
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19inch 43U Heavy Duty Test Platform
6TL28
The 6TL28 is a bare rack for creating Off-Line, modular, flexible, and reliable Base test platforms. The overall rack capacity is 43U (640mm depth).
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Test Platforms
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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PXIe Source/Measure Unit, 15 MSa/s, 1 PA, 60 V, 3.5 A DC/10.5 A Pulse
M9602A
The Keysight M9602A is a PXIe SMU featuring best-in-their-class narrow pulse width as narrow as 10 μs. It enables dynamic/pulsed measurements with up to 15 MSa/s for broad emerging applications such as VCSEL optical devices.
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Other Test Systems
Your business challenges do not fit the typical mold. Your test requirements are different. Ball Systems has more than 50 years of experience in multiple industries that has exposed our team to a wide variety of testing applications. As a result, we’ve likely created a solution for a challenge similar to yours.
