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Acceptance Test
resolves the fulfillment of requirements. Also known as: Acceptance Testing
See Also: QA
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Carrier Acceptance Test Solutions for Network Operators
The Rohde & Schwarz carrier acceptance test systems provide access to the most important test plans of the world’s major mobile operators.Voice over NR, data throughput, protocol, positioning, RF, RRM and application testing – all relevant test scenarios are available on a common hardware platform.The entire range of 5G NR testing modes are available, covering sub-8 GHz (FR1) and mmWave (FR2) frequencies, and both non-standalone (NSA) and standalone (SA) modes.Contact your Rohde & Schwarz sales representative to learn more about the latest products and features.
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5G Carrier Acceptance Test System
NetOp
R&S®NetOp is the leading platform for network operator device acceptance test, covering all leading tier 1 operators.As one-stop shop for Protocol, IMS, Data Performance, E911 GNSS the supported carriers include:North America: AT&T, Verizon Wireless, T-Mobile USLatin America: America MovilChina: China Mobile, China Unicom, China TelecomJapan: NTT DoCoMo, Softbank, KDDI
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Customer Acceptance Test Panel
TA-65
DGS-65 Customer Acceptance Panel for both testing and trouble- shooting. We have added an option to the panel that allows you to select an analog slaving meter or the LED monitor lights as shown in the maintenance manual Fig. 5-14. The addition of the meter provides the technician with a more visible means to monitor the slaving "trend". The 50 pin DG connector is broken out on the panel to assist in monitoring or isolating unit signals.
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Fiber Acceptance Test Kit
23005
The unique design of the splice accommodates either 125um or 140um fiber and any size buffer up to 900um. The precision made splice holder firmly holds the pigtail in position without causing stress on the fiber. The low viscosity index matching liquid has an indefinite shelf life and allows for an easy glide of the bare fiber into the splice. Within seconds, a fiber acceptance reading can be made with an OTDR or test set. Low loss with minimum back reflection can easily be achieved for more accurate signatures. Other applications for this kit: splice training aids, bare fiber adapters, and temporary splicing.
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User Acceptance Testing
UAT
UAT is the most critical phase before the product is finally deployed, to verify that it meets the business requirements, and is able to handle real-world scenarios.
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Acceptance and Model Office Testing
Business Acceptance Testing (BAT), (also known as User Acceptance Testing UAT), is the test phase where the business owners or clients of the software test the solution to verify that deliverables meet the original business requirements. A number of reoccurring issues can present during these finals stages and experienced resources can prove invaluable during these times.
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Station Of Acceptance Testing
The acceptance test station consists of a personal computer - the workstation of the operator of the testing station, contact mechanisms, as well as current and voltage sensors. The station allows to test up to 10 electric motors of various types simultaneously. The operator of the testing station indicates the test sites at which the engine tests will be conducted, their type (from the database), serial numbers and a set of tests.
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Missile Systems
IES Systems is a turnkey test system solution provider with proven experience in Acceptance Test Procedure (ATP) testing, Highly Accelerated Stress Screening (HASS) and Environmental Stress Screening (ESS) testing.
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UAT Test Management
User Acceptance Testing is the final stage of the Software Development Life Cycle, which is conducted by the users. User Acceptance Testing is extremely important to determine whether the project is working fine as per the end user's point of view. The UAT test management process has to be done in an organized manner to reap maximum benefits from the process.
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Wireless Device Test
New wireless standards, in addition to rising wireless usage, are increasing wireless device complexity while lowering price expectations. To counter rising costs, manufacturers require test systems optimized for efficiency.
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Automated Aerospace and Defense Test
Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Interactive Benchtop Test
Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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NI Real-Time Test Cell Reference System
780590-35
VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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Universal In-Line Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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NI's Electrical Functional Test Solution
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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Application Software for Electronic Test & Instrumentation
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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6TL23 Off-Line seat operation Base Test Platform w/o Table
H71002301
- 18U height 19inch rack space (580mm depth)- VPC G12 or G12X interface- Man Machine interface H73000301 (not included)- stand-up operation
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PXI Integration Platform
ATS-3100
The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
