VoIP Test
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Product
Design for Testability (DFT Test)
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Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.
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Product
FPD Tester Model
27014
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Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
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The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Semiconductors Testing
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Our Testers support the production lines of variety of products such as 40/100 GBps Mux/DeMux, LNA, WiMAX RF Transceivers, Microwave & Millimeter Wave components. This high reliability products are being used in (a) Networking & Communications (b) Consumer Electronics (c) Military & Space
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Product
BSD (Test Diagnostics)
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BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
PXI Semiconductor/IC Test System
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A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
6TL08 Benchtop Test Platform
H710008
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The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettesThe platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
Test Port Cable, 1 Mm
11500I
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Connect test ports to devices, fixtures, or probe tips with this 8.8-cm cable featuring a return loss of 17 dB minimum.
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Product
OTP-Based Test System
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Power electronics assemblies often cannot be tested using conventional technology for their electrical performance. Due to the adaptability of the instrumentation, the OTP concept offers an ideal platform even beyond the space requirements of several control cabinets. In order to achieve high test flexibility with different assemblies, the system was equipped with three-phase AC sources and AC loads as well as a precise three-phase power meter. DC sources and loads with different current and voltage ranges cover the test of frequent DUT operating parameters. Time-dependent voltage or current signals can be stimulated by an arbitrary generator with power amplifier. General measurements such as current, voltage, frequency, resistance can be carried out flexibly at various test points using the matrix concept. An oscilloscope with RF multiplexer is available for high-frequency measurements such as residual ripple, switching processes, etc.
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Product
In-Circuit Test System Calibrations
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Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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Product
Universal In-Line Test Platform
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UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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Product
Test Handler
M4872
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Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
Test Instruments
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Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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Product
Fixture Kit 600x455mm RCV 8-slot for 6TL34
AG588
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Stopper kit includedYAVCANCON2 for fixture identification not included
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Product
Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Force Testing
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Force testing is a way of determining how an object will react when it is subjected to tensile or compressive loads
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Product
RF Testing
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Silicon Turnkey Solution, Inc.
Once largely confined to military and aerospace, radio frequency (RF) today has become the underlying technology for a wide range of consumer, industrial, and medical products. Like their military-aerospace counterparts, commercial RF applications require exceptional quality but with different competitive economics.
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Product
PCI Express 4.0 Test Platform
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The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
Test Tables / Test Consoles
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Adaptronic test tables and test consoles are a decisive component of the adaptronic kit for the assembly of comfortable and high-quality test systems for the wiring test of manufactured cable harnesses of all types.
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Product
Shock Testing
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Shock testing typically involves calibrated, repeatable, violent events. The resulting energy is then absorbed transferred through the test specimen or Device Under Test (DUT)
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Product
Test Cells
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LaplaCells provide a facility for the rapid and efficient testing of the EMC compliance of products. These cells offer a calibrated and screened environment in which radiated emissions can be measured and immunity to RF radiation can be tested. They exceed the requirements of IEC61000-4-20, thus affording compliant testing to IEC61000-4-3 and pre-compliance testing for radiated emission testing. The Cells are a modified form of GTEM cell, using a balanced dual septum design which maximises EUT volume for a given external size of cell, and dramatically improves field linearity. The EUT volume is fully lined in structural polycarbonate capable of supporting heavy products and access is via a large, full height door at the end of the cell. Adjacent to the door is the I/O filter compartment which can be customised to suit the users requirements. USB, RS232, Parallel, Ethernet, co-ax and other product specific filters can be added at time of ordering.
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Product
Test Analyzer
ST2303
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Shenzhen Star Instrument Co., Ltd.
The ST2303 three-phase energy meter field test analyzer reaches accuracy class 0.05. It generates stable signals by using ARM and digital signal processing technologies. Its highlights include compactness, light weight and portability. Various supply options, including measuring circuit, external AC power supply and internal lithium battery are offered.
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Product
Corrosion Test
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The purpose of this test is to determine the resistance of materials and protective coatings to corrosive atmospheres when a more corrosive environment than the salt fog/spray test is required. The test is used when material is stored or operated in areas, for example, where acidic atmospheres exist, such as in industrial areas or near the exhausts of any fuel-burning device. Gases such as sulfur dioxide are used to replicate the exhausts of fuel burning devices.
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Product
Testing and Measurement
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AkroMetrix provides a variety of products to help you identify and evaluate warpage: For warpage measurements along a production line or at room temperature, AkroMetrix has developed the LineMoiré Production Level Automated Flatness Inspection System. If you need to measure warpage and flatness during pre-defined temperature profiles, AkroMetrix's TherMoiré In-Process Warpage Measurement Systems may fit your requirements.
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Test Automation
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PrimeTest Automation delivers custom test, measurement, and data acquisition systems that include the best hardware and software available. Drawing on vast resources from multiple disciplines, each system is carefully designed and constructed to provide the most accurate and repeatable results. Test systems can be deployed as standalone or as part of an automated line such as a rotary index dial or conveyor.
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Product
Advanced SoC Test System
3680
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The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
Regenerative Battery Pack Test System
17040E
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High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
EMC/EMI Testing
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MET Laboratories boasts proven, superior capabilities in Electromagnetic Compatibility (EMC) compliance testing, including wireless & RF testing. Our EMC labs are among the most respected in the U.S. Our EMC testing covers FCC Part 15, as well as Parts 18, 22, 24-27, 74, 90 & 95, and 101
