Pattern Generators
Produces volumes of a binary stream to test digital elements.
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Video Generators
Black Burst, Full Field and SMPTE Color Bars GeneratorsFull-featured Digital Pattern Generator DG-4Range of analog products from single output black burst (SG-2) up to six black burst plus SMPTE Bars (SG-7)Full Field ID generation available in SG-3, SG-7, BG-3 and BG-7 modelsNTSC (all models) or PAL (DG-4, SG-2, BG-2CB, BG-3/7, BG-4CB, and BG-5CB)
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48-Channel DIO Function Card
ProDAQ 3610
The ProDAQ 3610 high-speed DIO function card is a high-density card that fits into ProDAQ VXIbus motherboards and LXI function card carriers. This high-speed DIO card has 48 channels and is designed for demanding applications ranging from normal slow digital input/output to high-speed pattern generation and pattern recognition. The card provides the user with 384 input/output channels if eight DIO function cards are fitted to one ProDAQ motherboard.
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Pattern Generators
PG314P Series
The MicroImage PG314 series of pattern generators are for applications to display custom designed patterns on screen. The PG314 units will overlay the pattern or patterns on top of the video signal provided to the input of the device. While the PG311 can be factory programmed with only one unique pattern, the PG314 can hold up to four patterns and switch between them.
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Test Pattern Generator Software
ScanExpress TPG
To deliver a product meeting the highest standards of quality and reliability, design engineers and test engineers alike must maintain test capabilities throughout the entire product life cycle, from prototype to manufacturing. Automation in test generation is essential to ensure that tests keep up with the rapid development of modern products.The ScanExpress TPG™ Intelligent Test Pattern Generator Software provides a highly advanced, automated boundary-scan test design environment—perfect for quick and efficient creation of complete boundary-scan tests for all IEEE-1149.1 and IEEE-1149.6 compliant circuit boards.
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Combination Module: 2 Ch. MIL-STD-1553 & 12 Ch. Discrete I/O
CM8
The CM8 module is a combination of NAI's MIL-STD-1553B module, FTB, and Enhanced Discrete I/O module, DT4. The CM8 offers twelve channels of discrete I/O and two channels of MIL-STD-1553B communications. The twelve discrete I/O channels are programmable as either input (voltage or contact sensing with programmable, on-module pull-up/pull down current sources), or output (current source, sink, or push-pull) up to 500 mA per channel from an applied, external 3-60 VCC source. The discrete I/O channels also provide additional functionality modes such as Pulse Width Modulation (PWM) output mode and Pattern Generator output mode. The two MIL-STD-1553B communications channels feature a dual, redundant, balanced-line, physical layer; a (differential) network interface; time division multiplexing; half-duplex command/response protocol; and up to 31 remote terminals (devices).
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Engineering Support Platform
ESP
ESP, or Engineering Support Platform, is a low cost, powerful and versatile platform for the development, deployment and support of FPGA Applications. ESP is powered by DSX core, ARC’s core element for the development and deployment of digital and mixed signal systems. The standard system contains 2 custom FPGA system, often configured in combination where one acts as the application firmware, and the other is used for test. But the system is expandable and configurable in any combination to solve any problem in a digital, analog or mixed signal system. The FPGAs can be configured to generate, analyze, process and/or output complex signals at a wide range of voltages, frequencies and serial protocols. It has been used to develop solutions for Radar systems, testers, Pattern Generation, digital signal processing and generating, Video processing, and many more. ESP comes as a desktop or rack mounted solution, and no special interfaces are needed.
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12 Channels 1.0 ~ 17.0 Gb/s (200Gbps) Pulse Pattern Generator and Error Detector
CA9806-12
The UC INSTRUEMNTS CA9806-12 is a highp erformance, flexible 12 channels Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (200 G). It is combined with three sets CA9806 4 CH 1.0 to 17.0 Gbps Pulse Pattern Generator and Error Detector that incorporates an external one by 4 rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build-in 8.5 ~ 15 Gb/s eye diagram testing function.
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Windows Driver & SDK for ADLINK USB DAQ Series Data Acquisition Modules
UD-DASK
ADLINK DASK drivers are the device drivers for custom data acquisition applications for Windows. The DASK driver libraries provide API sets for ADLINK PCI ExpressR, PCI, CompactPCI, PXI and USB data acquisition cards, to access full hardware functionalities, such as buffered/double-buffered data acquisition, pattern generation, digital input/output and etc. For novice users, the built-in CodeCreator utility helps you create your first program in just a few minutes.
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PATTERN GENERATOR
PG-68
The model PG-68 pattern generator generates a wide variety of test signals and patterns for testing, servicing, and adjustment of television, computer monitors, and video equipment.
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PAL Standard Pattern Generator
PG315P
The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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Display Color Analyzer
Model 7123
Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station
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High Speed PXIe Digital IO Card - 32 Channels, Extendable up to 256 Channels in One Chassis
Model 33010
Chroma 33010 is a high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO Card consists of a Sequencer Pattern Generator (SQPG) and 32 Channels of fill ATE-like features. The 33010 IO card is expandable up to 356 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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4 Channel 1.0 ~ 17.0 Gb/s Pulse Pattern Generator and Error Detector
CA9806
The UC INSTRUEMNTS CA9806 is a high performance, flexible four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (consult factory for higher or lower operation speeds). It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build‐in 8.5 ~ 15 Gb/s eye diagram testing function.
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PAM4 Bit Error Rate Tester
Shenzhen Golight Technology Co.,Ltd
Golight PAM4 BERT integrates a 4-CH or 8-CH multistage pulse pattern generator (PPG) and a highsensitivity error detection (ED) to achieve BER measurement of data transmission in 200Gbps and 400Gbps. PAM4 BERT provide the best solution for automated production testing of 200G and 400G highspeed optical transceiver.
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PC-based logic analyser
Annie-USB
A top-quality 8-channel PC-based logic analyser with probably the highest specifications in its class, this Janatek product is excellent value for money. It captures data at a maximum rate of 500MHz, has a buffer depth of up to 1 Meg samples per channel, and incorporates an 8-bit pattern generator to aid debugging.
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Fiber End-Face Inspection Interferometer
CLEAVEMETER 3D
The CLEAVEMETER 3D™ is a non-contact interferometer designed for inspecting the end-faces of cleaved or polished optical fibers with cladding diameters of 125 µm to 1200 µm. It gives immediate and precise information on important end-face properties such as flatness, perpendicularity, hackles and dust. Based on the NYFORS CLEAVEMETER 3D™ design, in addition to producing sharp fringe patterns it also generates three-dimensional images of the cleaved fiber end.
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PCIe Fast Digital Waveform Acquisition/Pattern Generator - 32 Digital I/O Channels, 1 kS/s up to 125 MS/s Sampling Speed
M2P.7515-X4
The M2p.75xx series of fast digital I/O cards allow to acquire or replay digital patterns with a programmable speed of up to 125 MS/s. The direction can be switched by software between input (digital data acquisition) and output (digital pattern generation). The on-board memory of 1 GByte can be completely used for digital pattern. Furthermore the on-board memory can be switched to a FIFO buffer allowing to continuously stream data in either output or input direction.
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Delay Pattern Generator (six-channel Pulse Generator)
DG-8000
*Seamless change: The frequency, pulse width, and other settings can be seamlessly changed during oscillation.*Tracking function: Parameters can be changed at the same time for each channel.*Operation pattern control: The operation pattern option enables continuous operation testing.*Synchronization of multiple generators: The quick synchronization option enables three generators (18 channels) to synchronously output data.
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Economical Solution for Test Requiring Fewer Instrumentation Modules.
OPTOWARE-S200 (FOTS-Bench Top Series)
•LD Driver, EDFA, ASE Broadband Source, 1X4 Optical Switch•Variable Optical Attenuator, Wavelength Meter•SOA Driver, SLED Driver, Pump LD Driver•Pattern Generator & BERT, SFP Transceiver Driver•4Channel Optical Return Loss Meter (Light Source & Power Meter)
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Scientech Multi Instruments
Scientech Technologies Pvt. Ltd.
Variety of Instruments are being used in education, industry and research in the field of analog, digital, instrumentation, control system, biomedical and RF domain, requirement of these instruments varies and depends on their application areas.Some application like electronic, electrical, automation, etc. require standard waveforms, arbitrary waveforms, variable digital pattern and protocol generation. Analog signal combination and multiple digital signals are also required for some applications like power electronics, embedded, DSP and VLSI.
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Bit Error Test & Arbitrary Waveform Generation
SHF Communication Technologies AG
SHF’s Bit Pattern Generators (BPG) or Pulse Pattern Generators (PPG), Error Analyzers (EA) and remote heads form a Bit Error Ratio Tester (BERT) suite, which supports a vast number of different applications including high speed Ethernet rates like 100GbE, 200GbE, 400GbE and 1TbE. When it comes to signal generation an Arbitrary Waveform Generator (AWG) is the all-in-one device suitable for every purpose in Telecommunication, Optics, Medicine, Radar, Physics or even Quantum Computing.
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Digital Pattern Generator
Wave Gen Xpress
A digital pattern generator is an essential stimulus source for almost every type of digital device: digital and mixed-signal ASIC, FPGA, microprocessors and microcontrollers. The digital pattern generator can be used early in the design cycle to substitute for system components that are not yet available.
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Pattern Generator
1B-SDI-PTG
The 1B-SDI-PTG 3G-HD/SD SDI Pattern Generator - advanced SDI pattern generator with multi-format and multi-pattern support. Supports still and moving video test patterns, and provides a lot of useful features like audio SMPTE-291M. 1B-SDI-PTG Pattern Generator supports up to 8 channels of AES compliant audio with 48KHz sample rate. Multitasking of 1B-SDI-PTG comes from bypassing HDMI input which allows user to use more testing patterns for connected display or use 1B-SDI-PTG as SDI converter with 3G support.
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Logic Analyzers
The PC-based Logic Analyzers are controlled with easy-to-use Windows software. This allows for more organized data display (with color-coded data and increased screen size), intuitive user interface, and data management (file saving, loading, sharing and exporting to other software and reports). This provides the familiar Timing and Statelist displays. However, they are much larger than those found on a standalone Logic Analyzer. Many also have Pattern Generators (digital word generators) that can output digital data.
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Testability Analysis
TurboCheck
TurboScan is an advanced full-scan and partial-scan test suite. It includes a Scan Synthesizer and an Automatic Test Pattern Generator (ATPG). TurboScan automatically repairs testability violations to make your design highly testable.
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NRZ Bit Error Rate Tester
Shenzhen Golight Technology Co.,Ltd
BERT integrates pulse pattern generator(PPG) and high sensitivity error detector(ED) to achieve the error rate measurement of data transmission in high speed communication. BERT can support multi-channel output and input and output polarity upset. It provides a best solution for the automated production test of the high speed optical transceiver.
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Camera Link Simulator
CLS-221
The CLS-221 Camera Link Simulator is an affordable, high-performance video test pattern generator that supports all video formats including those introduced in the new version 2.1 specification. Fully programmable video timing enables the CLS-221 to mimic the characteristics of almost any camera. New features include enhanced timing performance, bayer color support, and additional video patterns. Control is via an RS-232 port, USB, or frame grabber COM port. The CLS-221 also incorporates the AIA validation test pattern.
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Digital Waveform Acquisition, Digital I/O, Pattern Generators
Digital I/O cards, pattern or pulse generators and digital data acquisition cards are all focused on digital signals. Input and output signals have two logic levels called low state (0) and high state (1). The electrical representation of these logical levels depends on the logic family and the supported I/O standard.
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Wireless Data Logger
EVA100
The new highly integrated measurement system "EVA100" is supporting Power Supplies, SMU( 4 quadrant DC Signal Measurement Units ), Pattern Generators, Arbitrary Waveform Generators, Digitizers and Oscilloscopes necessary for complete analog / mixed-signal / sensor / digital IC devices and Modules including Electronic Control Unit (ECU) for automotive evaluation and measurement.This new measurement system allows engineers quickly to build their own measurement environment without combining several standalone instruments.
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Astronics PXIe-6943, 1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument
785855-01
1-Slot, 50 MHz, 32-Channel PXI Digital Pattern Instrument - The Astronics PXIe-6943 works as a core component of digital test systems that may include switching, analog instrumentation, and an RF subsystem. This instrument features an advanced thermal design, temperate monitoring, … and a high-speed data sequencer for control of stimulus and response patterns. Additionally, the Astronics PXIe-6943 operates at data rates up to 50 MHz with 1 ns edge placement, variable slew rates, and a <3 ns channel-to-channel skew. It also supports synchronized digital test systems from 32 to 224 channels.
